Systems and methods for sample analysis

US8932875B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8932875-B2
Application numberUS-201113977758-A
CountryUS
Kind codeB2
Filing dateDec 29, 2011
Priority dateJan 5, 2011
Publication dateJan 13, 2015
Grant dateJan 13, 2015

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.

First claim

Opening claim text (preview).

What is claimed is: 1. A system for analyzing a sample, the system comprising: a probe comprising a substrate that tapers to a tip, wherein the substrate is configured to hold a sample and the substrate is connected to a high voltage source for generating a voltage; a heating device for generating a heated gas; and a mass spectrometer that comprises a mass analyzer, wherein the system is configured such that the voltage generated from the high voltage source and the heated gas generated from the heating device are simultaneously applied to the substrate in order to desorb and ionize a sample from the substrate and an inlet of the mass spectrometer is operably associated with the substrate to receive ions of the sample. 2. The system according to claim 1 , wherein the heated gas is directed at the probe. 3. The system according to claim 1 , wherein the heated gas is directed at the tip of the probe. 4. The system according to claim 1 , further comprising a chamber configured to encompass the probe and the device for generating the heated gas. 5. The system according to claim 1 , wherein the gas is nitrogen. 6. The system according to claim 1 , wherein the probe is composed of a porous material. 7. The system according to claim 1 , wherein the probe is composed of a non-porous material. 8. The system according to claim 7 , wherein the non-porous material is a metal. 9. The system according to claim 1 , wherein the mass analyzer is for a mass spectrometer or a handheld mass spectrometer. 10. The system according to claim 9 , wherein the mass analyzer is selected from the group consisting of: a quadrupole ion trap, a rectalinear ion trap, a cylindrical ion trap, a ion cyclotron resonance trap, and an orbitrap. 11. A method for analyzing a sample, the method comprising: contacting a sample to a substrate that tapers to a tip; simultaneously applying high voltage and heat to the substrate to generate ions of an analyte in the sample that are expelled from the substrate; and analyzing the expelled ions. 12. The method according to claim 11 , wherein the heat is produced from a heated gas. 13. The method according to claim 12 , wherein the heated gas is directed at the substrate. 14. The method according to claim 13 , wherein the heated gas is directed at the tip of the substrate. 15. The method according to claim 12 , wherein the gas is nitrogen. 16. The method according to claim 11 , wherein the substrate is composed of a porous material. 17. The method according to claim 11 , wherein the substrate is composed of a non-porous material. 18. The method according to claim 11 , wherein the applying step is conducted within an enclosed chamber. 19. The method according to claim 11 , wherein analyzing comprises providing a mass analyzer to generate a mass spectrum of analytes in the sample. 20. The method according to claim 11 , wherein the method is performed under ambient conditions. 21. A method for ionizing a sample, the method comprising: simultaneously applying high voltage and heat to a a sample disposed on a substrate that tapers to a tip to generate ions of an analyte in the sample.

Assignees

Inventors

Classifications

  • for solid samples · CPC title

  • H01J49/42Primary

    Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons · CPC title

  • Gaseous sample or with change of physical state · CPC title

  • Oils {, i.e. hydrocarbon liquids} (edible oils or edible fats G01N33/03) · CPC title

  • Nuclear magnetic resonance, electron spin resonance or other spin effects or mass spectrometry · CPC title

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What does patent US8932875B2 cover?
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
Who is the assignee on this patent?
Cooks Robert Graham, Li Guangtao, Li Xin, and 2 more
What technology area does this patent fall under?
Primary CPC classification H01J49/0459. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jan 13 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).