Sample support, sample ionization method, and mass spectrometry method

Patent metadata

Field	Value
Publication number	US-2022238317-A1
Application number	US-202217719121-A
Country	US
Kind code	A1
Filing date	Apr 12, 2022
Priority date	Aug 6, 2018
Publication date	Jul 28, 2022
Grant date	—

Abstract

A sample support is a sample support for sample ionization, including: a substrate formed with a plurality of through holes opening to a first surface and a second surface on a side opposite to the first surface; a conductive layer provided not to block the through hole in the first surface; and a frame body provided in a peripheral portion of the substrate to surround an ionization region in which a sample is ionized when viewed in a thickness direction of the substrate, in which a marker for recognizing a position in the ionization region is provided in the frame body.

First claim

1 - 0 (canceled)

11 . A sample support for sample ionization, comprising:
a substrate formed with a plurality of through holes opening to a first surface and a second surface on a side opposite to the first surface; a conductive layer provided not to block the through hole in the first surface; and a frame body provided in a peripheral portion of the substrate to surround an ionization region in which a sample is ionized when viewed in a thickness direction of the substrate, wherein a marker for recognizing a position in the ionization region is provided in the frame body, wherein the marker is concave or convex formed on the surface of the frame.

12 . The sample support according to claim 11 ,
wherein a plurality of first markers disposed along a first direction are provided in a portion of the frame body extending along the first direction, and a plurality of second markers disposed along a second direction orthogonal to the first direction are provided in a portion of the frame body extending along the second direction.

13 . The sample support according to claim 12 ,
wherein each of the plurality of first markers is a numeric character, and each of the plurality of second markers is a letter.

14 . The sample support according to claim 11 ,
wherein the marker is covered by the conductive layer.

15 . The sample support according to claim 11 ,
wherein the marker includes a marker for visual contact having a width of greater than or equal to a predetermined value and a marker for a device having a width of less than the predetermined value.

16 . A sample support for sample ionization, comprising:
a substrate having conductivity, and formed with a plurality of through holes opening to a first surface and a second surface on a side opposite to the first surface; and a frame body provided in a peripheral portion of the substrate to surround an ionization region in which a sample is ionized when viewed in a thickness direction of the substrate, wherein a marker for recognizing a position in the ionization region is provided in the frame body, wherein the marker is concave or convex formed on the surface of the frame.

17 . A sample ionization method of an ionization device including an irradiation unit configured to apply an energy ray, a scanning unit configured to scan the marker provided in the frame body, and a control unit configured to control an operation of the irradiation unit, the method comprising:
a first step of preparing a sample and the sample support according to claim 11 ; a second step of disposing the sample support on the sample such that the second surface faces the sample; a third step of causing the control unit to recognize an irradiation range of the energy ray in the ionization region by causing the scanning unit to scan the marker provided in the frame body; and a fourth step of ionizing a component of the sample moved to the first surface side through the through hole in the irradiation range by causing the control unit to operate the irradiation unit such that the first surface in the irradiation range is irradiated with the energy ray while a voltage is applied to the conductive layer.

18 . A sample ionization method of an ionization device including an irradiation unit configured to apply an energy ray, a scanning unit configured to scan the marker provided in the frame body, and a control unit configured to control an operation of the irradiation unit, the method comprising:
a first step of preparing a sample and the sample support according to claim 16 ; a second step of disposing the sample support on the sample such that the second surface faces the sample; a third step of causing the control unit to recognize an irradiation range of the energy ray in the ionization region by causing the scanning unit to scan the marker provided in the frame body; and a fourth step of ionizing a component of the sample moved to the first surface side through the through hole in the irradiation range by causing the control unit to operate the irradiation unit such that the first surface in the irradiation range is irradiated with the energy ray while a voltage is applied to the substrate.

19 . The sample ionization method according to claim 17 ,
wherein the marker includes a marker for visual contact having a width of greater than or equal to a predetermined value and a marker for a device having a width of less than the predetermined value, and in the third step, a measurer determines the irradiation range, on the basis of an existence range of the sample in the ionization region and the marker for visual contact, and the control unit recognizes the irradiation range, on the basis of a position of the scanning unit when the marker for a device corresponding to the irradiation range determined by the measurer is read by the scanning unit.

20 . The sample ionization method according to claim 18 ,
wherein the marker includes a marker for visual contact having a width of greater than or equal to a predetermined value and a marker for a device having a width of less than the predetermined value, and in the third step, a measurer determines the irradiation range, on the basis of an existence range of the sample in the ionization region and the marker for visual contact, and the control unit recognizes the irradiation range, on the basis of a position of the scanning unit when the marker for a device corresponding to the irradiation range determined by the measurer is read by the scanning unit.

21 . A mass spectrometry method, comprising:
each of the steps of the sample ionization method according to claim 17 ; a fifth step of detecting the ionized component and of acquiring a distribution image indicating a mass distribution of the sample in the irradiation range; a sixth step of acquiring an optical image including the sample and the sample support, in a state in which the sample support is disposed on the sample; and a seventh step of superimposing the optical image on the distribution image such that the irradiation range of the optical image overlaps with the distribution image, on the basis of the marker in the optical image.

22 . A mass spectrometry method, comprising:
each of the steps of the sample ionization method according to of claim 18 ; a fifth step of detecting the ionized component and of acquiring a distribution image indicating a mass distribution of the sample in the irradiation range; a sixth step of acquiring an optical image including the sample and the sample support, in a state in which the sample support is disposed on the sample; and a seventh step of superimposing the optical image on the distribution image such that the irradiation range of the optical image overlaps with the distribution image, on the basis of the marker in the optical image.

23 . A mass spectrometry method, comprising:
each of the steps of the sample ionization method according to claim 19 ; a fifth step of detecting the ionized component and of acquiring a distribution image indicating a mass distribution of the sample in the irradiation range; a sixth step of acquiring an optical image including the sample and the sample support, in a state in which the sample support is disposed on the sample; and a seventh step of superimposing the optical image on the distribution image such that the irradiation range of the optical image overlaps with the distribution image, on the basis of the marker in the optical image.

24 . A mass spectrometry method, comprising:
each of the steps of the sample ionization method according to claim 10 ; a fifth st

Assignees

• Hamamatsu Photonics Kk

Inventors

• TAKIMOTO Miu
• Ohmura Takayuki
• Kotani Masahiro

Classifications

• H01J49/0418 Primary

  for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates · CPC title

• G01N27/628

  and a beam of energy, e.g. laser enhanced ionisation · CPC title

• H01J49/0004 Primary

  Imaging particle spectrometry · CPC title