A method for determining an amount of radiation

Patent metadata

Field	Value
Publication number	US-2024337763-A1
Application number	US-202218292944-A
Country	US
Kind code	A1
Filing date	Jul 21, 2022
Priority date	Jul 27, 2021
Publication date	Oct 10, 2024
Grant date	—

Abstract

The present invention relates to a method for determining an amount of radiation having a wavelength of 1 zm-10 pm or particle radiation irradiated on a sensor material, the method comprising exposing the sensor material to said radiation for a period of time; subjecting the exposed sensor material to a measurement by a device configured to measure intensity of a colour; measuring the intensity of the colour of reflected, transmitted or detected light; and determining the amount of radiation to which the sensor material has been exposed, based on the measured intensity of the colour of the reflected, transmitted or detected light. The sensor material comprises a material represented by (M′)8(M″M′″)6O24(X,X′)2:M″″.

First claim

1 . A method for determining an amount of radiation having a wavelength of 1 zm-10 pm or particle radiation irradiated on a sensor material, the method comprising:
exposing the sensor material to said radiation having a wavelength of 1 zm-10 pm or particle radiation for a period of time, subjecting the exposed sensor material to a measurement by a device configured to measure intensity of a colour, measuring the intensity of the colour of reflected, transmitted or detected light, and determining the amount of radiation to which the sensor material has been exposed, based on the measured intensity of the colour of the reflected, transmitted or detected light, wherein the sensor material comprises a material represented by formula (I)
(M′) 8 (M″M″′) 6 O 24 (X,X′) 2 :M″″  formula (I)

wherein
M′ represents calcium or a monoatomic cation of an alkali metal selected from Group 1 of the IUPAC periodic table of the elements, or any combination of such cations;
M″ represents a trivalent monoatomic cation of an element selected from Group 13 of the IUPAC periodic table of the elements, or of a transition element selected from any of Groups 3-12 of the IUPAC periodic table of the elements, or any combination of such cations;
M′″ represents a monoatomic cation of an element selected from Group 14 of the IUPAC periodic table of the elements, or of an element selected from any of Groups 13 and 15 of the IUPAC periodic table of the elements, or of Zn, or any combination of such cations;
X represents an anion of an element selected from Group 17 of the IUPAC periodic table of the elements, or any combination of such anions, or wherein X is absent;
X′ represents an anion of one or more elements selected from Group 16 of the IUPAC periodic table of the elements, or any combination of such anions, or wherein X′ is absent; and
M″″ represents a dopant cation of an element selected from rare earth metals of the IUPAC periodic table of the elements, or from transition metals of the IUPAC periodic table of the elements, or of Ca, Ba, Sr, TI, Pb, or Bi, or any combination of such cations, or wherein M″″ is absent;
with the proviso that at least one of X and X′ is present.

2 . The method according to claim 1 , wherein the determining the amount of radiation to which the sensor material has been exposed is carried out by comparing the measured intensity of the colour of the reflected, transmitted or detected light to a database comprising measured intensity values and corresponding radiation values.

3 . The method according to claim 2 , wherein the database comprises at least one of a lookup table and a graph.

4 . The method according to claim 1 , wherein the period of time the sensor material is exposed to radiation is up to ten years.

5 . The method according to claim 1 , wherein the radiation is gamma radiation.

6 . The method according to claim 1 , wherein the device configured to measure intensity of a colour is selected from a the group consisting of a colour spectrophotometer, a photodetector, and a camera.

7 . The method according to claim 1 , wherein M′ represents a monoatomic cation of an alkali metal selected from Group 1 of the IUPAC periodic table of the elements, or any combination of such cations, with the proviso that M′ does not represent the monoatomic cation of Na alone.

8 . The method according to claim 1 , wherein M′ represents a combination of at least two monoatomic cations of different alkali metals selected from the group consisting of Li, Na, K, Rb, Cs, and Fr.

9 . The method according to claim 1 , wherein M″ represents a trivalent monoatomic cation of a metal selected from a the group consisting of Al and Ga, or a combination of such cations.

10 . The method according to claim 1 , wherein M″ represents a trivalent monoatomic cation of B.

11 . The method according to claim 1 , wherein M″′ represents a monoatomic cation of an element selected from the group consisting of Si and Ge, and a combination of such cations.

12 . The method according to claim 1 , wherein M″′ represents a monoatomic cation of an element selected from the group consisting of Al, Ga, N, P, As, and any combination of such cations.

13 . The method according to claim 1 , wherein X represents an anion of an element selected from the group consisting of F, Cl, Br, I, At, and any combination of such anions.

14 . The method according to claim 1 , wherein X′ represents a monoatomic or a polyatomic anion of one or more elements selected from the group consisting of O, S, Se, Te, and any combination of such anions.

15 . The method according to claim 1 , wherein M″″ represents a cation of an element selected from the group consisting of Yb, Er, Tb, and Eu, and any combination of such cations.

16 . The method according to claim 1 , wherein M″″ represents a cation of an element selected from the group consisting of Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Ag, W, and Zn, or any combination of such cations.

17 . The method according to claim 1 , further comprising arranging the sensor material in a polymer matrix.

18 . A method for creating a radiation map within at least a part of a space, comprising
arranging the sensor material comprising the material represented by formula (I) as defined in claim 1 , to cover at least a part of the space, using the method according to claim 1 for determining an amount of radiation irradiated on the sensor material, and providing the radiation map within the space, based on the determined amount of radiation on the sensor material and its location.

19 . A method for imaging with gamma radiation comprising:
exposing a substrate comprising the sensor material as defined in claim 1 to gamma radiation; subjecting the exposed sensor material to a measurement by a device configured to measure intensity of a colour; and generating an image from the measured intensity.

20 . A dosimeter for gamma irradiation, comprising the material represented by formula (I) of claim 1 .

Assignees

• Turun Yliopisto

Inventors

• Lastusaari Mika
• Norrbo Isabella
• Vuori Sami

Classifications

• G01T7/00

  Details of radiation-measuring instruments · CPC title

• G01T1/02 Primary

  Dosimeters (G01T1/15 takes precedence) · CPC title

• G01T1/10 Primary

  Luminescent dosimeters · CPC title