Measurement condition optimization system, threedimensional data measurement system, measurement condition optimization method, and non-transitory computer-readable medium

Patent metadata

Field	Value
Publication number	US-2024249486-A1
Application number	US-202118290351-A
Country	US
Kind code	A1
Filing date	May 20, 2021
Priority date	May 20, 2021
Publication date	Jul 25, 2024
Grant date	—

Abstract

A measurement condition optimization system according to an aspect of the present disclosure includes: a three-dimensional data input unit that inputs three-dimensional data of a measurement target installation in a predetermined facility measured using a measurement device; an overlapping portion determination unit that performs alignment processing on each piece of the input three-dimensional data, and determines an overlapping portion included in the three-dimensional data after the alignment processing; a measurement policy acquisition unit that acquires a measurement policy at the time of acquiring the three-dimensional data of the measurement target installation in the facility using the measurement device; and a measurement condition adjustment unit that adjusts a measurement condition to satisfy the measurement policy acquired by the measurement policy acquisition unit and make the overlapping portion included in the three-dimensional data determined by the overlapping portion determination unit within a predetermined range.

First claim

What is claimed is:

1 . A measurement condition optimization system comprising:
a three-dimensional data input unit configured to input three-dimensional data of a measurement target installation in a predetermined facility measured under a predetermined measurement condition using a measurement device; an overlapping portion determination unit configured to perform alignment processing on each piece of the input three-dimensional data, and determine an overlapping portion included in the three-dimensional data after the alignment processing; a measurement policy acquisition unit configured to acquire a measurement policy at the time of acquiring the three-dimensional data of the measurement target installation in the facility using the measurement device; and a measurement condition adjustment unit configured to adjust the measurement condition to satisfy the measurement policy acquired by the measurement policy acquisition unit and make the overlapping portion included in the three-dimensional data determined by the overlapping portion determination unit within a predetermined range.

2 . The measurement condition optimization system according to claim 1 , wherein
the measurement policy includes a range of an incident angle of a beam incident on the measurement target installation, the measurement condition includes a measurement range when the measurement device acquires the three-dimensional data of the measurement target installation, and the measurement condition adjustment unit adjusts the measurement range of the measurement device so that the range of the incident angle of the beam incident on the measurement target installation falls within the range of the measurement policy and the overlapping portion included in the three-dimensional data falls within a predetermined range.

3 . The measurement condition optimization system according to claim 2 , wherein the overlapping portion determination unit further calculates a direction of a surface of the measurement target installation on which the beam is incident using the three-dimensional data, and an incident angle of the beam incident on the measurement target installation using the calculated direction of the surface and coordinates of a measurement position to which the beam is emitted.

4 . The measurement condition optimization system according to claim 1 , wherein
the measurement condition includes a measurement position when the measurement device acquires the three-dimensional data of the measurement target installation, and the measurement condition adjustment unit adjusts the measurement position of the measurement device to satisfy the measurement policy and make the overlapping portion included in the three-dimensional data within a predetermined range.

5 . The measurement condition optimization system according claim 1 , wherein
the measurement policy includes a resolution that the three-dimensional data measured by the measurement device needs to satisfy, and the measurement condition adjustment unit adjusts the measurement condition of the measurement device so that the resolution of the three-dimensional data measured by the measurement device satisfies the measurement policy and the overlapping portion included in the three-dimensional data falls within a predetermined range.

6 . The measurement condition optimization system according to claim 1 , wherein when point clouds included in three-dimensional data acquired at measurement positions adjacent to each other among the three-dimensional data after the alignment processing adjoin each other, the overlapping portion determination unit determines a portion including the adjoining point clouds as the overlapping portion.

7 . A three-dimensional data measurement system comprising:
the measurement condition optimization system according to claim 1 , and a measurement device configured to acquire the three-dimensional data of the measurement target installation in the facility, wherein the measurement device newly acquires three-dimensional data of the measurement target installation in the facility using the measurement condition adjusted by the measurement condition adjustment unit.

8 . The three-dimensional data measurement system according to claim 7 , further comprising a coordinate transformation unit configured to transform coordinates of the three-dimensional data newly acquired by the measurement device,
wherein the coordinate transformation unit transforms the coordinates of the three-dimensional data newly acquired by the measurement device by using a coordinate transformation parameter used when the overlapping portion determination unit performs the alignment processing on each piece of the three-dimensional data input to the three-dimensional data input unit.

9 . A measurement condition optimization method comprising:
inputting three-dimensional data of a measurement target installation in a predetermined facility measured under a predetermined measurement condition using a measurement device; performing alignment processing on each piece of the input three-dimensional data, and determining an overlapping portion included in the three-dimensional data after the alignment processing; acquiring a measurement policy at the time of acquiring the three-dimensional data of the measurement target installation in the facility using the measurement device; and adjusting the measurement condition to satisfy the acquired measurement policy and make the determined overlapping portion included in the three-dimensional data within a predetermined range.

10 . A non-transitory computer-readable medium configured to store a program for causing a computer to execute measurement condition optimization processing including:
inputting three-dimensional data of a measurement target installation in a predetermined facility measured under a predetermined measurement condition using a measurement device; performing alignment processing on each piece of the input three-dimensional data, and determining an overlapping portion included in the three-dimensional data after the alignment processing; acquiring a measurement policy at the time of acquiring the three-dimensional data of the measurement target installation in the facility using the measurement device; and adjusting the measurement condition to satisfy the acquired measurement policy and make the determined overlapping portion included in the three-dimensional data within a predetermined range.

Assignees

• Nec Corp

Inventors

• Tsuji Akira
• Ono Yoshimasa
• Abe Jiro

Classifications

• G06T19/20 Primary

  Editing of three-dimensional [3D] images, e.g. changing shapes or colours, aligning objects or positioning parts · CPC title

• G06T2219/2004

  Aligning objects, relative positioning of parts · CPC title

• G01S17/89

  for mapping or imaging · CPC title