Methods and systems for deposition to gaps using an inhibitor

Patent metadata

Field	Value
Publication number	US-2026077458-A1
Application number	US-202519394943-A
Country	US
Kind code	A1
Filing date	Nov 20, 2025
Priority date	Aug 31, 2021
Publication date	Mar 19, 2026
Grant date	—

Abstract

The present disclosure is directed to methods and systems for depositing a material within a gap of a substrate in a cyclic deposition process. The methods and systems utilize an inhibitor to preferentially blocks chemisorption of a subsequently introduced first precursor at a portion of available chemisorption sites in the gap to promote deeper penetration of the first precursor into the gap and/or more uniform chemisorption of the first precursor in the gap used in forming a desired material.

First claim

1 . A system for depositing a material within a gap of a substrate, comprising:
a reaction chamber configured to accommodate a substrate, the substrate comprising a gap, one or more interior surfaces of the gap comprising a plurality of chemisorption sites; a first source containing an inhibitor and coupled to the reaction chamber via a first valve; a second source containing a first precursor and coupled to the reaction chamber via a second valve; a third source containing a second precursor and coupled to the reaction chamber via a third valve; and a controller configured and programmed to operate the first, second, and third valves to perform at least one deposition cycle in the reaction chamber, the at least one deposition cycle comprising: (a) operating the first valve to introduce the inhibitor into the reaction chamber to contact the gap, wherein the inhibitor occupies at least a portion of the chemisorption sites in the gap; (b) operating the second valve to introduce the first precursor into the reaction chamber to chemisorb the first precursor within the gap at chemisorption sites not occupied by the inhibitor; and (c) operating the third valve to introduce the second precursor into the reaction chamber to form the material within the gap; wherein the inhibitor comprises a member selected from the group consisting of a cyclopentadienyl compound, a beta-diketonate compound, a boron-containing compound, an alkylhalide compound, and combinations thereof.

2 . The system of claim 1 , wherein the gap comprises an opening and a depth extending from the opening to a base portion thereof, and wherein introduction of the inhibitor into the reaction chamber reduces chemisorption of the first precursor for at least a portion of the depth from the opening to the base portion upon introduction of the first precursor into the reaction chamber.

3 . The system of claim 1 , further comprising a fourth source containing an oxygen-containing gas and coupled to the reaction chamber via a fourth valve, and wherein the controller is configured and programmed to remove the inhibitor by operating the fourth valve to introduce the oxygen-containing gas into the reaction chamber.

4 . The system of claim 1 , wherein the operating the third valve to introduce the second precursor into the reaction chamber forms the material within the gap and removes the inhibitor from the gap.

5 . The system of claim 1 , wherein the first precursor comprises a member selected from the group consisting of a metal compound, a metalloid compound, a non-metal compound, and combinations thereof.

6 . The system of claim 1 , wherein the first precursor comprises a metal precursor.

7 . The system of claim 1 , wherein the first precursor comprises a member selected from the group consisting of a metal halide, a non-metal halide, a metalloid halide, and combinations thereof.

8 . The system of claim 1 , wherein the second precursor comprises a member selected from the group consisting of an oxygen precursor, a nitrogen precursor, a hydrogen precursor, and combinations thereof.

9 . The system of claim 1 , wherein the controller is further configured and programmed to perform at least one additional deposition cycle that omits introduction of the inhibitor to the reaction chamber, the additional deposition cycle comprising operating the second valve to introduce the first precursor to chemisorb the first precursor at available chemisorption sites, and operating the third valve to introduce the second precursor to form the material within the gap.

10 . The system of claim 1 , wherein the gap has an aspect ratio of 10:1 to 1000:1.

11 . A system for depositing a material within a gap of a substrate, comprising:
a reaction chamber configured to accommodate a substrate, the substrate comprising a gap, one or more interior surfaces of the gap comprising a plurality of chemisorption sites; a first source containing an inhibitor and coupled to the reaction chamber via a first valve; a second source containing a first precursor and coupled to the reaction chamber via a second valve; a third source containing a second precursor and coupled to the reaction chamber via a third valve; a fourth source containing an oxygen-containing gas and coupled to the reaction chamber via a fourth valve; and a controller configured and programmed to: (a) operate the first valve to introduce the inhibitor into the reaction chamber to contact the gap, wherein the inhibitor occupies at least a portion of the chemisorption sites in the gap; (b) operate the second valve to introduce the first precursor into the reaction chamber to chemisorb the first precursor within the gap at chemisorption sites not occupied by the inhibitor; (c) operate the fourth valve to introduce the oxygen-containing gas into the reaction chamber to remove the inhibitor from the gap; and (d) operate the third valve to introduce the second precursor in the reaction chamber to form the material within the gap.

12 . The system of claim 11 , wherein the inhibitor comprises a member selected from the group consisting of a cyclopentadienyl compound, a beta-diketonate compound, a boron-containing compound, an alkylhalide compound, and combinations thereof.

13 . The system of claim 11 , wherein the first precursor comprises a member selected from the group consisting of a metal compound, a metalloid compound, a non-metal compound, and combinations thereof.

14 . The system of claim 11 , wherein the second precursor comprises a member selected from the group consisting of an oxygen precursor, a nitrogen precursor, a hydrogen precursor, and combinations thereof.

15 . A system for depositing a material within a gap of a substrate comprising:
a reaction chamber for accommodating the substrate, the substrate comprising a gap, one or more interior surfaces of the gap comprising a plurality of chemisorption sites; a first source containing an inhibitor in gas communication via a first valve with the reaction chamber; a second source containing a first precursor in gas communication via a second valve with the reaction chamber; a third source containing a second precursor in gas communication via a third valve with the reaction chamber; and a controller operably connected to the first, second, and third valves configured and programmed to control in at least one deposition cycle in the reaction chamber, the at least one deposition cycle comprising: (a) contacting the gap with the inhibitor, wherein the inhibitor occupies a portion of the chemisorption sites in the gap; (b) following the contacting the gap with the inhibitor, contacting the gap with the first precursor to chemisorb the first precursor within the gap at chemisorption sites not occupied by the inhibitor; and (c) following the contacting the gap with the first precursor, contacting the gap with the second precursor to form the material within the gap, wherein the inhibitor comprises a member selected from the group consisting of a cyclopentadienyl compound, a beta-diketonate compound, a boron-containing compound, an alkylhalide compound, and combinations thereof.

16 . The system of claim 15 , wherein the gap comprises an opening and a depth extending from the opening to a base portion thereof, and wherein the contacting the gap with the inhibitor reduces chemisorption of the first precursor for at least a portion of the depth from the opening to the base portion upon contact of the gap with the first precursor.

17 . The system according to claim 15 , the at least one deposition cycle further

Assignees

• Asm Ip Holding Bv

Inventors

• Haukka Suvi P
• Tois Eva E
• Sharma Varun

Classifications

• B25B23/10

  using mechanical gripping means · CPC title

• B25B23/005 Primary

  Screw guiding means · CPC title