Quantum dot, quantum dot layer, light-emitting element, and solar cell
US-2024158691-A1 · May 16, 2024 · US
US2022344591A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2022344591-A1 |
| Application number | US-202117506448-A |
| Country | US |
| Kind code | A1 |
| Filing date | Oct 20, 2021 |
| Priority date | Apr 8, 2021 |
| Publication date | Oct 27, 2022 |
| Grant date | — |
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A method of forming a perovskite thin film and a light-emitting device including a layer manufactured by the method.
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What is claimed is: 1 . A method of forming a perovskite thin film, the method comprising: preparing a substrate; spraying a first solution of a first perovskite compound precursor through an inner nozzle of a dual nozzle including the inner nozzle and an outer nozzle; spraying a second solution of a second perovskite compound precursor through the outer nozzle; forming a perovskite compound solution by reacting the first solution of the first perovskite compound precursor and the second solution of the second perovskite compound precursor; forming a membrane on the substrate from the perovskite compound solution; and evaporating a solvent of the perovskite compound solution from the membrane on the substrate. 2 . The method of forming a perovskite thin film of claim 1 , wherein the perovskite compound is a non-lead-based perovskite compound. 3 . The method of forming a perovskite thin film of claim 1 , wherein the spraying of the first solution of the first perovskite compound precursor and the spraying of the second solution of the second perovskite compound precursor are performed simultaneously. 4 . The method of forming a perovskite thin film of claim 1 , wherein a voltage difference exists between the substrate and the dual nozzle by application of an electric field. 5 . The method of forming a perovskite thin film of claim 4 , wherein the voltage difference is 50 keV or less. 6 . The method of forming a perovskite thin film of claim 1 , wherein the first perovskite compound precursor is a first metal halogen compound, the second perovskite compound precursor is a second metal halogen compound, and the first metal halogen compound and the second metal halogen compound are different metal halogen compounds. 7 . The method of forming a perovskite thin film of claim 1 , wherein the first perovskite compound precursor is represented by Formula 1: A α A′ α ′X Formula 1 wherein, in Formula 1, A and A′ each independently represent an alkali metal, an alkaline earth metal, or a lanthanide metal, X represents a halogen, and α and α′ each independently represent a number from 0 to 1. 8 . The method of forming a perovskite thin film of claim 1 , wherein the second perovskite compound precursor is represented by Formula 2: B β B′ β ′X Formula 2 wherein, in Formula 1, B and B′ each independently represent a transition metal or a post transition metal, X represents a halogen, and β and β′ each independently represent a number from 0 to 1. 9 . The method of forming a perovskite thin film of claim 1 , wherein the perovskite compound is represented by Formula 3: A α A′ α ′B β B′ β ′X γ Formula 3 in Formula 3, A, A′, α, and α′ are as defined in Formula 1, B, B′, β, and β′ are as defined in Formula 2, X represents a halogen, and γ represents a number from 1 to 9. 10 . The method of forming a perovskite thin film of claim 1 , wherein the first solution includes the first solvent, the second solution includes the second solvent, and the first solvent and the second solvent are organic solvents. 11 . The method of forming a perovskite thin film of claim 10 , wherein the organic solvent has a boiling point of about 110° C. to about 200° C. 12 . The method of forming a perovskite thin film of claim 10 , wherein the first solvent and the second solvent are identical organic solvents. 13 . The method of forming a perovskite thin film of claim 10 , wherein the organic solvent is dimethylformamide (DMF), dimethyl sulfoxide (DMSO), o-dichlorobenzene, m-dichlorobenzene, p-dichlorobenzene, or any combination thereof. 14 . The method of forming a perovskite thin film of claim 1 , wherein a temperature of the first solution is about 15° C. to about 200° C. 15 . The method of forming a perovskite thin film of claim 1 , wherein a temperature of the second solution is about 15° C. to about 200° C. 16 . The method of forming a perovskite thin film of claim 1 , wherein a concentration of the first solution is about 0.01 M to about 1.0 M. 17 . The method of forming a perovskite thin film of claim 1 , wherein a concentration of the second solution is about 0.01 M to about 1.0 M. 18 . The method of forming a perovskite thin film of claim 1 , wherein a temperature of the substrate is 200° C. or less. 19 . A light-emitting device comprising: a first electrode; a second electrode facing the first electrode; and an interlayer located between the first electrode and the second electrode and including an emission layer, wherein the interlayer includes a layer manufactured by a method of forming a perovskite thin film, the method including: preparing a substrate; spraying a first solution of a first perovskite compound precursor through an inner nozzle of a dual nozzle including the inner nozzle and an outer nozzle; spraying a second solution of a second perovskite compound precursor through the outer nozzle; forming a perovskite compound solution by reacting the first solution of the first perovskite compound precursor and the second solution of the second perovskite compound precursor; forming a membrane on the substrate from the perovskite compound solution; and evaporating a solvent of the perovskite compound solution from the membrane on the substrate. 20 . The light-emitting device of claim 19 , wherein the layer manufactured by the method of forming a perovskite thin film is a hole injection layer, a hole transport layer, a buffer layer, an emission layer, or an electron transport layer.
with alkali or alkaline earth metals · CPC title
Electricity · mapped topic
Electricity · mapped topic
Organic perovskites; Hybrid organic-inorganic perovskites [HOIP], e.g. CH3NH3PbI3 · CPC title
in the presence of solvent vapors, e.g. solvent vapour annealing · CPC title
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