Solid-state image pickup apparatus, signal processing method for a solid-state image pickup apparatus, and electronic apparatus
US-9215390-B2 · Dec 15, 2015 · US
US2021368113A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2021368113-A1 |
| Application number | US-202016879655-A |
| Country | US |
| Kind code | A1 |
| Filing date | May 20, 2020 |
| Priority date | May 20, 2020 |
| Publication date | Nov 25, 2021 |
| Grant date | — |
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An image sensor uses a pixel circuit which includes a BJT phototransistor having multiple selectable beta values. The BJT is one semiconductor device includes: a substrate having a first conductivity type; a first well having the first conductivity type; a collector electrode having the first conductivity type in the first well; a second well having a first concentration of a second conductivity type; a first emitter electrode having the first conductivity type in the second well; a base electrode having the second conductivity type in the second well; a third well having a second concentration of the second conductivity type, wherein the second concentration is different from the first concentration; and a second emitter electrode having the first conductivity type in the third well.
Opening claim text (preview).
What is claimed is: 1 . A pixel circuit for use in an image sensor, comprising: a bipolar junction transistor (BJT) having a base, a collector, and a plurality of emitters, wherein the BJT is a phototransistor whose current generates a pixel signal for the pixel circuit; a shutter control stage configured to operably control an exposure of the BJT; a readout stage configured to operably read out the pixel signal; and one or more switches configured to respectively control corresponding one or more of the plurality of emitters; whereby the BJT has multiple selectable beta values by controlling the one or more switches. 2 . The pixel circuit of claim 1 , further including a storage device for storing the pixel signal. 3 . The pixel circuit of claim 1 , wherein a total number of the switches corresponds to a total number of the emitters. 4 . The pixel circuit of claim 1 , wherein a total number of the switches corresponds to a total number of the emitters minus one. 5 . The pixel circuit of claim 1 , wherein the BJT is one semiconductor device including: a substrate having a first conductivity type; a first well having the first conductivity type; a collector electrode having the first conductivity type in the first well; a second well having a first concentration of a second conductivity type; a first emitter electrode having the first conductivity type in the second well; a base electrode having the second conductivity type in the second well; a third well having a second concentration of the second conductivity type, wherein the second concentration is different from the first concentration; and a second emitter electrode having the first conductivity type in the third well. 6 . An image sensor, comprising: a plurality of pixel circuits configured to operably sense an intensity of light to generate pixel signals; and column and row selectors to select the pixel circuits to output the pixel signals as an image output signal; wherein each of the pixel circuits includes: a bipolar junction transistor (BJT) having a base, a collector, and a plurality of emitters, wherein the BJT is a phototransistor whose current generates the pixel signal for the corresponding pixel circuit; a shutter control stage configured to operably control an exposure of the BJT; a readout stage configured to operably read out the pixel signal; and one or more switches configured to respectively control corresponding one or more of the plurality of emitters; whereby the BJT has multiple selectable beta values by controlling the one or more switches. 7 . The image sensor of claim 6 , wherein each of the pixel circuits further includes a storage device for storing the pixel signal. 8 . The image sensor of claim 6 , wherein a total number of the switches corresponds to a total number of the emitters. 9 . The image sensor of claim 6 , wherein a total number of the switches corresponds to a total number of the emitters minus one. 10 . The image sensor of claim 6 , wherein the BJT is one semiconductor device including: a substrate having a first conductivity type; a first well having the first conductivity type; a collector electrode having the first conductivity type in the first well; a second well having a first concentration of a second conductivity type; a first emitter electrode having the first conductivity type in the second well; a base electrode having the second conductivity type in the second well; a third well having a second concentration of the second conductivity type, wherein the second concentration is different from the first concentration; and a second emitter electrode having the first conductivity type in the third well.
Control of the dynamic range · CPC title
SSIS architectures; Circuits associated therewith · CPC title
Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components · CPC title
Bipolar transistor image sensors · CPC title
Addressed sensors, e.g. MOS or CMOS sensors · CPC title
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