Segmented-width thin-film sense resistors with width-distributed terminal land connections

Patent metadata

Field	Value
Publication number	US-2025327838-A1
Application number	US-202519253779-A
Country	US
Kind code	A1
Filing date	Jun 28, 2025
Priority date	Apr 27, 2023
Publication date	Oct 23, 2025
Grant date	—

Abstract

A thin-film resistor circuit for an integrated circuit provides low resistance by segmenting a thin-film resistor to provide a wider effective thin-film resistor in a smaller die. The die includes a substrate, multiple electronic devices integrated on the substrate and interconnected to form at least a portion of an electronic circuit, a plurality of interconnect lands arranged in a grid that interconnect the devices with external terminals, and a thin-film resistor implemented by two or more thin-film resistor segments that operate in parallel in the circuit. The segments are disposed between different pairs of adjacent columns of the grid interconnect lands, with one of the thin-film resistor segments electrically connected along its width to lands of a first column of the grid of interconnect lands, and another one of the thin-film resistor segments is electrically connected along its width to lands of a second column of the grid interconnect lands.

First claim

What is claimed is:

1 . A die implementing an integrated circuit, comprising:
a substrate; a plurality of electronic devices integrated on the substrate and interconnected to form at least a portion of an electronic circuit; a plurality of interconnect lands arranged in a grid for interconnecting the electronic devices with a plurality of external terminals; a thin-film resistor implemented by at least two thin-film resistor segments that are coupled in electrical parallel in the electronic circuit, wherein the at least two thin-film resistor segments are disposed between different pairs of adjacent columns of the grid interconnect lands, wherein a first one of the at least two thin-film resistor segments is electrically connected along a width thereof to lands of a first column of the grid of interconnect lands, and wherein a second one of the at least two thin-film resistor segments is electrically connected along a width thereof to lands of a second column of the grid interconnect lands; and a pair of resistive networks integrated on the die, wherein the resistive networks are electrically connected to a corresponding one of the at least two thin-film resistor segments, wherein the resistors of the resistive networks have a first terminal electrically connected to the corresponding thin-film resistor segments at points along a width thereof and a second terminal electrically connected to a common sense node, and wherein the resistances of the resistive networks are scaled to compensate for the position of the electrical connections of the resistors of the resistive network along the width of the corresponding thin-film resistor segments.

2 . The die of claim 1 , wherein the at least two thin-film resistor segments extend substantially across the die, so that first ends of the at least two thin-film resistor segments are located proximate a first edge of the die, and so that second ends of the at least two thin-film resistor segments are located proximate a second edge of the die opposite the first edge of the die.

3 . The die of claim 1 , further comprising a metal interconnect disposed on the substrate that interconnects the first ends of the at least two thin-film resistor segments.

4 . The die of claim 1 , further comprising a pair of resistive networks integrated on the die, wherein the resistive networks are electrically connected to a corresponding one of the at least two thin-film resistor segments at points along a width thereof.

5 . The die of claim 1 , wherein the first one of the at least two thin-film resistor segments is disposed between the first column and the second column of the grid interconnect lands, wherein the second one of the at least two thin-film resistor segments is disposed between a third column and a fourth column of the grid interconnect lands, and wherein the second column and the third column are adjacent.

6 . The die of claim 1 , wherein the first one of the at least two thin-film resistor segments is disposed between the first column and the second column of the grid interconnect lands, wherein the second one of the at least two thin-film resistor segments is disposed between the second column and a third column of the grid interconnect lands, whereby the at least two thin-film resistor segments share a connection to the second column of grid interconnect lands.

7 . The die of claim 1 , wherein the at least two thin-film resistor segments have equal resistance.

8 . The die of claim 1 , wherein the lands are solder ball lands.

9 . The die of claim 1 , wherein a resistance of the thin-film resistor is less than one ohm.

10 . The die of claim 1 , wherein thin-film resistor is formed by a tantalum nitride (TaN) layer.

11 . A method of fabricating an integrated circuit, comprising:
forming a plurality of electronic devices on a substrate of the integrated circuit and interconnecting the electronic devices to form at least a portion of an electronic circuit; forming a plurality of interconnect lands arranged in a grid for interconnecting the electronic devices with a plurality of external terminals; depositing a thin-film resistor implemented by at least two thin-film resistor segments that are coupled in electrical parallel in the electronic circuit, wherein the at least two thin-film resistor segments are deposited between different pairs of adjacent columns of the grid interconnect lands; electrically connecting a first one of the at least two thin-film resistor segments along a width thereof to lands of a first column of the grid of interconnect lands; and electrically connecting a second one of the at least two thin-film resistor segments along a width thereof to lands of a second column of the grid interconnect lands.

12 . The method of claim 11 , wherein the depositing deposits the at least two thin-film resistor segments substantially across the die, so that first ends of the at least two thin-film resistor segments are located proximate a first edge of the die, and so that second ends of the at least two thin-film resistor segments are located proximate a second edge of the die opposite the first edge of the die.

13 . The method of claim 11 , further comprising forming a metal interconnect on the substrate that interconnects the first ends of the at least two thin-film resistor segments.

14 . The method of claim 12 , further comprising forming a pair of resistive networks on the die, wherein the resistive networks are electrically connected to a corresponding one of the at least two thin-film resistor segments at points along a width thereof.

15 . The method of claim 12 , wherein the depositing deposits a first one of the at least two thin-film resistor segments between the first column and the second column of the grid interconnect lands, and wherein the depositing deposits the second one of the at least two thin-film resistor segments between a third column and a fourth column of the grid interconnect lands, wherein the second column and the third column are adjacent.

16 . The method of claim 12 , wherein the depositing deposits the first one of the at least two thin-film resistor segments between the first column and the second column of the grid interconnect lands, and wherein the depositing deposits the second one of the at least two thin-film resistor segments between the second column and a third column of the grid interconnect lands, whereby the at least two thin-film resistor segments share a connection to the second column of grid interconnect lands.

17 . The method of claim 12 , wherein the at least two thin-film resistor segments have equal resistance.

18 . The method of claim 12 , wherein the lands are solder ball lands.

19 . The method of claim 12 , wherein a resistance of the thin-film resistor is less than one ohm.

20 . The method of claim 12 , wherein depositing deposits a tantalum nitride (TaN) layer to form the thin-film resistor.

Assignees

• Cirrus Logic Int Semiconductor Ltd

Inventors

• Khenkin Aleksey
• Murphy Michael J

Classifications

• G01R19/0092

  Measuring current only · CPC title

• H01C1/16

  Resistor networks not otherwise provided for · CPC title

• H01C1/14

  Terminals or tapping points specially adapted for resistors; Arrangements of terminals or tapping points on resistors · CPC title

• G01R19/00

  Arrangements for measuring currents or voltages or for indicating presence or sign thereof (G01R5/00 takes precedence; for measuring bioelectric currents or voltages A61B5/24) · CPC title

• G01R1/203 Primary

  Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts (resistors in general H01C; microwave or radiowave terminations H01P1/26; coupling devices H01R) · CPC title