Sapphire substrate having elongated projection and semiconductor light emitting device utilizing the same
US-9525103-B2 · Dec 20, 2016 · US
US2022260469A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2022260469-A1 |
| Application number | US-201917630707-A |
| Country | US |
| Kind code | A1 |
| Filing date | Aug 19, 2019 |
| Priority date | Aug 19, 2019 |
| Publication date | Aug 18, 2022 |
| Grant date | — |
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A method of determining vapor pressure of a fluid is provided. The method comprises the step of providing a meter having meter electronics, wherein the meter comprises at least one of a flowmeter and a densitometer. A process fluid is flowed through the meter. A low-pressure location associated with the meter is provided. The pressure of the process fluid is adjusted until flashing is detectable at the low-pressure location. The true vapor pressure of the process fluid is calculated at an instant where flashing is detected.
Opening claim text (preview).
We claim: 1 . A method of determining vapor pressure of a fluid, comprising the steps of: providing a meter having meter electronics, wherein the meter comprises at least one of a flowmeter and a densitometer; flowing a process fluid through the meter; providing a low-pressure location associated with the meter; measuring a temperature of the process fluid at the low-pressure location; adjusting the static pressure of the process fluid until flashing is detectable at the low-pressure location; and determining the true vapor pressure of the process fluid at an instance where flashing is detectable. 2 . The method of determining vapor pressure of a fluid of claim 1 , wherein measuring the temperature comprises IR thermography. 3 . The method of determining vapor pressure of a fluid of claim 1 , wherein detecting the flashing comprises optical analysis. 4 . The method of determining vapor pressure of a fluid of claim 1 , wherein the low-pressure location comprises a flowmeter manifold. 5 . The method of determining vapor pressure of a fluid of claim 1 , wherein the low-pressure location comprises a differential pressure element. 6 . The method of determining vapor pressure of a fluid of claim 1 , comprising the steps of: measuring the temperature of the process fluid; and calculating the Reid Vapor Pressure from the temperature and the true vapor pressure. 7 . The method of determining vapor pressure of a fluid of claim 1 , comprising the step of measuring a vapor:liquid ratio at a time point where the Reid vapor pressure is measured; and associating the vapor:liquid ratio with the Reid vapor pressure at the time point the Reid vapor pressure is measured. 8 . A system ( 300 ) for determining true vapor pressure of a process fluid comprising: a meter ( 5 ) comprising at least one of a flowmeter and a densitometer; a low-pressure location associated with the meter; a pressure regulator ( 308 ) in fluid communication with the meter ( 5 ); a pressure sensor ( 312 ) in fluid communication with the process fluid; a temperature sensor configured to measure a temperature at the low-pressure location; meter electronics ( 20 ) in communication with the meter ( 5 ) and the pressure sensor ( 312 ), wherein the meter electronics ( 20 ) is configured to: control the pressure regulator ( 308 ) to adjust the static pressure of the process fluid until flashing at the low-pressure location is detected; and calculate a true vapor pressure of the process fluid at an instance where flashing is detectable. 9 . The system ( 300 ) of claim 8 , wherein the temperature sensor comprises an IR thermograph. 10 . The system ( 300 ) of claim 8 , wherein an optical sensor is configured to detect flashing. 11 . The system ( 300 ) of claim 8 , wherein the low-pressure location comprises a flowmeter manifold. 12 . The system ( 300 ) of claim 8 , wherein the low-pressure location comprises a differential pressure element. 13 . The system ( 300 ) of claim 8 , wherein the meter electronics ( 20 ) is configured to: measure a vapor:liquid ratio at a time point where the Reid vapor pressure is measured; and associating the vapor:liquid ratio with the Reid vapor pressure at the time point where the Reid vapor pressure is measured. 14 . The system ( 300 ) of claim 8 , wherein the meter ( 5 ) comprises: one or more conduits ( 103 , 103 ′); at least one driver ( 104 ) attached to the one or more conduits ( 103 , 103 ′) configured to generate a vibratory signal to the one or more conduits ( 103 , 103 ′); and at least one pickoff ( 105 , 105 ′) attached to the one or more conduits ( 103 , 103 ′) configured to receive a vibratory signal from the one or more conduits ( 103 , 103 ′).
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