Temperature-adjusted power-on data retention time tracking for solid state drives

US2023030620A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2023030620-A1
Application numberUS-202117387092-A
CountryUS
Kind codeA1
Filing dateJul 28, 2021
Priority dateJul 28, 2021
Publication dateFeb 2, 2023
Grant date

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  1. Title

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  2. Abstract

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  5. First independent claim

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  7. Citations and related patents

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Abstract

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In general, embodiments of the invention relate tracking the operating temperature of the solid-state memory modules (SSMMs) in order to improve their performance.

First claim

Opening claim text (preview).

What is claimed is: 1 . A method for managing a solid state memory module, the method comprising: obtaining a temperature reading for the solid state memory module; determining a counter increment value for a counter, wherein the counter is associated with a block in the solid state memory module, and wherein the counter increment value is determined using the temperature reading; updating a counter value for the counter using the counter increment value to obtain an updated counter value; making a determination that the updated counter value exceeds a threshold; and in response to the determination, performing a preventative operation. 2 . The method of claim 1 , further comprising: resetting the counter after the preventative operation is performed to a default value. 3 . The method of claim 1 , wherein the block comprises data; and wherein the updated counter value is a temperature modified retention time for the block. 4 . The method of claim 3 , wherein the threshold is an integrity threshold; and wherein the preventative operation is a garbage collection operation. 5 . The method of claim 1 , wherein the block is an erased block; and wherein the updated counter value is a temperature modified erase time for the block. 6 . The method of claim 5 , wherein the threshold is an erase bake threshold; and wherein the preventative operation is a re-erase operation. 7 . The method of claim 1 , wherein the threshold is determined using a default temperature and the temperature reading is above or below the default temperature. 8 . The method of claim 1 , wherein the temperature reading is a composition temperature reading derived from two or more separate temperature readings associated with the solid state memory module. 9 . A storage module, comprising: a storage module controller; a plurality of solid state memory modules; and a plurality of temperature sensors, wherein the storage module controller is configured to: obtain a composition temperature reading for a solid state memory module of the plurality of solid state memory modules based on plurality of temperature readings from the plurality of temperature sensors; determine a counter increment value for a counter, wherein the counter is associated with a block in the solid state memory module and wherein the counter increment value is determined using the composite temperature reading; update a counter value for the counter using the counter increment value to obtain an updated counter value; make a determination that the updated counter value exceeds a threshold; in response to the determination, perform a preventative operation; and reset the counter after the preventative operation is performed. 10 . The storage module of claim 9 , wherein the block comprises data; and wherein the updated counter value is a temperature modified retention time for the block. 11 . The storage module of claim 10 , wherein the threshold is an integrity threshold; and wherein the preventative operation is a garbage collection operation. 12 . The storage module of claim 9 , wherein the block is an erased block; and wherein the updated counter value is a temperature modified erase time for the block. 13 . The storage module of claim 12 , wherein the threshold is an erase bake threshold; and wherein the preventative operation is a re-erase operation. 14 . The storage module of claim 9 , wherein the threshold is determined using a default temperature and the composite temperature reading is above or below the default temperature. 15 . A non-transitory computer readable medium comprising computer readable program code to: obtain a temperature reading for a solid state memory module; determine a counter increment value for a counter, wherein the counter is associated with a block in the solid state memory module and wherein the counter increment value is determined using the temperature reading; update a counter value for the counter using the counter increment value to obtain an updated counter value; make a determination that the updated counter value exceeds a threshold, wherein the threshold is determined using an default temperature and the temperature reading is above the default temperature; and in response to the determination, perform a preventative operation. 16 . The non-transitory computer readable medium of claim 15 , wherein the computer readable program code further: resets the counter after the preventative operation is performed. 17 . The non-transitory computer readable medium of claim 15 , wherein the block comprises data; and wherein the updated counter value is a temperature modified retention time for the block. 18 . The non-transitory computer readable medium of claim 17 , wherein the threshold is an integrity threshold; and wherein the preventative operation is a garbage collection operation. 19 . The non-transitory computer readable medium of claim 15 , wherein the block is an erased block; and wherein the updated counter value is a temperature modified erase time for the block. 20 . The non-transitory computer readable medium of claim 19 , wherein the threshold is an erase bake threshold; and wherein the preventative operation is a re-erase operation.

Assignees

Inventors

Classifications

  • Power saving in memory, e.g. RAM, cache · CPC title

  • of memory devices · CPC title

  • Monitoring of events, devices or parameters that trigger a change in power modality · CPC title

  • comprising thermal management · CPC title

  • Cleaning, compaction, garbage collection, erase control · CPC title

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Frequently asked questions

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What does patent US2023030620A1 cover?
In general, embodiments of the invention relate tracking the operating temperature of the solid-state memory modules (SSMMs) in order to improve their performance.
Who is the assignee on this patent?
Dell Products Lp
What technology area does this patent fall under?
Primary CPC classification G06F12/0246. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Feb 02 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).