Non-contact electrical parameter measurement device with radial dual mounted sensors

US2022082590A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2022082590-A1
Application numberUS-202117476054-A
CountryUS
Kind codeA1
Filing dateSep 15, 2021
Priority dateSep 15, 2020
Publication dateMar 17, 2022
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Systems and methods for operating and calibrating electrical parameter measurement devices are provided herein. The devices may include a current sensor that includes a plurality of magnetic field sensors positioned around a measurement area that receive a current carrying conductor under test. The sensor may include a plurality of concentric rings of magnetic field sensors that provide accurate measurements that ignore magnetic fields from conductors or other components outside of the measurement area. The sensors may be used to determine the position of a conductor under test, and such information may be used to produce accurate measurements by accounting for the conductor's position. A calibration system may also be provided that is operative to generate calibration data that is subsequently used to provide more accurate measurements. The calibration data may include one or more lookup tables, coefficients for one or more mathematical formulas, or other types of data.

First claim

Opening claim text (preview).

1 . An electrical parameter measurement device, comprising: a front end that includes an opening that is sized and dimensioned to receive a conductor under test; a plurality of magnetic field sensors disposed on a support member around the opening, the plurality of magnetic field sensors comprising a first set of magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of magnetic field sensors positioned a second radial distance from the center of the opening, the second radial distance being greater than the first radial distance, and each magnetic field sensor in the first set is radially aligned with a corresponding magnetic field sensor in the second set; and control circuitry operatively coupled to the plurality of magnetic field sensors, the control circuitry being configured to: receive sensor signals from the plurality of magnetic field sensors; determine a physical position of the conductor under test based at least in part on the sensor signals or using a mechanical means; and determine a current parameter of the conductor based at least in part on the sensor signals and the physical position. 2 . The electrical parameter measurement device of claim 1 , wherein the physical position of the conductor under test is determined by triangulation of at least three sensor signals received from at least three magnetic field sensors. 3 . The electrical parameter measurement device of claim 1 , wherein physical position of the conductor under test is determined by the mechanical means. 4 . The electrical parameter measurement device of claim 1 , wherein the control circuitry is configured to determine the physical position of the conductor under test using sensor signals from exactly three of the magnetic field sensors. 5 . The electrical parameter measurement device of claim 1 , wherein at least one of the plurality of magnetic field sensors comprises a first sub-sensor and a second sub-sensor arranged at a 90 degree angle relative to the first sub-sensor. 6 . The electrical parameter measurement device of claim 1 wherein each of the plurality of magnetic field sensors of the first set is formed in an integrated circuit that includes a respective one of the plurality of magnetic field sensors of the second set. 7 . The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors of the first set is mounted to a support with a corresponding, radially aligned magnetic field sensor of the second set. 8 . The electrical parameter measurement device of claim 1 , wherein the magnetic field sensors of the first set of magnetic field sensors are coupled in a first series, and the magnetic field sensors of the second set of magnetic field sensors are coupled in a second series. 9 . The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors is separately coupled to the control circuitry. 10 . The electrical parameter measurement device of claim 1 , wherein the plurality of magnetic field sensors comprises a third set of magnetic field sensors positioned a third radial distance from the center of the opening that is great than the second radial distance, and the control circuitry is operative to: determine that at least one of the magnetic field sensors of the first set of magnetic field sensors is saturated due to an amount of current in the conductor under test; and determine the current parameter of the conductor based at least in part on sensor signals from the second and third sets of the magnetic field sensors. 11 . The electrical parameter measurement device of claim 1 , wherein, to determine the current parameter of the conductor, the control circuitry is configured to determine a calibration factor based at least in part on the physical position of the conductor under test, and apply the calibration factor to determine the current parameter of the conductor. 12 . The electrical parameter measurement device of claim 1 , wherein the control circuitry is configured to determine that at least one of the plurality of magnetic field sensors is saturated, and to ignore the at least one of the plurality of magnetic field sensors in determining the current parameter of the conductor under test. 13 . The electrical parameter measurement device of claim 1 , wherein the control circuitry is configured to identify a saturated magnetic field sensor from the plurality of magnetic field sensors, and replace a sensor signal of the saturated magnetic field sensor with an interpolated sensor signal obtained using sensor signals from magnetic field sensors positioned adjacent to the saturated magnetic field sensor. 14 . The electrical parameter measurement device of claim 1 , further comprising a plurality of non-contact voltage sensors operatively coupled to the control circuitry, wherein the control circuitry determines the physical position of the conductor under test based at least in part on sensor signals received from the plurality of non-contact voltage sensors. 15 . The electrical parameter measurement device of claim 14 , wherein the control circuitry is configured to determine a voltage parameter of the conductor under test based at least in part on sensor signals received from the plurality of non-contact voltage sensors. 16 . The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors is operative to determine a direction of a magnetic field generated by the conductor under test. 17 . The electrical parameter measurement device of claim 1 , wherein the control circuitry applies a unique calibration factor for each of the plurality of magnetic field sensors. 18 . A method of operating an electrical parameter measurement device, the method comprising: placing a conductor under test in an opening of a support member of the electrical parameter measurement device; sensing one or more electrical parameters of the conductor under test, wherein the sensing comprises using a plurality of magnetic field sensors comprising a first set of equally spaced apart magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of equally spaced apart magnetic field sensors positioned at a second radial distance from the center of the opening, the second radial distance being greater than the first radial distance, and each magnetic field sensor in the first set is radially aligned with a corresponding magnetic field sensor in the second set; receiving sensor signals from the plurality of magnetic field sensors; determining a physical position of the conductor under test, wherein the determining is performed mechanically or based at least in part on the sensor signals; and determining a current parameter of the conductor based at least in part on the one or more electrical parameters sensed and the physical position. 19 . The method of claim 18 , wherein determining the physical position of the conductor under test comprises using sensor signals from exactly three of the magnetic field sensors. 20 . The method of claim 18 , wherein determining the physical position of the conductor under test comprises determining a direction of a magnetic field generated by the conductor under test by at least three of the plurality of magnetic field sensors.

Assignees

Inventors

Classifications

  • G01R15/181Primary

    using coils without a magnetic core, e.g. Rogowski coils · CPC title

  • Measuring current only · CPC title

  • G01R15/207Primary

    Constructional details independent of the type of device used · CPC title

  • Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types (G01R33/0206 takes precedence) · CPC title

  • using digital techniques or performing arithmetic operations (using digital techniques to measure a voltage or a current, see G01R19/25) · CPC title

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What does patent US2022082590A1 cover?
Systems and methods for operating and calibrating electrical parameter measurement devices are provided herein. The devices may include a current sensor that includes a plurality of magnetic field sensors positioned around a measurement area that receive a current carrying conductor under test. The sensor may include a plurality of concentric rings of magnetic field sensors that provide accurat…
Who is the assignee on this patent?
Fluke Corp
What technology area does this patent fall under?
Primary CPC classification G01R15/181. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Mar 17 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).