Systems and methods for quantum monte carlo processing
US-2024428112-A1 · Dec 26, 2024 · US
US2021334685A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2021334685-A1 |
| Application number | US-202016859349-A |
| Country | US |
| Kind code | A1 |
| Filing date | Apr 27, 2020 |
| Priority date | Apr 27, 2020 |
| Publication date | Oct 28, 2021 |
| Grant date | — |
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A method of evaluating an additive manufacturing process includes receiving a set of additive manufacturing parameters and an additive manufacturing part design at an analysis module, receiving a set of random values at the analysis module, determining a probability distribution of stochastic flaws within a resultant additively manufactured article using at least one multidimensional space physics model, and categorizing the additive manufacturing part design as defect free when the probability distribution is below a predefined threshold. Each value in the set of random values corresponds to a distinct variable in a set of variables. Each variable in the set of variables at least partially defines at least one of an uncontrolled additive manufacturing parameter and an uncontrollable additive manufacturing parameter.
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1 . A method of evaluating an additive manufacturing process comprising: receiving a set of additive manufacturing parameters and an additive manufacturing part design at an analysis module; receiving a set of random values at the analysis module, each value in the set of random values corresponds to a distinct variable in a set of variables, and each variable in the set of variables at least partially defines at least one of an uncontrolled additive manufacturing parameters and an uncontrollable additive manufacturing parameters; determining a probability distribution of stochastic flaws within a resultant additively manufactured article using at least one multidimensional space physics model; and categorizing the additive manufacturing part design as defect free when the probability distribution is below a predefined threshold. 2 . The method of claim 1 , wherein receiving the set of random values at the analysis module comprises generating the set of random values using a random variable module, and wherein each variable in the set of variables corresponds to a distinct one of the at least one of the uncontrolled additive manufacturing parameters and the uncontrollable additive manufacturing parameters. 3 . The method of claim 2 , wherein the uncontrolled additive manufacturing parameters and the uncontrollable additive manufacturing parameters include at least one of a local powder packing density, a hatch-contour offset, an interlayer dwell time, a powder particle size, a stripe overlap, a layer thickness, and a stripe width. 4 . The method of claim 3 , wherein the uncontrolled additive manufacturing parameters and the uncontrollable additive manufacturing parameters include each of a local powder packing density, a hatch-contour offset, an interlayer dwell time, a powder particle size, a stripe overlap, a layer thickness, and a stripe width. 5 . The method of claim 1 , wherein receiving the set of random values is reiterated at least 2000 times to determine the probability distribution of stochastic flaws. 6 . The method of claim 1 , further comprising manufacturing a part according to the additive manufacturing part design in response to the probability distribution being below the predefined threshold. 7 . The method of claim 1 , wherein the at least one multidimensional space physics model includes at least one of a model for determining a probability of stochastic unmelt, a probability of stochastic keyhole flaws, a probability of stochastic balling, a probability of stochastic overhang, and a probability of stochastic unmelt with balling. 8 . The method of claim 7 , wherein the at least one multidimensional space physics model includes all of the model for determining a probability of stochastic unmelt, the probability of stochastic keyhole flaws, the probability of stochastic balling, the probability of stochastic overhang, and the probability of stochastic unmelt with balling. 9 . The method of claim 1 , further comprising determining a correlation between at least one variable in the set of variables and the probability of the occurrence of at least one of the stochastic flaws. 10 . The method of claim 9 , wherein the step of determining the probability distribution of stochastic flaws is adapted based on the determined correlation. 11 . An additive manufacturing apparatus comprising: a chamber; a platform within the chamber; and a controller, the controller including a processor and a memory, the memory storing instructions for causing the controller to determine a probability distribution of stochastic flaws within a resultant additively manufactured article using at least one multidimensional space physics model and categorize the additive manufacturing part design as defect free when the probability distribution is below a predefined threshold in response to receiving a set of additive manufacturing parameters and an additive manufacturing part design at an analysis module stored in the controller and receiving a set of random values each value in the set of random values corresponds to a distinct variable in a set of variables, and each variable in the set of variables at least partially defines at least one of an uncontrolled additive manufacturing parameters and an uncontrollable additive manufacturing parameters. 12 . The additive manufacturing system of claim 11 , wherein receiving the set of random values includes generating the set of random values using a random variable module, and wherein each variable in the set of variables corresponds to a distinct one of the at least one of the uncontrolled additive manufacturing parameters and the uncontrollable additive manufacturing parameters. 13 . The additive manufacturing system of claim 12 , wherein the uncontrolled additive manufacturing parameters and the uncontrollable additive manufacturing parameters include at least one of a local powder packing density, a hatch-contour offset, an interlayer dwell time, a powder particle size, a stripe overlap, a layer thickness, and a stripe width. 14 . The additive manufacturing system of claim 13 , wherein the uncontrolled additive manufacturing parameters and the uncontrollable additive manufacturing parameters include each of a local powder packing density, a hatch-contour offset, an interlayer dwell time, a powder particle size, a stripe overlap, a layer thickness, and a stripe width. 15 . The additive manufacturing system of claim 11 , wherein receiving the set of random values is reiterated at least 2000 times to determine the probability distribution of stochastic flaws. 16 . The additive manufacturing system of claim 11 , wherein the controller further includes instructions for causing the additive manufacturing system to manufacture a part according to the additive manufacturing part design in response to the probability distribution being below the predefined threshold. 17 . The additive manufacturing system of claim 11 , wherein the at least one multidimensional space physics model includes at least one of a model for determining a probability of stochastic unmelt, a probability of stochastic keyhole flaws, a probability of stochastic balling, a probability of stochastic overhang, and a probability of stochastic unmelt with balling. 18 . The additive manufacturing system of claim 17 , wherein the at least one multidimensional space physics model includes all of the model for determining a probability of stochastic unmelt, the probability of stochastic keyhole flaws, the probability of stochastic balling, the probability of stochastic overhang, and the probability of stochastic unmelt with balling. 19 . The additive manufacturing system of claim 11 , further comprising determining a correlation between at least one variable in the set of variables and the probability of the occurrence of at least one of the stochastic flaws. 20 . The additive manufacturing system of claim 19 , wherein the step of determining the probability distribution of stochastic flaws is adapted based on the determined correlation.
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