Anomaly detection apparatus, method, and program

US2026055357A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2026055357-A1
Application numberUS-202219105892-A
CountryUS
Kind codeA1
Filing dateSep 22, 2022
Priority dateSep 22, 2022
Publication dateFeb 26, 2026
Grant date

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Abstract

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An abnormality detection device according to an embodiment includes a measurement unit that measures a culture state of a sample of a culture target that is a culture target during mass culturing by a mass culturing device and that is fed to a microchannel chip and cultured under a set culture condition, and a detection unit that detects an abnormality in a culture state of a sample of the culture target by comparing an abnormality detection model in which a criterion for determining an abnormality in the culture state indicating that the culture state of the sample of the culture target is different from a normal culture state is defined for each of a plurality of culture conditions, and the culture state measured by the measurement unit for the sample and the set culture condition.

First claim

Opening claim text (preview).

1 . An abnormality detection device comprising: a memory device; and at least one hardware processor configured to: measure a culture state of a sample of a culture target that is a culture target during mass culturing by a mass culturing device and that is fed to a microchannel chip and cultured under a set culture condition; and detect an abnormality in the culture state of the sample of the culture target by comparing an abnormality detection model in which a criterion for determining an abnormality in the culture state is defined for each of a plurality of culture conditions, and the culture state measured for the sample and the set culture condition, wherein the criterion for determining the abnormality indicates that the culture state of the sample of the culture target is different from a normal culture state. 2 . The abnormality detection device according to claim 1 , wherein the at least one hardware processor is configured to measure the culture state of the sample of the culture target which is fed to the microchannel chip and cultured under each of a plurality of kinds of culture conditions, and create, on a basis of the measured culture state, the abnormality detection model in which the criterion for determining the abnormality in the culture state of the sample of the culture target is defined for each of the plurality of kinds of culture conditions. 3 . The abnormality detection device according to claim 1 , wherein the culture conditions comprise: at least one of a temperature related to a channel of the sample in the microchannel chip, an illuminance with respect to the channel, a hydrogen ion concentration index of the sample, a carbon dioxide partial pressure of the sample, or a nutrient salt concentration of the sample. 4 . The abnormality detection device according to claim 1 , wherein a culture state of the sample comprises: a specific growth rate, a specific substrate consumption rate, a product specific production rate, or a specific oxygen consumption rate of a sample of a culture target that is fed to the microchannel chip and cultured. 5 . An abnormality detection method performed by an abnormality detection device, the abnormality detection method comprising: measuring, by at least one hardware processor of the abnormality detection device, a culture state of a sample of a culture target that is a culture target during mass culturing by a mass culturing device and that is fed to a microchannel chip and cultured under a set culture condition; and detecting, by the at least one hardware processor of the abnormality detection device, an abnormality in the culture state of the sample of the culture target by comparing an abnormality detection model in which a criterion for determining an abnormality in the culture state is defined for each of a plurality of culture conditions, and the culture state measured for the sample and the set culture condition, wherein the criterion for determining the abnormality in the culture state indicates that the culture state of the sample of the culture target is different from a normal culture state. 6 . The abnormality detection method according to claim 5 , further comprising: measuring the culture state of the sample of the culture target which is fed to the microchannel chip and cultured under each of a plurality of kinds of culture conditions, and creating, on a basis of the measured culture state, the abnormality detection model in which the criterion for determining the abnormality in the culture state of the sample of the culture target is defined for each of the plurality of kinds of culture conditions. 7 . The abnormality detection method according to claim 5 , wherein the culture conditions comprise: at least one of a temperature related to a channel of the sample in the microchannel chip, an illuminance with respect to the channel, a hydrogen ion concentration index of the sample, a carbon dioxide partial pressure of the sample, or a nutrient salt concentration of the sample. 8 . A non-transitory computer-readable medium storing instructions of an abnormality detection processing program, wherein execution of the instructions by at least one hardware processor causes the at least one hardware to perform operations comprising: measuring a culture state of a sample of a culture target that is a culture target during mass culturing by a mass culturing device and that is fed to a microchannel chip and cultured under a set culture condition; and detecting an abnormality in the culture state of the sample of the culture target by comparing an abnormality detection model in which a criterion for determining an abnormality in the culture state is defined for each of a plurality of culture conditions, and the culture state measured for the sample and the set culture condition, wherein the criterion for determining the abnormality in the culture state indicates that the culture state of the sample of the culture target is different from a normal culture state.

Assignees

Inventors

Classifications

  • Photobioreactors (culturing algae A01G33/00, A01H4/001, C12N1/12) · CPC title

  • Automatic or computerized control (automatic analysis G01N35/00) · CPC title

  • Microfluidic devices; Capillary tubes (integrated microfluidic structures B01L3/5027; microreactors B01J19/0093) · CPC title

  • C12M41/46Primary

    of cellular or enzymatic activity or functionality, e.g. cell viability · CPC title

  • Measuring or testing with condition measuring or sensing means, e.g. colony counters · CPC title

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What does patent US2026055357A1 cover?
An abnormality detection device according to an embodiment includes a measurement unit that measures a culture state of a sample of a culture target that is a culture target during mass culturing by a mass culturing device and that is fed to a microchannel chip and cultured under a set culture condition, and a detection unit that detects an abnormality in a culture state of a sample of the cult…
Who is the assignee on this patent?
Ntt Inc
What technology area does this patent fall under?
Primary CPC classification C12M41/46. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu Feb 26 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).