Substrate processing method

Patent metadata

Field	Value
Publication number	US-2025054753-A1
Application number	US-202418795432-A
Country	US
Kind code	A1
Filing date	Aug 6, 2024
Priority date	Aug 8, 2023
Publication date	Feb 13, 2025
Grant date	—

Abstract

Provided is a method of filling a gap with a flowable oxide film. In one embodiment of the disclosure, the method comprises forming a flowable silicon nitride film, followed by converting the silicon nitride film in a silicon oxide film. The silicon nitride film may be formed by supplying an oligomeric silicon source and a nitrogen source activated by a power. The silicon nitride film may be converted into the silicon oxide film by supplying an oxygen source while applying a vacuum UV radiation. The vacuum UV radiation may be applied in a pulsed mode.

First claim

1 . A method of filling a gap of a substrate, the method comprising:
forming a flowable silicon nitride film in the gap at a first temperature comprising:
supplying a silicon-containing gas and a nitrogen-containing gas to a reaction chamber; and
applying a power to the reaction chamber to activate the nitrogen-containing gas,
wherein the silicon-containing gas reacts with the activated nitrogen-containing gas to form the silicon nitride film;
converting the silicon nitride film into a silicon oxide film at a second temperature comprising:
continuously supplying an oxygen-containing gas to the reaction chamber; and
applying a Vacuum UV radiation to the silicon nitride film;
wherein the first temperature is different from the second temperature.

2 . The method of claim 1 , wherein converting the silicon nitride film into the silicon oxide film is carried out at a pressure of 100 Torr or less.

3 . The method of claim 2 , wherein the Vacuum UV radiation is applied in a pulsed mode.

4 . The method of claim 3 , wherein a duty ratio of the pulsed mode is 20% or less.

5 . The method of claim 1 , wherein an intensity of the Vacuum UV radiation is in a range of between about 80 mW/cm 2 and about 120 mW/cm 2 .

6 . The method of claim 1 , wherein the first temperature is about 100° C. or less.

7 . The method of claim 1 , wherein the second temperature is between about 70° C. and about 150° C.

8 . The method of claim 7 , wherein the second temperature is between about 80° C. and about 120° C.

9 . The method of claim 1 , wherein the silicon nitride film comprises at least one of SiN, SiCN, or a mixture thereof.

10 . The method of claim 1 , wherein the silicon-containing gas comprises at least one of dimer-trisilylamine, trimer-trisilylamine, tetramer-trisilylamine, pentamer-trisilylamine, hexamer-trisilylamine, heptamer-trisilylamine, octamer-trisilylamine, 2,2,4,4,6,6-hexamethylcyclotrisilazane, 1,1,1,3,3,3-hexamethyl disilazane, 1,3-divinyl-1,1,3,3-tetramethyldisilazane and 1,1,3,3-tetramethyldisilazane, or a mixture thereof.

11 . The method of claim 1 , wherein the nitrogen-containing gas comprises at least one of N 2 , N 2 O, NO 2 , NH 3 , NH 4 , N 2 H 2 , N 2 H 4 , or a mixture thereof.

12 . The method of claim 11 , wherein the nitrogen-containing gas is suppled at between about 10 sccm and about 100 sccm.

13 . The method of claim 12 , wherein the nitrogen-containing gas is suppled at between about 20 sccm and about 50 sccm.

14 . The method of claim 1 , wherein the silicon oxide film comprises at least one of SiO, SiCO, or a mixture thereof.

15 . The method of claim 1 , wherein the oxygen-containing gas comprises at least one of O 2 , O 3 , or mixture thereof.

16 . The method of claim 15 , wherein the oxygen-containing gas is suppled at between about 50 sccm and about 3,000 sccm.

17 . The method of claim 16 , wherein the oxygen-containing gas is suppled at between about 100 sccm and about 1,500 sccm.

18 . The method of claim 1 , wherein the Vacuum UV radiation is applied in different reaction chamber from the reaction chamber in which the silicon nitride film is converted into the silicon oxide film while supplying the oxygen-containing gas therein, after transferring the substrate thereto.

19 . The method of claim 1 , wherein the power is in a range of between about 40 W and about 200 W.

