Automatic positioning of an electrospray ionization emitter

Patent metadata

Field	Value
Publication number	US-2024404817-A1
Application number	US-202318530809-A
Country	US
Kind code	A1
Filing date	Dec 6, 2023
Priority date	Jun 2, 2023
Publication date	Dec 5, 2024
Grant date	—

Abstract

A position control system may acquire a set of mass spectra by directing an automated positioning system to sequentially position an ionization emitter at a plurality of positions relative to an inlet of a mass spectrometer and directing the mass spectrometer to acquire, while the ionization emitter is positioned at each position of the plurality of positions, a mass spectrum of ions introduced into the inlet. The ions introduced into the inlet include ions emitted from the ionization emitter. The position control system may generate, based on the set of mass spectra, an ion intensity map representing intensity of ions introduced into the inlet of the mass spectrometer as a function of position of the ionization emitter. Based on the ion intensity map, the position control system may identify an optimum position for the ionization emitter.

First claim

What is claimed is:

1 . A system comprising:
one or more processors; and memory storing executable instructions that, when executed by the one or more processors, cause a computing device to perform a process comprising:
acquiring a set of mass spectra, the acquiring the set of mass spectra comprising:
directing an automated positioning system to sequentially position an ionization emitter at a plurality of positions relative to an inlet of a mass spectrometer; and
directing the mass spectrometer to acquire, while the ionization emitter is positioned at each position of the plurality of positions, a mass spectrum of ions introduced into the inlet, wherein the ions introduced into the inlet include ions emitted from the ionization emitter;

generating, based on the set of mass spectra, an ion intensity map representing detected intensity of ions introduced into the inlet of the mass spectrometer as a function of position of the ionization emitter; and
identifying, based on the ion intensity map, an optimum position for the ionization emitter.

2 . The system of claim 1 , wherein the ion intensity map comprises a total ion map that indicates, for each position of the plurality of positions, a summed intensity of the ions while the ionization emitter is positioned at each respective position.

3 . The system of claim 1 , wherein the ion intensity map comprises an extracted ion map that indicates, for each position of the plurality of positions, a summed intensity of a subset of the ions while the ionization emitter is positioned at each respective position.

4 . The system of claim 3 , wherein the subset of ions comprises a set of the ions corresponding to the most intense signals.

5 . The system of claim 3 , wherein the subset of ions comprises only ions having an m/z value less than a threshold m/z value.

6 . The system of claim 3 , wherein the subset of ions comprises only solvent ions.

7 . The system of claim 3 , wherein:
the process further comprises classifying a selected ion introduced into the inlet as a contaminant ion; and the subset of ions excludes the ion classified as a contaminant ion.

8 . The system of claim 7 , wherein the classifying the selected ion as a contaminant ion comprises:
generating, based on the set of mass spectra, an extracted ion map for the selected ion; and classifying the selected ion based on the extracted ion map and a reference ion map.

9 . The system of claim 7 , wherein the classifying the selected ion as a contaminant ion comprises determining that a sheath gas flows coaxially around the ions emitted from the ionization emitter and that an extracted ion map for the selected ion does not have a linear cloud distribution.

10 . The system of claim 3 , wherein:
the process further comprises classifying one or more of the ions introduced into the inlet as proxy ions; and the subset of ions comprises only the one or more ions classified as proxy ions.

11 . The system of claim 1 , wherein the process further comprises directing the automated positioning system to position the ionization emitter at the optimum position.

12 . The system of claim 1 , wherein:
a sheath gas flows coaxially around the ions emitted from the ionization emitter; and the plurality of positions relative to the inlet are located along a linear search path.

13 . The system of claim 12 , wherein the process further comprises identifying the search path, wherein identifying the search path comprises:
acquiring an additional set of mass spectra data by sequentially positioning the emitter at a plurality of positions along each of a plurality of scan lines and acquiring a mass spectrum while the emitter is positioned at each of the plurality of positions; identifying, based on the additional set of mass spectra, an optimum position along each scan line; and determining the search path based on the optimum position of each scan line.

14 . A non-transitory computer-readable medium storing instructions that, when executed, direct at least one processor of a computing device for mass spectrometry to perform a process comprising:
acquiring a set of mass spectra, the acquiring the set of mass spectra comprising:
directing an automated positioning system to sequentially position an ionization emitter at a plurality of positions relative to an inlet of a mass spectrometer; and
directing the mass spectrometer to acquire, while the ionization emitter is positioned at each position of the plurality of positions, a mass spectrum of ions introduced into the inlet, wherein the ions introduced into the inlet include ions emitted from the ionization emitter;
generating, based on the set of mass spectra, an ion intensity map representing detected intensity of ions introduced into the inlet of the mass spectrometer as a function of position of the ionization emitter; and identifying, based on the ion intensity map, an optimum position for the ionization emitter.

15 . The computer-readable medium of claim 14 , wherein the ion intensity map comprises a total ion map that indicates, for each position of the plurality of positions, a summed intensity of the ions while the ionization emitter is positioned at each respective position.

16 . The computer-readable medium of claim 14 , wherein the ion intensity map comprises an extracted ion map that indicates, for each position of the plurality of positions, a summed intensity of a subset of the ions while the ionization emitter is positioned at each respective position.

17 . The computer-readable medium of claim 16 , wherein the subset of ions comprises a set of the ions corresponding to the most intense signals.

18 . The computer-readable medium of claim 16 , wherein the subset of ions comprises only ions having an m/z value less than a threshold m/z value.

19 . The computer-readable medium of claim 16 , wherein the subset of ions comprises only solvent ions.

20 . The computer-readable medium of claim 16 , wherein:
the process further comprises classifying a selected ion introduced into the inlet as a contaminant ion; and the subset of ions excludes the ion classified as a contaminant ion.

21 . The computer-readable medium of claim 16 , wherein:
the process further comprises classifying one or more of the ions introduced into the inlet as proxy ions; and the subset of ions comprises only the one or more ions classified as proxy ions.

22 . A system comprising:
one or more processors; and memory storing executable instructions that, when executed by the one or more processors, cause a computing device to perform a process comprising:
acquiring a set of mass spectra, the acquiring the set of mass spectra comprising:
directing an automated positioning system to sequentially position an ionization emitter at a plurality of positions relative to an inlet of a mass spectrometer; and
directing the mass spectrometer to acquire, while the ionization emitter is positioned at each position of the plurality of positions, a mass spectrum of ions introduced into the inlet, wherein the ions introduced into the inlet include ions emitted from the ionization emitter;

generating, based on the set of mass spectra, an ion signal quality map representing a figure of merit of signals corresponding to ions introduced into the inlet of the mass spectrometer as a function of position of the ionization emitter;
identifying, based on the ion signal quality map, an optimum position for the ion

Assignees

• Thermo Finnigan Llc

Inventors

• Silveira Joshua A
• Wouters Eloy R
• Remes Philip M
• Schultz Gary A
• Rucker Kristina
• Tsai Minghsi
• Zhang Emily

Classifications

• H01J49/165 Primary

  Electrospray ionisation · CPC title

• H01J49/0009 Primary

  Calibration of the apparatus · CPC title

• H01J49/04

  Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components · CPC title

• H01J49/025

  Detectors specially adapted to particle spectrometers (data acquisition H01J49/0036; detectors per se G01T, e.g. G01T1/28, G01T1/29) · CPC title

• G06T2207/30204

  Marker · CPC title