X-ray inspection apparatus and method of inspection with x-rays

Patent metadata

Field	Value
Publication number	US-2023384247-A1
Application number	US-202318137910-A
Country	US
Kind code	A1
Filing date	Apr 21, 2023
Priority date	May 31, 2022
Publication date	Nov 30, 2023
Grant date	—

Abstract

Proposed are an X-ray inspection apparatus and a method of inspection with X-rays in which even in a sample having coated portion and uncoated portion of the cathode material, the inspection of foreign objects in the both portions can be simultaneously performed under the same conditions. The X-ray inspection apparatus includes an X-ray source ( 2 ) that irradiates the sample (S) with X-rays (X 1 ), an X-ray detection unit ( 3 ) which is installed at a side opposite to the X-ray source with respect to the sample and detects the X-rays that passed through the sample, and a filter ( 4 ) installed between the X-ray source and the X-ray detection unit, wherein the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption.

First claim

What is claimed is:

1 . An X-ray inspection apparatus comprising:
an X-ray source that irradiates a sample with X-rays; an X-ray detection unit that is installed on a side opposite to the X-ray source with respect to the sample and detects the X-rays that passed through the sample; and a filter installed between the X-ray source and the X-ray detection unit, wherein the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption and the filter is formed of a material that makes an intensity ratio between an X-ray that passed through the region with a large amount of X-ray absorption and an X-ray that passed through the region with a small amount of X-ray absorption smaller than when the filter is not installed.

2 . The X-ray inspection apparatus of claim 1 , wherein the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption in a specific energy band of the X-rays with which the sample is irradiated and
the filter is formed of a material that makes absorption of X-rays of the specific energy band greater than absorption of X-rays of other energy bands.

3 . The X-ray inspection apparatus of claim 1 or claim 2 , wherein the sample has an uncoated portion that is a region where a base material is exposed and an amount of X-ray absorption is small and a coated portion that is a region where a material different from the base material is applied on the base material and an amount of X-ray absorption is large.

4 . The X-ray inspection apparatus of claim 1 or 2 , wherein the sample is of a flexible film shape and
the filter is placed in close contact with the sample between the X-ray source and the X-ray detection unit.

5 . The X-ray inspection apparatus of claim 4 , wherein the filter is placed on each of both surfaces of the sample with the sample being in between.

6 . The X-ray inspection apparatus of claim 4 , further comprising:
a sample moving mechanism that continuously moves the sample of a band shape in an extension direction of the sample, wherein the sample moving mechanism is provided with a roller member rotatable while the sample is in contact with a portion of an outer circumferential surface of the roller member, the X-ray source is disposed inside or outside the roller member, the X-ray detection unit is installed on a side opposite to the X-ray source with respect to a portion of the sample in contact with the outer circumferential surface of the roller member, and the roller member is the filter.

7 . A method of inspection with X-rays comprising:
irradiating a sample with X-rays from an X-ray source; and detecting the X-rays that passed through the sample with an X-ray detection unit installed at a side opposite to the X-ray source with respect to the sample, wherein a filter is installed between the X-ray source and the X-ray detection unit, the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption, and the filter is formed of a material that makes an intensity ratio between an X-ray that passed through the region with a large amount of X-ray absorption and an X-ray that passed through the region with a small amount of X-ray absorption smaller than when the filter is not installed.

Assignees

• Hitachi High Tech Science Corp

Inventors

• Takahara Toshiyuki
• Sato Tsuneo
• Matsubara Satoshi
• Seki Yuta
• Iwata Kazuya

Classifications

• G01N23/083 Primary

  the radiation being X-rays · CPC title

• G01N23/18

  Investigating the presence of flaws defects or foreign matter · CPC title

• G01N2223/313

  filters, rotating filter disc · CPC title

• H01M10/4285

  Testing apparatus · CPC title

• G01N2223/1016

  X-ray · CPC title