Probes for electrical testing in defect detection systems
US-2024094285-A1 · Mar 21, 2024 · US
US8928331B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8928331-B2 |
| Application number | US-201213524556-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 15, 2012 |
| Priority date | Feb 28, 2008 |
| Publication date | Jan 6, 2015 |
| Grant date | Jan 6, 2015 |
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Official abstract text for this publication.
A diagnostic circuit for trouble shooting electronic control units of appliances includes a voltage sensing and signal generation device with an input/output and an input. The circuit includes first terminals for connecting to the load and second terminals for connecting to the two lines of the sinusoidal source. One of the first terminals is connected to the input/output, and another one of the first terminals is connected to the input. A relay is connected between one of the second terminals and the input/output. Another relay is connected between another one of the second terminals and the input. A first diode pair with clamping diodes is connected to the input/output, and a second diode pair first diode pair with clamping diodes is connected to the input.
Opening claim text (preview).
We claim: 1. A diagnostic circuit for connecting to a unit under test having a load and two lines of a sinusoidal source, the diagnostic circuit comprising: a voltage sensing and signal generation device having an input/output and an input; a plurality of terminals including first terminals for connecting to the load and second terminals for connecting to the two lines of the sinusoidal source, one of said first terminals connected to said input/output, and another one of said f…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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