Inspection method for inspecting display panel and inspection apparatus

Patent metadata

Field	Value
Publication number	US-2021333784-A1
Application number	US-201716341789-A
Country	US
Kind code	A1
Filing date	Oct 23, 2017
Priority date	Feb 23, 2017
Publication date	Oct 28, 2021
Grant date	—

Abstract

The present application provides a method for inspecting a display panel and an inspection apparatus. Wherein the method for inspecting the display panel including the following steps: setting substrate random sampling parameters in a manufacturing process by a manufacturing execution module, and transmitting the random sampling parameters to a production line control module; receiving and storing the random sampling parameters by the production line control module; generating a random sampling control signal and transmitting to a detector according to the random sampling parameters by the production line control module; and performing a random sampling to a substrate by the detector in accordance with the random sampling control signal.

First claim

What is claimed is:

1 . A method for inspecting a display panel, comprising:
setting substrate random sampling parameters in a manufacturing process by a manufacturing execution module, and transmitting the random sampling parameters to a production line control module; receiving and storing the random sampling parameters by the production line control module; generating a random sampling control signal and transmitting to a detector according to the random sampling parameters by the production line control module; and performing a random sampling to a substrate by the detector in accordance with the random sampling control signal.

2 . The method for inspecting the display panel according to claim 1 , wherein after the step of receiving and storing the random sampling parameters by the production line control module, further comprising the step of:
acquiring a product information of the substrate inspected by the detector by the production line control module.

3 . The method for inspecting the display panel according to claim 2 , wherein the step of generating the random sampling control signal and transmitting to the detector according to the random sampling parameters by the production line control module, specifically comprises:
comparing the product information with the stored random sampling parameters by the production line control module, and generates the random sampling control signal corresponding to the substrate.

4 . The method for inspecting the display panel according to claim 1 , wherein the manufacturing execution module remotely transmits the random sampling parameters to the production line control module by a wireless transmission way.

5 . The method for inspecting the display panel according to claim 1 , wherein the production line control module transmits the random sampling control signal to the detector through a control module.

6 . The method for inspecting the display panel according to claim 5 , wherein the control module is a programmable logic controller.

7 . The method for inspecting the display panel according to claim 1 , wherein the display panel is a liquid crystal display panel, an organic light emitting diode display panel, a quantum dot light emitting diodes display panel or a curved surface display panels.

8 . An inspection apparatus for a display panel, comprising:
a manufacturing execution module for setting substrate random sampling parameters in a manufacturing process, and transmitting the random sampling parameters to a production line control module; the production line control module for receiving and storing the random sampling parameters, generating a random sampling control signal and transmitting to a detector; and the detector for performing a random sampling to a substrate in accordance with the random sampling control signal.

9 . The inspection apparatus for the display panel according to claim 8 , wherein the production line control module further comprises:
an information acquisition module is for acquiring product information of the substrate detected by the detector by the production line control module.

10 . The inspection apparatus for the display panel according to claim 8 , wherein the production line control module further comprises:
an analysis comparison module is for comparing the product information with the stored random sampling parameters and generating the random sampling control signal corresponding to the substrate.

11 . The inspection apparatus for the display panel according to claim 8 , wherein the manufacturing execution module further comprises:
a wireless transmission module is for remotely transmitting the random sampling parameters to the production line control module.

12 . The inspection apparatus for the display panel according to claim 8 , wherein the production line control module further comprises:
a control module is for transmitting the random sampling control signal to the detector.

13 . The inspection apparatus for the display panel according to claim 12 , wherein the control module is a programmable logic controller.

14 . The inspection apparatus for the display panel according to claim 8 , wherein the display panel is a liquid crystal display panel, an organic light emitting diode display panel, a quantum dot light emitting diodes display panel or a curved surface display panels.

15 . An inspection apparatus for performing random sampling to a substrate of a display panel, comprising:
a manufacturing execution module for setting substrate random sampling parameters in a manufacturing process, and transmitting the random sampling parameters to a production line control module; the production line control module for receiving and storing the random sampling parameters, generating a random sampling control signal and transmitting to a detector; and the detector for performing a random sampling to a substrate in accordance with the random sampling control signal.

16 . The inspection apparatus according to claim 15 , wherein the production line control module further comprises:
an information acquisition module is for acquiring product information of the substrate detected by the detector by the production line control module.

17 . The inspection apparatus according to claim 15 , wherein the production line control module further comprises:
an analysis comparison module is for comparing the product information with the stored random sampling parameters and generating the random sampling control signal corresponding to the substrate.

18 . The inspection apparatus according to claim 15 , wherein the manufacturing execution module further comprises:
a wireless transmission module is for remotely transmitting the random sampling parameters to the production line control module.

19 . The inspection apparatus according to claim 15 , wherein the production line control module further comprises:
a control module is for transmitting the random sampling control signal to the detector.

20 . The inspection apparatus according to claim 19 , wherein the control module is a programmable logic controller.

Assignees

• Hkc Corp Ltd
• Chongqing Hkc Optoelectronics Tech Co Ltd

Inventors

• Pan Po-Sung

Classifications

• H10P72/0612

  Production flow monitoring, e.g. for increasing throughput · CPC title

• G05B19/41875 Primary

  characterised by quality surveillance of production · CPC title

• G05B2219/32225

  Randomize workpiece treatment order within lot to improve lot-to-lot comparisons · CPC title

• G05B2219/31359

  Object oriented model for fault, quality control · CPC title

• G01N21/95

  characterised by the material or shape of the object to be examined (G01N21/89 - G01N21/91, G01N21/94 take precedence) · CPC title