Semiconductor device and method for preparing semiconductor device
US-2024339405-A1 · Oct 10, 2024 · US
US8928152B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8928152-B2 |
| Application number | US-201414186025-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 21, 2014 |
| Priority date | Feb 17, 2010 |
| Publication date | Jan 6, 2015 |
| Grant date | Jan 6, 2015 |
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Official abstract text for this publication.
A semiconductor device includes a substrate having a conductive area, a first pattern formed on the substrate and having a contact hole through which the conductive area is exposed, and a contact plug in the contact hole. The contact plug includes first and second silicon layers. The first silicon layer, formed from a first compound including at least two silicon atoms, is formed in the contact hole to contact a top surface of the conductive area and a side wall of the first pattern. The second silicon layer, formed from a second compound including a number of silicon atoms less than the number of the silicon atoms of the first compound, is formed on the first silicon layer and fills a remaining space of the contact hole, the second silicon layer being spaced apart from the first pattern at an entrance of the contact hole.
Opening claim text (preview).
What is claimed is: 1. A semiconductor device comprising: a substrate comprising a conductive area; a first pattern formed on the substrate and having a contact hole through which the conductive area is exposed, wherein the first pattern comprises a layer of electrically insulating material disposed on the substrate, and a lower conductive layer of polysilicon disposed directly on the layer of insulating material; and a contact plug in the contact hole, wherein the contact plu…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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