Additive manufacturing method, additive manufacturing system, and non-transitory computer-readable recording medium
US-2024408689-A1 · Dec 12, 2024 · US
US2025375815A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2025375815-A1 |
| Application number | US-202218730160-A |
| Country | US |
| Kind code | A1 |
| Filing date | Sep 19, 2022 |
| Priority date | Jan 24, 2022 |
| Publication date | Dec 11, 2025 |
| Grant date | — |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
The present invention may be configured to: apply, while maintaining a separation distance (d) between a substrate and a conductive mask, different electric potentials to each of the substrate and the mask to form an electric field due to an electric potential difference; to make charged nanoparticles pass through a hole of the mask according to the intensity of the electric field to determine the degree to which the charged nanoparticles are focused on the substrate; and control the size and shape of a three-dimensional structure formed by depositing the nanoparticles on the substrate according to the focusing degree.
Opening claim text (preview).
1 . A method of manufacturing a three-dimensional structure, the method comprising: (S1) a step of disposing a lower substrate and a conductive mask provided with a plurality of holes above the lower substrate to be spaced apart within a grounded reactor; (S2) a step of forming an electrostatic lens around the hole of the mask by generating electric fields of different sizes in the conductive mask and the lower substrate, respectively; (S3) a step of introducing charged nanoparticles through an upper inlet of the reactor to induce passage through the mask hole by the electrostatic lens and deposition on the lower substrate; and one or more steps of the following steps (S4) and (S5): (S4) a step of adjusting an electric field intensity between the conductive mask and the substrate to induce a change in size of a structure; and (S5) a step of controlling a shape of a growing three-dimensional nanostructure while transporting the lower substrate in three dimensions. 2 . The method of claim 1 , wherein the conductive mask is provided with a thin metal film coating layer on one or both sides of a film substrate or is in the form of a metal mesh. 3 . The method of claim 2 , wherein the thin metal film coating layer or the metal mesh comprises chromium (Cr), gold (Au), or a mixture thereof. 4 . The method of claim 1 , wherein the substrate comprises silicon (Si), indium tin oxide (ITO), or silicon carbide (SiC). 5 . The method of claim 1 , wherein the electric field intensity between the conductive mask and the substrate is 5 V/μm to 200 V/μm. 6 . The method of claim 5 , wherein the electric field intensity between the conductive mask and the substrate is 16.67 V/μm to 100 V/μm. 7 . The method of claim 1 , wherein an intensity of the electric field (E nom ) generated in the step (S2) satisfies the following Equation 1: E n o m = electrical potential of substrate ( V ) / moving distance of charged nanoparticles ( μm ) . [ Equation 1 ] 8 . The method of claim 7 , wherein the moving distance of the charged nanoparticles is a distance between the upper inlet of the reactor and the substrate. 9 . A three-dimensional structure manufactured by the method according to claim 1 , wherein the three-dimensional structure has a size that satisfies the following Equation 2: W D = W ( α E nom d Δ V ) 1 2 ( 2 π ) [ Equation 2 ] wherein W D is a diameter (μm) of a stump of the three-dimensional structure, W is a spacing (μm) between the holes provided in the conductive mask, ΔV is an electric potential difference (V) between the conductive mask and the lower substrate, d is a separation distance (μm) between the conductive mask and the lower substrate, α is a constant, and E nom is an intensity of an electric field (V/μm) generated by the electric potential difference between the conductive mask and the lower substrate. 10 . The three-dimensional structure of claim 9 , wherein the value of α in the Equation 2 is 5. 11 . An apparatus for manufacturing a three-dimensional structure for use in the method according to claim 1 , comprising: a grounded reactor; a lower substrate located within the grounded reactor; a conductive mask disposed to be spaced apart above the lower substrate within the grounded reactor and provided with a plurality of holes; an electric field applying means for generating electric fields of different sizes in the conductive mask and the lower substrate, respectively, to form an electrostatic lens around the hole of the mask; a nanoparticle introducing means for introducing charged nanoparticles into an upper part of the conductive mask; an electric field adjusting means for adjusting the sizes of the electric fields applied to the conductive mask and the lower substrate; and a transporting means for transporting the lower substrate in three dimensions. 12 . The apparatus of claim 11 , wherein the conductive mask is
using masks · CPC title
Means for feeding of material, e.g. heads · CPC title
Platforms or substrates · CPC title
Direct deposition of metal particles, e.g. direct metal deposition [DMD] or laser engineered net shaping [LENS] · CPC title
Apparatus for additive manufacturing; Details thereof or accessories therefor · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.