Computing emission rate from gas density images
US-2024420311-A1 · Dec 19, 2024 · US
US2025035544A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2025035544-A1 |
| Application number | US-202218696835-A |
| Country | US |
| Kind code | A1 |
| Filing date | Oct 3, 2022 |
| Priority date | Oct 12, 2021 |
| Publication date | Jan 30, 2025 |
| Grant date | — |
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A gas analysis device includes a sample cell into which sample gas is introduced, a light source that irradiates the sample cell with light, a photodetector that detects light intensity of light which passes through the sample cell irradiated by the light source, a concentration calculation unit which calculates a concentration of a measurement target component contained in the sample gas based on light intensity outputted from the photodetector, and a light intensity output unit that outputs, comparably with a reference light intensity set in advance, a light intensity at calibration detected by the photodetector during calibration.
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1 . A gas analysis device comprising: a sample cell into which sample gas is introduced; a light source that irradiates the sample cell with light; a photodetector that detects light intensity of light which passes through the sample cell irradiated by the light source; a concentration calculation unit which calculates a concentration of a measurement target component contained in the sample gas based on light intensity outputted from the photodetector; and a light intensity output unit that outputs, comparably with a reference light intensity set in advance, a light intensity at calibration detected by the photodetector during calibration. 2 . The gas analysis device according to claim 1 , further comprising a calibration gas supply line that supplies a calibration gas to the sample cell, wherein the light intensity output unit outputs, as the light intensity at calibration, light intensity detected by the photodetector in a state in which the calibration gas is supplied to the sample cell. 3 . The gas analysis device according to claim 1 , wherein the light intensity output unit outputs the light intensity at calibration as a relative value with respect to the reference light intensity. 4 . The gas analysis device according to claim 3 , further comprising a warning output unit which compares the relative value with a predetermined threshold value set in advance, and outputs a warning signal if the relative value exceeds the threshold value. 5 . The gas analysis device according to claim 1 , wherein the gas analysis device analyzes a plurality of measurement target components contained in the sample gas; and the light intensity output unit outputs the light intensity at calibration for each wavelength region corresponding to each of the measurement target components. 6 . The gas analysis device according to claim 1 , wherein the reference light intensity is light intensity detected by the photodetector during calibration performed at a time of product shipment or before initiation of a first measurement. 7 . The gas analysis device according to claim 1 , wherein the light intensity output unit outputs, as the light intensity at calibration, light intensity detected by the photodetector during zero calibration. 8 . The gas analysis device according to claim 1 , wherein the sample cell is a multiple reflection type cell that emits incident light to an exterior after multiple reflections. 9 . The gas analysis device according to claim 1 , wherein the gas analysis device is an FTIR method or a QCL-IR method type on. 10 . The gas analysis device according to claim 1 , further comprising a cell heating mechanism which heats the sample cell to a predetermined temperature, and a gas introduction line which introduces the collected sample gas into the sample cell, and is provided with a flow restriction unit which restricts a flow rate of the sample gas introduced into the sample cell, wherein a filter is provided in the gas introduction line on a downstream side of the flow restriction unit, for eliminating particulate matter contained within the sample gas. 11 . The gas analysis device according to claim 10 , wherein the filter is maintained at a temperature higher than a dew point temperature of the sample gas passing therethrough, and lower than the predetermined temperature. 12 . The gas analysis device according to claim 10 , wherein an upstream side filter is further provided in the gas introduction line on an upstream side of the flow restriction unit, for eliminating particulate matter from within the sample gas. 13 . An exhaust gas analysis system that analyzes a measurement target component contained in exhaust gas emitted from a test subject which is a vehicle or a part thereof, comprising: a main flow path connected to an exhaust pipe of the test subject, into which the exhaust gas is introduced; a flowmeter which measures a flow rate of the exhaust gas flowing in the main flow path; a sampling part which collects a portion of the exhaust gas from the main flow path upstream of the flowmeter; the gas analysis device according to claim 1 that analyzes the exhaust gas collected by the sampling part and measures a concentration of the measurement target component; and an emissions amount calculation unit which calculates an amount of emissions of the measurement target component based on a corrected flow rate, which is a flow rate measured by the flowmeter which has been corrected by a flow rate collected by the sampling part, and a concentration of the measurement target component measured by the gas analysis device. 14 . The exhaust gas analysis system according to claim 13 , wherein the measurement target component has high adsorptivity to an inner pipe wall which forms the main flow path, and includes a water-soluble component. 15 . The exhaust gas analysis system according to claim 13 , wherein the measurement target component includes NH 3 . 16 . The exhaust gas analysis system according to claim 13 , further comprising a heating mechanism which heats a section of the main flow path between an exit of the exhaust pipe and a sample point of the sampling part. 17 . The exhaust gas analysis system according to claim 13 , wherein the exhaust gas flowing in the main flow path is raw exhaust gas which has not been diluted. 18 . A gas analysis method using a gas analysis device, the gas analysis device comprising a sample cell into which sample gas is introduced, a light source that irradiates the sample cell with light, and a photodetector that detects light intensity of light which passes through the sample cell irradiated by the light source, the gas analysis device analyzing a measurement target component contained in the sample gas based on a light intensity signal output from the photodetector, comprising outputting, comparably with a reference light intensity set in advance, a light intensity at calibration detected by the photodetector during calibration. 19 . A non-transitory computer readable medium having a program for a gas analysis device stored thereon, the gas analysis device comprising a sample cell into which sample gas is introduced, a light source that irradiates the sample cell with light, and a photodetector that detects light intensity of light which passes through the sample cell irradiated by the light source, the gas analysis device analyzing a measurement target component contained in the sample gas based on a light intensity signal output from the photodetector, the program, when executed by a computer, causing the computer to perform the functions of: a concentration calculation unit which calculates a concentration of a measurement target component contained in the sample gas based on light intensity outputted from the photodetector; and a light intensity output unit which outputs, comparably with a reference light intensity set in advance, a light intensity at calibration detected by the photodetector during calibration.
Zero adjustment, i.e. to verify calibration · CPC title
using FTIR · CPC title
separating gas from solid, e.g. filter · CPC title
using tunable lasers · CPC title
with temperature control (control of temperature G05D23/00; cryostats F17C3/08) · CPC title
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