Persistence filtering in spd arrays
US-2024406582-A1 · Dec 5, 2024 · US
US2025164311A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2025164311-A1 |
| Application number | US-202318838966-A |
| Country | US |
| Kind code | A1 |
| Filing date | Feb 9, 2023 |
| Priority date | Feb 15, 2022 |
| Publication date | May 22, 2025 |
| Grant date | — |
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A device comprising a display and a sensor is disclosed. The display comprises a plurality structures in a regular arrangement. The sensor comprises a radiation-sensitive device and radiation-emitting device arranged on a first axis. The display is configured to scatter a portion of radiation emitted by the radiation-emitting device with an intensity profile defined by the regular arrangement, the intensity profile having a first region of peak intensity extending along at least a second axis different to the first axis. Also disclosed is a method of reducing crosstalk in such a device.
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1 . A device comprising: a display comprising a plurality structures in a regular arrangement; and a radiation-sensitive device and a radiation-emitting device arranged on a first axis; wherein the display is configured to scatter a portion of radiation emitted by the radiation-emitting device with an intensity profile defined by the regular arrangement, the intensity profile having a first region of peak intensity extending along at least a second axis different to the first axis. 2 . The device of claim 1 , wherein the first axis is rotated relative to the second axis such that the radiation-sensitive device is substantially outside the region of peak intensity. 3 . The device of claim 1 , wherein the first axis is rotated relative to the second axis such that the radiation-sensitive device is within a region of minimum intensity. 4 . The device of claim 1 , wherein the first axis is rotated relative to the second axis by an angle of substantially +/−45 degrees. 5 . The device of claim 1 wherein the intensity profile has a second region of peak intensity extending along a third axis substantially orthogonal to the second axis. 6 . The device of claim 1 wherein the radiation-sensitive device and the radiation-emitting device are disposed behind the display and configured as a sensor for sensing one or more characteristics of a target disposed in front of the display. 7 . The device of claim 6 , wherein the sensor is configured as one of: a proximity sensor; a direct Time-of-Flight sensor; an indirect Time-of-Flight sensor; a gas sensor; a spectral sensor; a sensor for health monitoring applications. 8 . The device of claim 1 , wherein: the regular arrangement of structures is configured to anisotropically reflect and/or scatter the portion of radiation emitted by the radiation-emitting device to provide the reflected/scattered portion of radiation with the intensity profile; and/or the regular arrangement corresponds to a grid, array, lattice and/or periodic pattern of the plurality of structures. 9 . The device according to claim 1 , wherein the first region of peak intensity, and when dependent on claim 5 also the second region of peak intensity, comprises a plurality of maxima and minima due to diffraction of the portion of radiation by the display. 10 . The device of claim 1 , wherein the plurality of structures comprise Organic Light Emitting Diodes (OLEDs) and/or micro-Light Emitting Diodes (μLEDs). 11 . The device of claim 1 , wherein the radiation-sensitive device and the radiation-emitting device are provided as a packaged device. 12 . A method of reducing crosstalk between a radiation-sensitive device and a radiation-emitting device arranged on a first axis, wherein a display comprises a plurality of structures in a regular arrangement, the display configured to scatter a portion of radiation emitted by the radiation-emitting device with an intensity profile defined by the regular arrangement, the intensity profile having a first region of peak intensity extending along at least a second axis, the method comprising: positioning the radiation-sensitive device relative to the display such that the second axis is different to the first axis. 13 . The method of claim 12 , comprising providing the first axis rotated relative to the second axis such that the crosstalk is minimised. 14 . The method of claim 12 , comprising providing the first axis rotated relative to the second axis such that the crosstalk is below a maximum level and above a minimum threshold level. 15 . The method of claim 14 , wherein the radiation-sensitive device and the radiation-emitting device are configured as a sensor, the method comprising a step of calibration of the sensor, wherein the minimum threshold level defines an amount of crosstalk required for calibration of the sensor.
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