Systems and methods for modifying solid-state breaker operations based on load profiles

Patent metadata

Field	Value
Publication number	US-2024047161-A1
Application number	US-202217877218-A
Country	US
Kind code	A1
Filing date	Jul 29, 2022
Priority date	Jul 29, 2022
Publication date	Feb 8, 2024
Grant date	—

Abstract

A method includes receiving a first set of operational parameters that correspond to one or more semiconductor devices of a solid-state circuit breaker and sending a first command to the solid-state circuit breaker to turn off the one or more semiconductors in response to the first set of operational parameters exceeding a first set of thresholds. The method includes sending a second command to the solid-state circuit breaker to turn on the one or more semiconductors in response to the first set of operational parameters being equal to or less than the first set of thresholds. The method includes receiving a second set of operational parameters that correspond to one or more electrical properties associated with an operation of the solid-state circuit breaker coupled to a load device and generating a baseline profile representative of the first set of operational parameters and the second operational parameters.

First claim

1 . A system, comprising:
a solid-state circuit breaker configured to couple between a power supply and an electrical load; one or more sensors configured to measure one or more properties associated with the solid-state circuit breaker, the electrical load, the power supply, or any combination thereof; a control system configured to communicatively couple to the one or more sensors, wherein the control system is configured to:
send a first signal to the solid-state circuit breaker, wherein the first signal is configured to cause the solid-state circuit breaker to close an airgap disconnector of the solid-state circuit breaker;
receive a first set of data from the one or more sensors;
send a second signal to the solid-state circuit breaker, wherein the second signal is configured to cause the solid-state circuit breaker to turn on one or more semiconductors in the solid-state circuit breaker;
receive a second set of data from the one or more sensors after the one or more semiconductors are turned on;
generate a baseline profile associated with one or more operations of the electrical load based on the first set of data and the second set of data;
receive a third set of data from the one or more sensors;
determine that a fault associated with the solid-state circuit breaker, the electric load, the power supply, or any combination thereof is present based a difference between the baseline profile and the third set of data; and
sending a third signal to the solid-state circuit breaker in response to determining that the fault is present, wherein the third signal is configured to cause the solid-state circuit breaker to open the airgap disconnector.

2 . The system of claim 1 , wherein the one or more sensors comprise one or more temperature sensors, one or more current sensors, one or more resistance sensors, one or more voltage sensors, or any combination thereof.

3 . The system of claim 1 , wherein the baseline profile comprises a set of parameters associated with one or more operational characteristics of the one or more semiconductors.

4 . The system of claim 3 , wherein the set of parameters are determined based on one or more temperature ratings associated with the one or more semiconductors.

5 . The system of claim 3 , wherein the set of parameters comprises:
a first current threshold determined based on one or more temperature ratings associated with the one or more semiconductors, one or more respective heatsinks associated with the one or more semiconductors, or both; a second current threshold representative of a maximum nominal current in a time period; and a maximum junction S temperature determined based on the one or more thermal limitations of the one or more semiconductors, one or more respective heatsinks associated with the one or more semiconductors, or both.

6 . The system of claim 3 , wherein the set of parameters are associated with the electrical load, an overcurrent rating associated with the solid-state circuit breaker, a maximum temperature associated with the solid-state circuit breaker, a maximum voltage associated with the solid-state circuit breaker, or any combination thereof.

7 . The system of claim 6 , wherein the set of parameters comprise one or more expected change of current values, one or more expected inrush currents during initialization, a nominal current value, a nominal voltage value, one or more expected changes in electrical properties at various time periods with respect to other operating devices, rate of change of the load current, or any combination thereof.

8 . The system of claim 1 , wherein the electrical load comprises one or more industrial automation devices.

9 . The system of claim 1 , wherein the control system is configured to:
send the second signal to turn on the one or more semiconductors at a first time; determine dissipated energy after sending the second signal to the solid-state circuit breaker; send a fourth signal to turn off the one or more semiconductors at a second time after the first time; and determine the dissipated energy after sending the fourth signal to the solid-state circuit breaker.

10 . The system of claim 1 , wherein the solid-state circuit breaker comprises a surge suppressor circuit, wherein the control system is configured to:
determine the dissipated energy in the surge suppressor circuit; and determine a turn-off time to limit transient voltage and the dissipated energy in the one or more semiconductors and the surge suppressor circuit.

11 . The system of claim 1 , wherein the control system is configured to perform a self-diagnostic of the solid-state circuit breaker, wherein the self-diagnostic comprises:
identifying one or more characteristics of the electrical load; and determining a lifetime of one or more components of the solid-state circuit breaker based on the one or more characteristics of the electrical load and the solid-state circuit breaker.

12 . A method, comprising:
receiving, via at least one processor, a first set of operational parameters that correspond to one or more semiconductor devices of a solid-state circuit breaker; sending, via the at least one processor, a first command to the solid-state circuit breaker in response to the first set of operational parameters exceeding a first set of thresholds, wherein the first command is configured to cause the one or more semiconductor devices to turn off; sending, via the at least one processor, a second command to the solid-state circuit breaker in response to the first set of operational parameters being equal to or less than the first set of thresholds, wherein the second command is configured to cause the one or more semiconductor devices to turn on; receiving, via the at least one processor, a second set of operational parameters that correspond to one or more electrical properties associated with an operation of the solid-state circuit breaker coupled to a load device after the one or more semiconductors are turned on; and generating, via the at least one processor, a baseline profile representative of the first set of operational parameters and the second set of operational parameters.

13 . The method of claim 12 , comprising:
determining, via the at least one processor, that a fault associated with the solid-state circuit breaker, the load device, a power supply configured to couple to the solid-state circuit breaker, or any combination thereof is present based on the baseline profile and a third set of operational parameters; and sending, via the at least one processor, a fourth command to the solid-state circuit breaker in response to determining that the fault is present, wherein the fourth command is configured to cause the solid-state circuit breaker to open an airgap disconnector of the solid-state circuit breaker.

14 . The method of claim 13 , comprising:
receiving, via at least one processor, the third set of operational parameters that correspond to one or more semiconductor devices of the solid-state circuit breaker; and sending, via the at least one processor, a third command to the solid-state circuit breaker based on a comparison between the third set of operational parameters and the baseline profile, wherein the third command is configured to cause the one or more semiconductor devices to turn off.

15 . The method of claim 14 , comprising:
receiving, via at least one processor, the third set of operational parameters that correspond to the one or more electrical properties associated with the operation of the solid-state circuit breaker coupled to the load device; and sending, via the at l

Assignees

• Rockwell Automation Tech Inc

Inventors

• Kerim Aiman
• Merki Juerg
• Adkins Kyle B
• Langer Randall S
• Carlson Andrew E
• Elmiger David

Classifications

• H01H71/125 Primary

  characterised by sensing elements, e.g. current transformers (for differential protection H01H83/144) · CPC title

• H01H83/20

  operated by excess current as well as by some other abnormal electrical condition · CPC title

• H01H2071/006

  Provisions for user interfaces for electrical protection devices · CPC title

• H01H9/541

  Contacts shunted by semiconductor devices · CPC title

• H01H71/14

  Electrothermal mechanisms {(combined with a electro-thermal time delay relay H01H61/002)} · CPC title