Unbalanced failure detector circuit for detecting unbalanced failure of electronic device apparatus including electronic devices

Patent metadata

Field	Value
Publication number	US-2022294440-A1
Application number	US-201917627870-A
Country	US
Kind code	A1
Filing date	Aug 7, 2019
Priority date	Aug 7, 2019
Publication date	Sep 15, 2022
Grant date	—

Abstract

An unbalanced failure detector circuit according to one aspect of the present disclosure is provided for detecting an unbalanced failure of an electronic device apparatus including electronic devices, and the electronic device apparatus includes a plurality of current paths connected in parallel. The unbalanced failure detector circuit includes a detector unit, and a controller. The detector unit has a plurality of coils connected in series and arranged to surround the plurality of current paths, respectively, and is configured to output a coil sum voltage which is a sum of induced voltages generated across the plurality of coils by currents flowing through the plurality of current paths. The controller is configured to detect the unbalanced failure of the electronic device apparatus when the coil sum voltage outputted from the detector unit exceeds a predetermined value range.

First claim

1 . An unbalanced failure detector circuit for detecting an unbalanced failure of an electronic device apparatus including electronic devices, and the electronic device apparatus including a plurality of current paths connected in parallel, the unbalanced failure detector circuit comprising:
a detector unit having a plurality of coils connected in series and arranged to surround the plurality of current paths, respectively, and the detector unit being configured to output a coil sum voltage which is a sum of induced voltages generated across the plurality of coils by currents flowing through the plurality of current paths; and a controller configured to detect the unbalanced failure of the electronic device apparatus when the coil sum voltage outputted from the detector unit exceeds a predetermined value range.

2 . The unbalanced failure detector circuit as claimed in claim 1 ,
wherein each of the plurality of coils has a number of windings and a winding direction that cause the coil sum voltage to be substantially zero, and wherein the predetermined value range is a range between a positive threshold voltage and a negative threshold voltage.

3 . The unbalanced failure detector circuit as claimed in claim 2 ,
wherein the number of windings of each of the plurality of coils is set to satisfy the following equation:

∑

i
=
1

N

I
i

×

n
i

=
0

,

where I i denotes a current flowing through each of the current paths,
n i denotes a number of windings of each of the coils corresponding to each of the current paths, and
a winding direction of one of the plurality of coils is defined as a reference winding direction,
a number of windings of each of coils having the winding direction that is identical to the reference winding direction is expressed by a positive number of windings, and
a number of windings of each of coils having the winding direction opposite to the reference winding direction is expressed by a negative number of windings.

4 . The unbalanced failure detector circuit as claimed in claim 1 ,
wherein the electronic device apparatus is powered by a power supply, and wherein the controller stops the power supply when the unbalanced failure is detected.

5 . The unbalanced failure detector circuit as claimed in claim 1 ,
wherein the plurality of electronic devices are semiconductor switching devices, respectively, wherein the plurality of semiconductor switching devices are controlled by an identical drive signal to selectively switch over conduction and non-conduction of currents, and wherein the unbalanced failure occurs due to a short-circuit failure or an open failure of at least one of the plurality of semiconductor switching devices.

6 . An electronic device apparatus comprising:
a plurality of current paths connected in parallel, each of the current paths including a semiconductor switching device; and an unbalanced failure detector circuit, wherein the unbalanced failure detector circuit is configured to detect an unbalanced failure of an electronic device apparatus including electronic devices, and the electronic device apparatus including a plurality of current paths connected in parallel, and wherein the unbalanced failure detector circuit comprises: a detector unit having a plurality of coils connected in series and arranged to surround the plurality of current paths, respectively, and the detector unit being configured to output a coil sum voltage which is a sum of induced voltages generated across the plurality of coils by currents flowing through the plurality of current paths; and a controller configured to detect the unbalanced failure of the electronic device apparatus when the coil sum voltage outputted from the detector unit exceeds a predetermined value range.

Assignees

• Omron Tateisi Electronics Co

Inventors

• Tauchi Hironori
• Ito Yuki
• Hyodo Takashi

Classifications

• H03K17/0822 Primary

  in field-effect transistor switches · CPC title

• H03K17/122 Primary

  in field-effect transistor switches · CPC title

• H03K2217/0027

  Measuring means of, e.g. currents through or voltages across the switch · CPC title