Characterizing internal structures via ultrasound

Patent metadata

Field	Value
Publication number	US-2022018810-A1
Application number	US-202117365553-A
Country	US
Kind code	A1
Filing date	Jul 1, 2021
Priority date	Jul 15, 2020
Publication date	Jan 20, 2022
Grant date	—

Abstract

The present disclosure provides for characterizing internal structures via ultrasound by inducing an ultrasonic test wave in a component; developing a test signature based on measured propagation of the ultrasonic test wave through the component; characterizing an internal feature of the component based a comparison between the test signature and a baseline signature for the component; and providing an indication of the internal feature as characterized. In some aspects, the ultrasonic test wave is induced by a laser inducer and/or received by a laser interferometer. The test signature includes one or more of: frequency responses, amplitude responses, and times of flight. The test signature can be used to identify changes in a component over time, verify similarity between different components, monitor thermal processes, and verify an identify of a component.

First claim

What is claimed is:

1 . A method, comprising:
inducing an ultrasonic test wave in a component; developing a test signature based on measured propagation of the ultrasonic test wave through the component; characterizing an internal feature of the component based a comparison between the test signature and a baseline signature for the component; and providing an indication of the internal feature as characterized.

2 . The method of claim 1 , wherein the test signature is developed based on a time of flight and an amplitude signal response of the ultrasonic test wave through the component.

3 . The method of claim 1 , wherein the test signature is developed based on a frequency response of the ultrasonic test wave through the component.

4 . The method of claim 1 , wherein the internal feature characterized by the comparison includes at least one of a grain size, grain orientation, and a grain morphology of the component, and wherein the baseline signature is established based on a database of test result signals corresponding to known grain patterns.

5 . The method of claim 1 , wherein the ultrasonic test wave is induced by a laser.

6 . The method of claim 1 , wherein the ultrasonic test wave is induced on a first surface of the component and is selected from a group consisting of:
a surface wave, traveling along the first surface from a first location to a second location; a shear wave, traveling from the first location on the first surface through the component to a second surface opposite to the first surface, and back to the first surface at the second location; and a transverse wave, traveling from a third location on the first surface through the component to the second surface, and back to the first surface at the third location.

7 . The method of claim 1 , wherein characterizing an internal feature further comprises gating received signals at various times of signal reception to correspond to various depths in the component from a surface in which the ultrasonic test wave is induced.

8 . A system, comprising:
a processor; and a memory including instructions that when executed by the processor enable the system to perform an operation comprising:
inducing an ultrasonic test wave in a component;
developing a test signature based on measured propagation of the ultrasonic test wave through the component;

characterizing an internal feature of the component based a comparison between the test signature and a baseline signature for the component; and
providing an indication of the internal feature as characterized.

9 . The system of claim 8 , wherein the test signature is developed based on a time of flight and an amplitude signal response of the ultrasonic test wave through the component.

10 . The system of claim 8 , wherein the test signature is developed based on a frequency response of the ultrasonic test wave through the component.

11 . The system of claim 8 , wherein the internal feature characterized by the comparison includes at least one of a grain size, grain orientation, and a grain morphology of the component, and wherein the baseline signature is established based on a database of test result signals corresponding to known grain patterns.

12 . The system of claim 8 , wherein the ultrasonic test wave is collected by a laser interferometer.

13 . The system of claim 8 , wherein the ultrasonic test wave is induced on a first surface of the component and comprises:
a surface wave, traveling along the first surface from a first location to a second location; a shear wave, traveling from the first location on the first surface through the component to a second surface opposite to the first surface, and back to the first surface at the second location; and a transverse wave, traveling from a third location on the first surface through the component to the second surface, and back to the first surface at the third location.

14 . The system of claim 8 , wherein characterizing an internal feature further comprises gating received signals at various times of signal reception to correspond to various depths in the component from a surface in which the ultrasonic test wave is induced.

15 . A computer-readable storage device including instructions that when executed by a processor enable the processor perform an operation comprising:
inducing an ultrasonic test wave in a component; developing a test signature based on measured propagation of the ultrasonic test wave through the component; characterizing an internal feature of the component based a comparison between the test signature and a baseline signature for the component; and providing an indication of the internal feature as characterized.

16 . The computer-readable storage device of claim 15 , wherein the test signature is developed based on a time of flight and an amplitude signal response of the ultrasonic test wave through the component.

17 . The computer-readable storage device of claim 15 , wherein the test signature is developed based on a frequency response of the ultrasonic test wave through the component.

18 . The computer-readable storage device of claim 15 , wherein the internal feature characterized by the comparison includes at least one of a grain size, grain orientation, and a grain morphology of the component, and wherein the baseline signature is established based on a database of test result signals corresponding to known grain patterns.

19 . The computer-readable storage device of claim 15 , wherein the ultrasonic test wave is induced on a first surface of the component and comprises:
a surface wave, traveling along the first surface from a first location to a second location; a shear wave, traveling from the first location on the first surface through the component to a second surface opposite to the first surface, and back to the first surface at the second location; and a transverse wave, traveling from a third location on the first surface through the component to the second surface, and back to the first surface at the third location.

20 . The computer-readable storage device of claim 15 , wherein characterizing an internal feature further comprises gating received signals at various times of signal reception to correspond to various depths in the component from a surface in which the ultrasonic test wave is induced.

Assignees

• Boeing Co

Inventors

• Bingham Jill P
• Georgeson Gary E
• Fetzer Barry A

Classifications

• G01N2291/0234

  Metals, e.g. steel · CPC title

• G01N29/34

  Generating the ultrasonic, sonic or infrasonic waves {, e.g. electronic circuits specially adapted therefor} · CPC title

• G01N29/04 Primary

  Analysing solids (using acoustic emission techniques G01N29/14) · CPC title

• G06F21/64

  Protecting data integrity, e.g. using checksums, certificates or signatures · CPC title

• G01N2291/0289

  Internal structure, e.g. defects, grain size, texture · CPC title