Piezoelectric stack and method for manufacturing the piezoelectric stack

Patent metadata

Field	Value
Publication number	US-2026033243-A1
Application number	US-202519279513-A
Country	US
Kind code	A1
Filing date	Jul 24, 2025
Priority date	Jul 26, 2024
Publication date	Jan 29, 2026
Grant date	—

Abstract

There is provided a piezoelectric stack including: a substrate; a bottom electrode film on the substrate; a piezoelectric film on the bottom electrode film, the piezoelectric film being composed of a perovskite-type oxide represented by a general formula ABO3, with A site containing K and Na, and B site containing Nb; a top adhesive layer on the piezoelectric film; and a top electrode film on the top adhesive layer, wherein when the piezoelectric film is divided into a surface layer region extending from an upper surface of the piezoelectric film to a predetermined depth toward the substrate, and a bulk region which is a region other than the surface layer region, a total atomic concentration of K and Na in the surface layer region is lower than a total atomic concentration of K and Na in the bulk region.

First claim

1 . A piezoelectric stack comprising:
a substrate; a bottom electrode film on the substrate; a piezoelectric film on the bottom electrode film, the piezoelectric film being composed of a perovskite-type oxide represented by a general formula ABO 3 , with A site containing K and Na, and B site containing Nb; a top adhesive layer on the piezoelectric film; and a top electrode film on the top adhesive layer, wherein when the piezoelectric film is divided into a surface layer region extending from an upper surface of the piezoelectric film to a predetermined depth toward the substrate, and a bulk region which is a region other than the surface layer region, a total atomic concentration of K and Na in the surface layer region is lower than a total atomic concentration of K and Na in the bulk region.

2 . The piezoelectric stack according to claim 1 , wherein the surface layer region is a region extending from the upper surface of the piezoelectric film to a depth of 3 nm toward the substrate.

3 . The piezoelectric stack according to claim 1 , wherein a difference between the total atomic concentration of K and Na in the surface layer region and the total atomic concentration of K and Na in the bulk region is 1 at % or more and 11 at % or less.

4 . The piezoelectric stack according to claim 1 , wherein the total atomic concentration of K and Na in the surface layer region is 10 at % or more.

5 . The piezoelectric stack according to claim 1 , wherein in the piezoelectric film constituting the bulk region, at a position including a center of a surface of the piezoelectric film parallel to a direction along a main surface of the substrate, a difference between a total atomic concentration of K and Na when a measurement length is 10 nm in a film thickness direction and the total atomic concentration of K and Na in the bulk region is within 5% at any position in the film thickness direction of the piezoelectric film except for each interface region on upper and lower sides.

6 . The piezoelectric stack according to claim 1 , wherein a difference between a total atomic concentration of K and Na in a lower layer region of the bulk region extending from a lower surface of the piezoelectric film to a height of 10 nm toward an upper surface of the piezoelectric film and the total atomic concentration of K and Na in the bulk region is within 5%.

7 . The piezoelectric stack according to claim 1 , wherein the piezoelectric film has a dielectric strength of 350 kV/cm or more.

8 . The piezoelectric stack according to claim 1 , wherein the piezoelectric film has a piezoelectric constant e 31 of 8 C/m 2 or more.

9 . The piezoelectric stack according to claim 1 , wherein the piezoelectric film is a polycrystalline film of the perovskite-type oxide, or a single crystalline film of the perovskite-type oxide.

10 . A method for manufacturing a piezoelectric stack, comprising:
preparing a substrate; preparing a target composed of a perovskite-type oxide represented by a general formula ABO 3 , with A site containing K and Na, and B site containing Nb; depositing a bottom electrode film on the substrate; depositing a piezoelectric film composed of a perovskite-type oxide represented by a general formula ABO 3 , with A site containing K and Na, and B site containing Nb, on the bottom electrode film by a sputtering method using the target; depositing a top adhesive layer on the piezoelectric film; and depositing a top electrode film on the top adhesive layer, wherein in the preparation of the target, a first target, and a second target in which a ratio of a total number of K atoms and Na atoms contained per unit volume with respect to the number of Nb atoms contained per unit volume is smaller than that of the first target, are prepared, and in the deposition of the piezoelectric film, (a) applying equal power to the first target and the second target; and (b) applying a power to the second target that is greater than a power to the first target, performed in this order by using the first target and the second target, wherein (b) is started immediately before an end of deposition of the piezoelectric film.

Assignees

• Sumitomo Chemical Co

Inventors

• Shibata Kenji
• Watanabe Kazutoshi
• Kuroda Toshiaki
• Tanaka Yasunori

Classifications

• H10N30/883

  Additional insulation means preventing electrical, physical or chemical damage, e.g. protective coatings · CPC title

• H10N30/872

  Interconnections, e.g. connection electrodes of multilayer piezoelectric or electrostrictive devices · CPC title

• H10N30/871

  Single-layered electrodes of multilayer piezoelectric or electrostrictive devices, e.g. internal electrodes · CPC title

• H10N30/8542

  Alkali metal based oxides, e.g. lithium, sodium or potassium niobates · CPC title

• H10N30/076 Primary

  by vapour phase deposition · CPC title