X-ray transmission inspection apparatus and x-ray transmission inspection method

Patent metadata

Field	Value
Publication number	US-2024255443-A1
Application number	US-202418407190-A
Country	US
Kind code	A1
Filing date	Jan 8, 2024
Priority date	Jan 31, 2023
Publication date	Aug 1, 2024
Grant date	—

Abstract

Proposed are an X-ray transmission inspection apparatus and an X-ray transmission inspection method, in which transmission images with a large difference between irradiation angles are obtained so that the depth of the position of a foreign object can be obtained with high precision. The apparatus includes an X-ray source, an X-ray sensor configured to detect a transmitted X-ray, a sample moving mechanism configured to move the sample in a specific transport direction, and a calculation part configured to calculate a height position of a foreign object in a thickness direction in the sample on the basis of the transmitted X-ray detected by the X-ray sensor, wherein the X-ray source and the X-ray sensor include X-ray sources and X-ray sensors, the X-ray sources irradiate the sample with x-rays, and the X-ray sensors are disposed to respectively detect only transmitted X-rays of X-rays from the corresponding X-ray sources.

First claim

What is claimed is:

1 . An X-ray transmission inspection apparatus comprising:
an X-ray source configured to irradiate a sample with X-rays; an X-ray sensor installed on a side opposite to the X-ray source relative to the sample and configured to detect transmitted X-rays when X-rays pass through the sample; a sample moving mechanism configured to move the sample in a specific transport direction; and a calculation part configured to calculate a height position of a foreign object in a thickness direction in the sample based on the transmitted X-rays detected by the X-ray sensor, wherein a plurality of sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence are provided, each X-ray source of the plurality of sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence irradiates the sample with X-rays at a different irradiation angle with respect to the thickness direction of the sample, and each X-ray sensor of the plurality of sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence is arranged to detect only the transmitted X-rays of X-rays from a corresponding X-ray source.

2 . The X-ray transmission inspection apparatus according to claim 1 , wherein the calculation part calculates the height position of the foreign object from an amount of misalignment among a plurality of X-ray transmission images detected by each X-ray sensor of the plurality of sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence.

3 . The X-ray transmission inspection apparatus according to claim 1 , wherein the X-ray sensor is a TDI sensor.

4 . The X-ray transmission inspection apparatus according to claim 2 , wherein the X-ray sensor is a TDI sensor.

5 . The X-ray transmission inspection apparatus according to claim 1 , further comprising:
a reference piece installed on a surface of the sample, wherein the calculation part calculates height position of the foreign object by comparison with a height position of the reference piece.

6 . The X-ray transmission inspection apparatus according to claim 1 , wherein each X-ray source of the plurality of sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence perform irradiation with X-rays in directions in which X-rays intersect one another.

7 . The X-ray transmission inspection apparatus according to claim 2 , wherein each X-ray source of the plurality of sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence perform irradiation with X-rays in directions in which X-rays intersect one another.

8 . The X-ray transmission inspection apparatus according to claim 1 , wherein each X-ray source of the plurality of sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence irradiates regions spaced apart from one another in the transport direction with X-rays.

9 . The X-ray transmission inspection apparatus according to claim 2 , wherein each X-ray source of the plurality of sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence irradiates regions spaced apart from one another in the transport direction with X-rays.

10 . An X-ray transmission inspection method using the X-ray transmission inspection apparatus according to claim 1 , the X-ray transmission inspection apparatus comprising two sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence, the method comprising:
moving the sample in the transport direction; detecting, as a first passing point, a position in the transport direction at which a foreign object in the sample is detected based on transmitted X-rays detected by the X-ray sensor of one of two sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence; detecting, as a second passing point, a position in the transport direction at which the foreign object in the sample is detected based on transmitted X-rays detected by the X-ray sensor of the other one of two sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence; and calculating a height position of the foreign object in the sample based on the first passing point, the second passing point, and the irradiation angles of the X-ray sources of the two sets of the X-ray sources paired with the X-ray sensors in one-to-one correspondence.

Assignees

• Hitachi High Tech Science Corp

Inventors

• Matsubara Satoshi

Classifications

• G01N2223/1016

  X-ray · CPC title

• G01N2223/03

  by transmission · CPC title

• G01N23/04 Primary

  and forming images of the material · CPC title

• G01N2223/652

  impurities, foreign matter, trace amounts · CPC title

• G01N2223/501

  array · CPC title