Material Search Method, Material Search System, Program, And Recording Medium

Patent metadata

Field	Value
Publication number	US-2025364092-A1
Application number	US-202318873846-A
Country	US
Kind code	A1
Filing date	Jun 12, 2023
Priority date	Jun 24, 2022
Publication date	Nov 27, 2025
Grant date	—

Abstract

A novel material search method and a novel material search system are provided. P peak positions are obtained in descending order of peak intensity from a plurality of peaks appearing in an input XRD profile of a sample. In addition, for each of a plurality of pieces of physical property data of known materials registered in a material database, a record including R peak positions is generated in descending order of peak intensity. From a plurality of records, a record including peaks matching or substantially matching all of the P peak positions of the sample is searched for. In the case where the corresponding record is found, it is determined that the sample matches the known material registered in the material database. Furthermore, at least part of information related to the known material is output. R is preferably greater than P, and R is preferably less than or equal to 6 times P.

First claim

1 . A material search method using an XRD profile and a first data set,
wherein the first data set comprises a plurality of records each comprising R first peak positions extracted from each of a plurality of pieces of physical property data of known materials in descending order of a peak intensity, wherein the material search method comprises:
identifying a plurality of second peak positions and intensities from the XRD profile of a first material;
obtaining P second peak positions in descending order of a peak intensity from the plurality of second peak positions and intensities;
searching the first data set for the record comprising the first peak positions matching the P second peak positions; and
determining the first material to be the same as the known material related to the record in the case where the matched record is found,
wherein P is an integer greater than or equal to 2 and less than or equal to 10, and wherein R is an integer greater than P.

2 . The material search method according to claim 1 ,
wherein R is less than or equal to 6 times P.

3 . The material search method according to claim 1 ,
wherein the record comprises R plane indices corresponding to the R first peak positions, and wherein the material search method further comprises calculating a lattice constant of the first material determined to be the same as the known material using the first peak positions and the plane indices.

4 . A program for executing the material search method according to claim 1 on a computer.

5 . A computer-readable recording medium comprising the program according to claim 4 .

6 . The program according to claim 4 , wherein the program is written in html.

7 . A material search system using an XRD profile and a first data set,
wherein the first data set comprises a plurality of records each comprising R first peak positions extracted from each of a plurality of pieces of physical property data of known materials in descending order of a peak intensity, wherein the material search system is configured to identify a plurality of second peak positions and intensities from the XRD profile of a first material, wherein the material search system is configured to obtain P second peak positions in descending order of a peak intensity from the plurality of second peak positions and intensities, wherein the material search system is configure to search the first data set for the first peak positions matching the P second peak positions, wherein the material search system is configured to determine the first material to be the same as the known material related to the record in the case where the matched record is found, wherein P is an integer greater than or equal to 2 and less than or equal to 10, and wherein R is an integer greater than P.

8 . The material search system according to claim 7 ,
wherein R is less than or equal to 6 times P.

9 . The material search system according to claim 7 ,
wherein the record comprises R plane indices corresponding to the R first peak positions, and wherein the material search system is configured to calculate a lattice constant of the first material determined to be the same as the known material using the first peak positions and the plane indices.

10 . A program for implementing the material search system according to claim 1 on a computer.

11 . A computer-readable recording medium comprising the program according to claim 10 .

12 . The program according to claim 10 , wherein the program is written in html.

13 . A material search system using an XRD profile and a second data set,
wherein the second data set comprises a plurality of records, wherein the record comprises a name of a material having a peak at a peak position in a specified range and the peak position, wherein the material search system is configured to display the XRD profile on a display device, wherein the material search system is configured to display the second data set on the display device, and wherein the material search system has a function of displaying is configured to display, on the display device, a marker indicating the peak position of the record selected from the second data set.

14 . The material search system according to claim 13 ,
wherein the peak has a relative intensity in the specified range.

15 . The material search system according to claim 13 ,
wherein the material search system is configured to display, on the display device, the marker and the XRD profile overlapping with each other.

16 . A program for implementing the material search system according to claim 13 on a computer.

17 . A computer-readable recording medium comprising the program according to claim 16 .

18 . The program according to claim 16 , wherein the program is written in html.

19 . A program for implementing the material search system according to claim 15 on a computer.

20 . A computer-readable recording medium comprising the program according to claim 19 .

21 . The program according to claim 19 , wherein the program is written in html.

Assignees

• Semiconductor Energy Lab

Inventors

• Tanemura Kazuki
• Mikami Mayumi
• Momma Yohei
• Higashi Kazuki

Classifications

• G16C60/00 Primary

  Computational materials science, i.e. ICT specially adapted for investigating the physical or chemical properties of materials or phenomena associated with their design, synthesis, processing, characterisation or utilisation · CPC title

• G06F16/908

  using metadata automatically derived from the content · CPC title

• G16C20/20

  Identification of molecular entities, parts thereof or of chemical compositions · CPC title

• G16C20/90 Primary

  Programming languages; Computing architectures; Database systems; Data warehousing · CPC title

• G01N23/2055

  Analysing diffraction patterns · CPC title