Analyzer and Analysis Method

US2021396645A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2021396645-A1
Application numberUS-202117185373-A
CountryUS
Kind codeA1
Filing dateFeb 25, 2021
Priority dateJun 19, 2020
Publication dateDec 23, 2021
Grant date

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

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An analyzer includes a flow channel through which a particle flows through, a particle image analysis device, a scattering amplitude measurement device, and an data generator. The particle image analysis device includes an imaging unit which captures an image of the particle flowing through the flow channel, a first acquisition unit the image which obtains a size of the particle captured in the image. The scattering amplitude measurement device includes: a laser light source which emits laser light to the flow channel; a photodetector which detects transmitted light and scattered light caused by the particle; and a second acquisition unit which obtains a complex scattering amplitude of the particle based on changes over time in interference between the transmitted light and the scattered light. Using the obtained size and complex scattering amplitude, the data generator generates characteristics data for the particle.

First claim

Opening claim text (preview).

What is claimed is: 1 . An analyzer for analyzing characteristics of a particle, the analyzer comprising: a flow channel through which the particle is to flow; a particle image analysis device; a scattering amplitude measurement device; and a data generator, wherein the particle image analysis device includes: an imaging unit that captures an image of the particle flowing through the flow channel; and a first acquisition unit which obtains, based on the image, a size of the particle captured in the image, the scattering amplitude measurement device includes: a laser light source which emits laser light to the flow channel; a photodetector which detects transmitted light, which is a portion of the laser light and has been transmitted through the flow channel, and scattered light caused by the particle flowing through the flow channel; and a second acquisition unit which obtains a complex scattering amplitude of the particle flowing through the flow channel, based on changes over time in interference data, the interference being generated between the transmitted light and the scattered light, wherein the data generator generates characteristics data, using the size of the particle obtained by the first acquisition unit and the complex scattering amplitude of the particle obtained by the second acquisition unit, the characteristics data including at least one of: a complex refractive index of the particle; a complex dielectric constant of the particle; and any data derived from the complex refractive index or the complex dielectric constant. 2 . The analyzer according to claim 1 , wherein the imaging unit captures an image of a first region of the flow channel, the laser light is emitted to a second region of the flow channel, the data generator uses the size of the particle obtained based on the image captured at a first time, and the complex scattering amplitude that is obtained based on the changes over time in the interference in a time period which includes a second time, to generate the characteristics data, and a difference between (i) a time gap between the first time and the second time and (ii) a transit time of the particle between the first region and the second region is less than a predetermined threshold. 3 . The analyzer according to claim 2 , wherein the flow channel is linear and has a certain cross-sectional area between the first region and the second region, and the imaging unit has a first optical axis and the laser light has a second optical axis, the first optical axis and the second optical axis being in parallel with each other. 4 . The analyzer according to claim 3 , wherein the second acquisition unit obtains the complex scattering amplitude of the particle flowing through the flow channel within a target range in the flow channel on an axis that is orthogonal to both the second optical axis and a direction in which the flow channel extends, and the first acquisition unit obtains the size of the particle that is captured in a portion of the image corresponding to the target range. 5 . The analyzer according to claim 1 , wherein the first acquisition unit further obtains, based on the image, a shape of the particle captured in the image, and the data generator further uses the shape of the particle obtained by the first acquisition unit, to generate the characteristics data. 6 . The analyzer according to claim 1 , wherein the imaging unit captures an image of a target region of the flow channel, the laser light is emitted to the target region, and the imaging unit has a first optical axis and the laser light has a second optical axis, the first optical axis and the second optical axis intersecting with each other. 7 . The analyzer according to claim 1 , wherein the photodetector has a first light receiving element, a second light receiving element, a third light receiving element, and a fourth light receiving element, the first light receiving element and the third light receiving element are disposed plane symmetric to each other relative to a first plane which includes an optical axis of the laser light and is orthogonal to a direction in which the flow channel extends, the second light receiving element and the fourth light receiving element are disposed plane symmetric to each other relative to the first plane, the first light receiving element and the second light receiving element are disposed plane symmetric to each other relative to a second plane which includes the optical axis of the laser light and is in parallel with the direction in which the flow channel extends, and the third light receiving element and the fourth light receiving element are disposed plane symmetric to each other relative to the second plane. 8 . The analyzer according to claim 1 , wherein the scattering amplitude measurement device further includes a lens which focuses the laser light onto the flow channel. 9 . An analysis method for analyzing characteristics of a particle, the method comprising: capturing an image of the particle flowing through a flow channel; obtaining, based on the image, a size of the particle captured in the image; emitting laser light to the flow channel; detecting transmitted light, which is a portion of the laser light which has been transmitted through the flow channel, and scattered light caused by the particle flowing through the flow channel; obtaining a complex scattering amplitude of the particle flowing through the flow channel, based on changes over time in interference between the transmitted light and the scattered light; and generating characteristics data, using the obtained size and the obtained complex scattering amplitude, the characteristics data including at least one of: a complex refractive index of the particle; a complex dielectric constant of the particle; and any data that is derived from the complex refractive index or the complex dielectric constant.

Assignees

Inventors

Classifications

  • G01N15/00Primary

    Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials · CPC title

  • within a body or fluid · CPC title

  • using imaging; using holography · CPC title

  • Refractivity; Phase-affecting properties, e.g. optical path length (G01N21/21 takes precedence) · CPC title

  • the analysis being performed on a sample stream · CPC title

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What does patent US2021396645A1 cover?
An analyzer includes a flow channel through which a particle flows through, a particle image analysis device, a scattering amplitude measurement device, and an data generator. The particle image analysis device includes an imaging unit which captures an image of the particle flowing through the flow channel, a first acquisition unit the image which obtains a size of the particle captured in the…
Who is the assignee on this patent?
Shimadzu Corp
What technology area does this patent fall under?
Primary CPC classification G01N15/00. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Dec 23 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).