20 . The method of claim 19 , wherein the power is in a range of between about 50 W and about 150 W.

21 . The method of claim 1 , further comprising performing a film densification to densify the silicon oxide film at a third temperature in a reaction chamber different from the reaction chambers in which the film is formed and converted, while supplying a treatment gas thereto.

22 . The method of claim 21 , wherein the film densification is performed by at least one of a plasma treatment, a thermal treatment, or a mixture thereof.

23 . The method of claim 22 , wherein the film densification is performed by the plasma treatment, followed by the thermal treatment.

24 . The method of claim 21 , wherein the third temperature is between about 50° C. and about 800° C.

25 . The method of claim 24 , wherein the third temperature is between about 100° C. and about 600° C.

26 . The method of claim 22 , wherein the treatment gas comprises at least one of inert gas, O 2 , O 3 , H 2 O, H 2 O 2 , N 2 , or a mixture thereof during the thermal treatment.

27 . The method of claim 22 , wherein the treatment gas comprises at least one of H 2 , He, or a mixture thereof during the plasma treatment.

28 . The method of claim 22 , wherein a power of between about 300 W and about 700 W is applied to the reaction chamber during the plasma treatment.

29 . The method of claim 1 , wherein the method is carried out once or repeated a plurality of times.

30 . A method of filling a gap of a substrate, the method comprising:
forming a flowable silicon nitride film in the gap comprising:
supplying a silicon-containing gas and a nitrogen-containing gas to a reaction chamber; and
applying a power to the reaction chamber to activate the nitrogen-containing gas,
wherein the silicon-containing gas reacts with the activated nitrogen-containing gas to form the silicon nitride film;
converting the silicon nitride film into a silicon oxynitride film (SiON) while supplying an oxygen-containing gas to the reaction chamber; and applying a Vacuum UV radiation to the silicon oxynitride film.

31 . The method of claim 30 , wherein the method is carried out at about 70° C. or below.

32 . The method of claim 30 , wherein the Vacuum UV radiation is applied without supplying the oxygen-containing gas.

33 . The method of claim 30 , wherein the oxygen-containing gas comprises an ozone (O 3 ).

34 . The method of claim 33 , wherein a concentration of the ozone is in a range of between about 200 g/m 3 and about 400 g/m 3 .

35 . The method of claim 30 , further comprising treating the silicon oxynitride film thermally by supplying at least one of Ar, O 2 , N 2 , or a mixture thereof.

36 . The method of claim 30 , further comprising treating the silicon oxynitride film by applying a power and supplying at least one of Ar, O 2 , N 2 , or a mixture thereof.

37 . The method of claim 30 , wherein a wet etch rate of the silicon oxynitride film is determined by a ratio of a time for converting the silicon nitride film into the silicon oxynitride film to a time for treating the silicon oxynitride film under the Vacuum UV radiation.

38 . The method of claim 37 , wherein the wet etch rate of the silicon oxynitride film is about 15 nm/minute at the ratio of 1:1.

39 . The method of claim 30 , wherein the silicon-containing gas comprises at least one of dimer-trisilylamine, trimer-trisilylamine, tetramer-trisilylamine, pentamer-trisilylamine, hexamer-trisilylamine, heptamer-trisilylamine, octamer-trisilylamine, 2,2,4,4,6,6-hexamethylcyclotrisilazane, 1,1,1,3,3,3-hexamethyl disilazane, 1,3-divinyl-1,1,3,3-tetramethyldisilazane and 1,1,3,3-tetramethyldisilazane, or a mixture thereof.

40 . The method of claim 30 , wherein the nitroge

Assignees

• Asm Ip Holding Bv

Inventors

• Kim Kihun
• Yong Sangheon
• Choi Sungha
• Park Juhyuk
• Yang Jihye
• Jeong Jaewoo
• Yoshimoto Shinya
• Igarashi Makoto

Classifications

• H10P14/69433

  the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz · CPC title

• H10P14/69215 Primary

  the material being a silicon oxide, e.g. SiO2 · CPC title

• H10P14/6681

  the precursor containing a compound comprising Si · CPC title

• H10P14/6304

  Formation by oxidation, e.g. oxidation of the substrate · CPC title

• H10P14/6538 Primary

  by exposure to UV light · CPC title