Systems and methods of testing memory devices
US-2024387303-A1 · Nov 21, 2024 · US
US8928002B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8928002-B2 |
| Application number | US-201313902180-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 24, 2013 |
| Priority date | Jun 28, 2012 |
| Publication date | Jan 6, 2015 |
| Grant date | Jan 6, 2015 |
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To provide a semiconductor device which allows a plurality of semiconductor chips to let a current flow uniformly therethrough and a method of manufacturing the same. The semiconductor device in accordance with one embodiment comprises a plurality of first semiconductor chips and a circuit board, mounted with the plurality of the first semiconductor chips, having first and second wiring conductors electrically connected to the plurality of first semiconductor chips. The plurality of first semiconductor chips are connected in parallel together with the first and second wiring conductors so as to construct a first parallel circuit. The plurality of first semiconductor chips are arranged on the circuit board according to an on-resistance of the plurality of first semiconductor chips so that a uniform current flows through the plurality of first semiconductor chips.
Opening claim text (preview).
What is claimed is: 1. A semiconductor device comprising: a plurality of first semiconductor chips; and a circuit board, mounted with the plurality of the first semiconductor chips, having first and second wiring conductors electrically connected to the plurality of first semiconductor chips; wherein the plurality of first semiconductor chips are connected in parallel together with the first and second wiring conductors so as to construct a first parallel circuit; and wherei…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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