Manufacturing monitoring assistance device, manufacturing monitoring assistance method, and manufacturing monitoring assistance program

Patent metadata

Field	Value
Publication number	US-2022057789-A1
Application number	US-202017413417-A
Country	US
Kind code	A1
Filing date	Jan 30, 2020
Priority date	Feb 15, 2019
Publication date	Feb 24, 2022
Grant date	—

Abstract

A manufacturing monitoring assistance device includes: a model creation unit creating a computation model when a product as a sample is normal, based on a three-dimensional form acquired from the product; a simulation unit creating a corrective computation model when the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and performing a simulation on each of the computation model and the corrective computation model; and a monitoring method determination unit determining a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and causing an output device to display the determined method and the abnormality index.

First claim

We claim:

1 . A manufacturing monitoring assistance device comprising:
a model creation unit configured to create a computation model in a case where a product as a sample is normal, based on a three-dimensional form acquired from the product; a simulation unit configured to create a corrective computation model in a case where the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and to perform a simulation on each of the computation model and the corrective computation model; and a monitoring method determination unit configured to determine a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and to cause an output device to display the determined method and the abnormality index.

2 . The manufacturing monitoring assistance device according to claim 1 , wherein
the product comprises a plurality of members welded together, and the manufacturing process comprises a welding process.

3 . The manufacturing monitoring assistance device according to claim 1 , wherein
the model creation unit acquires a surface form of the product from one or more cameras, and creates the computation model, based on the acquired surface form.

4 . The manufacturing monitoring assistance device according to claim 1 , wherein
the model creation unit acquires a density distribution of the product from an X-ray computed tomography apparatus, and creates the computation model, based on the acquired density distribution.

5 . The manufacturing monitoring assistance device according to claim 2 , wherein
the simulation unit accepts entries, by user, of a state of an abnormality in the product, a position of the abnormality in the product, a condition of occurrence of the abnormality, and a degree of importance of the abnormality in association with a sort of the product, and regards the accepted state of the abnormality as the sample of the abnormal portion.

6 . The manufacturing monitoring assistance device according to claim 5 , wherein
the simulation unit accepts entries, by the user, of measurement values by the sensors, placeable positions of the sensors, a number of the sensors used, and a cost in association with types of the sensors, and regards the accepted types of the sensors as candidates for the sensors in the simulations.

7 . The manufacturing monitoring assistance device according to claim 6 , wherein
the monitoring method determination unit causes the output device to display a sensor placement as the determined method, and the abnormality index corresponding to the sensor placement.

8 . The manufacturing monitoring assistance device according to claim 7 , wherein
the monitoring method determination unit determines the sensor placement that maximizes a difference obtained by subtracting the cost from the abnormality index.

9 . A manufacturing monitoring assistance method implemented by a manufacturing monitoring assistance device,
the manufacturing monitoring assistance method comprising: causing a model creation unit of the manufacturing monitoring assistance device to create a computation model in a case where a product as a sample is normal, based on a three-dimensional form acquired from the product; causing a simulation unit of the manufacturing monitoring assistance device to create a corrective computation model in a case where the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and to perform a simulation on each of the computation model and the corrective computation model; and causing a monitoring method determination unit of the manufacturing monitoring assistance device to determine a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and to cause an output device to display the determined method and the abnormality index.

10 . A non-transitory computer-readable storage medium including a manufacturing monitoring assistance program stored therein,
the manufacturing monitoring assistance program, when executed by one or more processors included in a manufacturing monitoring assistance device, causing: a model creation unit of the manufacturing monitoring assistance device to execute processing of creating a computation model in a case where a product as a sample is normal, based on a three-dimensional form acquired from the product; a simulation unit of the manufacturing monitoring assistance device to execute processing of creating a corrective computation model in a case where the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and performing a simulation on each of the computation model and the corrective computation model; and a monitoring method determination unit of the manufacturing monitoring assistance device to execute processing of determining a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and causing an output device to display the determined method and the abnormality index.

Assignees

• Hitachi Ltd

Inventors

• KITAOKA Masanori
• Endou Hisashi
• KAKENO Nobuhiro
• Yoshikawa Hiroshi
• Yamada Toshihiro

Classifications

• G05B2219/37451

  Plan sensor placement for optimal inspection · CPC title

• G05B19/41875 Primary

  characterised by quality surveillance of production · CPC title

• G05B19/41885 Primary

  characterised by modeling, simulation of the manufacturing system · CPC title

• G05B19/4183

  characterised by data acquisition, e.g. workpiece identification · CPC title

• G05B2219/37217

  Inspect solder joint, machined part, workpiece, welding result · CPC title