Adaptive overshoot-voltage suppression circuit, reference circuit, chip and communication terminal

Patent metadata

Field	Value
Publication number	US-2024143006-A1
Application number	US-202418408534-A
Country	US
Kind code	A1
Filing date	Jan 9, 2024
Priority date	Jul 29, 2021
Publication date	May 2, 2024
Grant date	—

Abstract

An adaptive overshoot-voltage suppression circuit ( 100 ), a reference circuit, a chip and a communication terminal. The adaptive overshoot-voltage suppression circuit ( 100 ) comprises an overshoot-voltage suppression unit ( 1001 ) and a voltage-current conversion unit ( 1002 ), wherein an input end of the overshoot-voltage suppression unit ( 1001 ) is connected to a preset sampling point on a reference circuit to be tested, an output end of the overshoot-voltage suppression unit ( 1001 ) is connected to an input end of the voltage-current conversion unit ( 1002 ), and an output end of the voltage-current conversion unit ( 1002 ) is connected to a preset adjustment point on said reference circuit.

First claim

1 . An adaptive overshoot-voltage suppression circuit, comprising an overshoot-voltage suppression unit and a voltage-to-current conversion unit, wherein an input end of the overshoot-voltage suppression unit is connected to a preset sampling point on a to-be-measured reference circuit, an output end of the overshoot-voltage suppression unit is connected to an input end of the voltage-to-current conversion unit, and an output end of the voltage-to-current conversion unit is connected to a preset regulating point on the to-be-measured reference circuit; and
in a starting process of the to-be-measured reference circuit, the overshoot-voltage suppression unit generates a transient high-frequency inducted voltage based on a sampling voltage obtained from the to-be-measured reference circuit, the transient high-frequency inducted voltage is converted into a corresponding pull-up current through the voltage-to-current conversion unit, and the pull-up current is injected into the to-be-measured reference circuit, and is superposed with a pull-down starting current of the to-be-measured reference circuit, to reduce a nonlinear starting current at a starting moment of the to-be-measured reference circuit.

2 . The adaptive overshoot-voltage suppression circuit according to claim 1 , wherein
the overshoot-voltage suppression unit comprises a capacitor, a first NMOS transistor, and a second NMOS transistor, an end of the capacitor is connected to the sampling point and a gate of the first NMOS transistor, the other end of the capacitor is connected to a drain of the first NMOS transistor and a drain of the second NMOS transistor, a gate of the second NMOS transistor is connected to an external enable circuit, and a source of the first NMOS transistor and a source of the second NMOS transistor are connected to a common ground end voltage.

3 . The adaptive overshoot-voltage suppression circuit according to claim 2 , wherein
the voltage-to-current conversion unit comprises a third NMOS transistor, a first resistor, a first PMOS transistor, and a second PMOS transistor, a gate of the third NMOS transistor is connected to the drain of the first NMOS transistor, the drain of the second NMOS transistor, and the other end of the capacitor, a source of the third NMOS transistor is connected to an end of the first resistor, a drain of the third NMOS transistor is connected to a drain and gate of the first PMOS transistor and a gate of the second PMOS transistor, a drain of the second PMOS transistor is connected to the regulating point, a source of the first PMOS transistor and a source of the second PMOS transistor are connected to a power supply voltage, and the other end of the first resistor is connected to the common ground end voltage.

4 . A reference circuit, comprising a starting module, a reference core module, and the adaptive overshoot-voltage suppression circuit according to claim 1 , wherein an input end of the adaptive overshoot-voltage suppression circuit is connected to a preset sampling point on the reference core module, and an output end of the adaptive overshoot-voltage suppression circuit is connected to a preset regulating point on the starting module.

5 . The reference circuit according to claim 4 , wherein
the regulating point is a position where the starting module outputs a starting current to the reference core module.

6 . The reference circuit according to claim 4 , wherein
the sampling point is a position where a gate of a first NMOS transistor is turned on by a sampling voltage sampled from the reference core module.

7 . An integrated circuit chip, comprising the reference circuit according to claim 4 .

8 . A communication terminal, comprising the reference circuit according to claim 4 .

Assignees

• Vanchip Tianjin Tech Co Ltd

Inventors

• Wang Yongshou
• Chen Cheng
• Li Chunling
• Gao Chenyang

Classifications

• G05F3/30 Primary

  Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities (G05F3/26 takes precedence) · CPC title

• G05F1/571 Primary

  with overvoltage detector · CPC title

• G05F1/468

  characterised by reference voltage circuitry, e.g. soft start, remote shutdown · CPC title

• G05F3/262

  using field-effect transistors only · CPC title

• G05F1/56 Primary

  using semiconductor devices in series with the load as final control devices (G05F1/461 takes precedence) · CPC title