Determining a Radiation Intensity and/or a Wavelength of Process Lighting

Patent metadata

Field	Value
Publication number	US-2023182233-A1
Application number	US-202117920117-A
Country	US
Kind code	A1
Filing date	Mar 3, 2021
Priority date	Apr 21, 2020
Publication date	Jun 15, 2023
Grant date	—

Abstract

Various embodiments of the teachings herein include a method for determining a radiation intensity and/or a wavelength of a process light, wherein the melt pool underlying the process light can be generated by irradiating a metal material with an energy beam along a path, wherein the energy beam can be moved in accordance with a power profile along the path. The method may include:
providing a power profile for a section of the path as an input variable for a machine learning model; training the model using historical and/or synthetic power profiles and associated historical or synthetic radiation intensities and/or wavelengths of the process light for the metal material; and determining the radiation intensity and/or the wavelength of the process light as an output variable of the model.

First claim

What is claimed is:

1 . A method for determining a radiation intensity and/or a wavelength of a process light, wherein the melt pool underlying the process light can be generated by irradiating a metal material with an energy beam along a path, wherein the energy beam can be moved in accordance with a power profile along the path, the method comprising:
providing a power profile for a section of the path as an input variable for a machine learning model; training the model using historical and/or synthetic power profiles and associated historical or synthetic radiation intensities and/or wavelengths of the process light for the metal material; and determining the radiation intensity and/or the wavelength of the process light as an output variable of the model.

2 . The method as claimed in claim 1 , further comprising
providing for the model a distance history for the section as an input wherein the distance history describes a distance between the section and the position at which the radiation intensity and/or the wavelength of the process light is to be determined.

3 . The method as claimed in claim 1 , further comprising
providing a mass profile as an input variable for the model for the section; wherein the mass profile describes a mass of the material for each point on section.

4 . The method as claimed in claim 1 , further comprising
providing a background temperature as an input variable for the model which the material or the workpiece has outside the melt pool.

5 . The method as claimed in claim 1 , wherein the model has a topology having coefficients of regression.

6 . The method as claimed in claim 1 , further comprising
providing a volume element that is representative for the section as an input variable for the model.

7 . The method as claimed in claim 1 , further comprising
providing as an input variable for the model a workpiece geometry representative for the section.

8 . The method as claimed in claim 1 , wherein the section is selected so that at least one interruption of the energy beam is included.

9 . The method as claimed in claim 1 , wherein the section is selected in dependence upon a workpiece geometry.

10 . A method for determining process deviations of a melting process, the method comprising:
providing a target value for a process light of a melt pool, wherein the target value depends on a radiation intensity determined using a method as claimed in claim 1 ; detecting a radiation intensity, emitted by the melt pool and/or a wavelength of the process light as an actual value; and comparing the target value with the actual value in order to detect process deviations.

11 . The method as claimed in claim 10 , further comprising weighting the relevance of the process deviation with the aid of classification parameters.

12 . A method for closed-loop control of a melting process, wherein a process deviation determined using a method as claimed in claim 10 is reduced and/or eliminated by adapting one or multiple process parameters, in particular a beam power, a beam speed, a distance between individual exposure vectors.

Assignees

• Siemens Ag

Inventors

• Heinrichsdorff Frank

Classifications

• B23K26/034

  Observing the temperature of the workpiece · CPC title

• G01N21/718

  Laser microanalysis, i.e. with formation of sample plasma · CPC title

• G01N21/71

  thermally excited · CPC title

• B23K31/125

  Weld quality monitoring · CPC title

• B22F10/20

  Direct sintering or melting · CPC title