Multi-scale test device for crystallization performance of high-temperature melts

Patent metadata

Field	Value
Publication number	US-2025297806-A1
Application number	US-202418956611-A
Country	US
Kind code	A1
Filing date	Nov 22, 2024
Priority date	Mar 25, 2024
Publication date	Sep 25, 2025
Grant date	—

Abstract

Provided is a multi-scale test device for crystallization performance of high-temperature melts, including a furnace body, an atmosphere control system, an optical path system, a temperature control system and a control display system. The furnace body includes furnace body includes a cavity, a thermocouple wire, a hot wire fixing block, a hot wire welding electrode, a reflecting surface, an air inlet pipe and an air outlet pipe. The thermocouple wire, the hot wire fixing block, the hot wire welding electrode and the reflecting surface are located in the cavity, the air inlet pipe and the air outlet pipe are in communication with the cavity. The thermocouple wire is connected with the hot wire welding electrode to form a heating wire structure onto which a sample is placed, and a center of the heating wire structure is located directly above the reflecting surface.

First claim

What is claimed is:

1 . A multi-scale test device for crystallization performance of high-temperature melts, comprising:
a furnace body, an atmosphere control system, an optical path system, a temperature control system and a control display system; wherein the furnace body comprises a cavity, a thermocouple wire, a hot wire fixing block, a hot wire welding electrode, a reflecting surface, an air inlet pipe and an air outlet pipe, wherein the thermocouple wire, the hot wire fixing block, the hot wire welding electrode and the reflecting surface are located in the cavity, the air inlet pipe and the air outlet pipe are in communication with the cavity, the thermocouple wire is connected with the hot wire welding electrode to form a heating wire structure onto which a sample is placed, and a center of the heating wire structure is located directly above the reflecting surface; the temperature control system comprises a temperature control board and a first connecting wire, wherein the temperature control board is connected with the thermocouple wire in the cavity via the first connecting wire, and the temperature control board is connected with the control display system; the atmosphere control system comprises a gas cylinder and a control cabinet, wherein a gas port of the gas cylinder is connected with an outer end of the air inlet pipe, a flowmeter and a gas valve are assembled on the gas port of the gas cylinder, a signal input end of the control cabinet is connected with the flowmeter, and a signal output end of the control cabinet is connected with the gas valve; the optical path system comprises a microscope, a laser source, the reflecting surface and a camera, wherein an upper side of the cavity is provided with a furnace cover observation port, the microscope is provided at the furnace cover observation port, an eyepiece lens above the microscope is connected with the camera, an objective lens below the microscope is provided with a magnifying lens, the laser source is an infrared light source, the laser source is provided at the furnace cover observation port; the control display system comprises a controller and a display device, and the atmosphere control system, the optical path system and the temperature control system are in signal connection with the controller and the display device.

2 . The multi-scale test device for crystallization performance of high-temperature melts according to claim 1 , wherein a sealing gasket is provided at a position where the hot wire welding electrode and the cavity are connected.

3 . The multi-scale test device for crystallization performance of high-temperature melts according to claim 2 , wherein the sealing gasket is made of polytetrafluoroethylene and is located below the hot wire welding electrode.

4 . The multi-scale test device for crystallization performance of high-temperature melts according to claim 1 , wherein the cavity comprises a furnace wall, a furnace bottom and a furnace cover, the furnace wall is hollow and has an upper opening and a lower opening, the furnace bottom is integrally formed with the furnace wall at the lower opening of the furnace wall, the furnace cover is detachably connected to the upper opening of the furnace wall, the hot wire fixing block and the hot wire welding electrode are fixed on the furnace bottom via screws, and the furnace cover observation port is provided on the furnace cover.

5 . The multi-scale test device for crystallization performance of high-temperature melts according to claim 1 , wherein the thermocouple wire is a platinum-rhodium wire with an arc structure, the thermocouple wire comprises one or two thermocouple wires, and an upper side of the thermocouple wire is a sample placing area which is located in a center of the cavity.

6 . The multi-scale test device for crystallization performance of high-temperature melts according to claim 1 , wherein the atmosphere control system further comprises a vacuum pump, a suction port of the vacuum pump is connected with an outer end of the air outlet pipe, an exhaust valve is provided at the suction port of the vacuum pump, a pressure sensor is provided on the air outlet pipe, the pressure sensor is connected with the signal input end of the control cabinet, and the signal output end of the control cabinet is connected with the vacuum pump and the exhaust valve.

7 . The multi-scale test device for crystallization performance of high-temperature melts according to claim 1 , wherein the camera is a high-speed color camera with high-temperature image optimization capability.

8 . The multi-scale test device for crystallization performance of high-temperature melts according to claim 1 , wherein the magnifying lens comprises a plurality of magnifying lenses.

9 . The multi-scale test device for crystallization performance of high-temperature melts according to claim 1 , wherein a bottom of the cavity is punched with a round hole, and the first connecting wire passes through the round hole.

10 . The multi-scale test device for crystallization performance of high-temperature melts according to claim 1 , wherein the reflecting surface is connected with the controller and the display device via a second connecting wire below the reflecting surface, so that an inclination angle of the reflecting surface is able to be adjusted by means of the controller and the display device to change an angle at which a laser light irradiates on the sample.

11 . The multi-scale test device for crystallization performance of high-temperature melts according to claim 1 , wherein the laser source is provided below the furnace cover observation port.

Assignees

• Univ Chongqing

Inventors

• Lv Xuewei
• Li Yongda
• Deng Qingyu
• Zeng Junjie
• Wang Rui
• Pei Guishang
• Tian Renhao
• Zhang Ningyu

Classifications

• G01N21/35

  using infrared light (G01N21/39 takes precedence) · CPC title

• G01N2021/1765

  Method using an image detector and processing of image signal · CPC title

• F27D2019/0003

  Monitoring the temperature or a characteristic of the charge and using it as a controlling value · CPC title

• F27D19/00

  Arrangements of controlling devices · CPC title

• F27B3/28 Primary

  Arrangement of controlling, monitoring, alarm or the like devices · CPC title