On-chip terahertz thin-film devices
US-2024429627-A1 · Dec 26, 2024 · US
US2021265249A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2021265249-A1 |
| Application number | US-202016797290-A |
| Country | US |
| Kind code | A1 |
| Filing date | Feb 21, 2020 |
| Priority date | Feb 21, 2020 |
| Publication date | Aug 26, 2021 |
| Grant date | — |
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Official abstract text for this publication.
A device includes: a surface mount device carrier configured to be mounted to a metal submount of a transistor package, said surface mount device carrier includes an insulating substrate includes a top surface and a bottom surface and a first pad and a second pad arranged on a top surface of said surface mount device carrier; at least one surface mount device includes a first terminal and a second terminal, said first terminal of said surface mount device mounted to said first pad and said second terminal mounted to said second pad; and at least one of the first terminal and the second terminal being configured to be isolated from the metal submount by said insulating substrate, where at least one of the first pad and the second pad are configured as wire bond pads.
Opening claim text (preview).
What is claimed is: 1 . An RF transistor package, comprising, a metal submount; a transistor die mounted to said metal submount; a surface mount device carrier mounted to said metal submount, said surface mount device carrier comprising an insulating substrate comprising a top surface and a bottom surface and a first pad and a second pad arranged on a top surface of said surface mount device carrier; at least one surface mount device comprising a first terminal and a second terminal, said first terminal of said surface mount device mounted to said first pad and said second terminal mounted to said second pad; at least one of the first terminal and the second terminal being configured to be isolated from the metal submount by said insulating substrate; and at least one wire bond bonded to the at least one of the first pad and the second pad. 2 . The RF transistor package according to claim 1 wherein the surface mount device comprises a ceramic capacitor. 3 . The RF transistor package according to claim 1 wherein: the transistor die comprises one of the following: an LDMOS transistor die and a GaN based HEMT; and the insulating substrate comprises one of the following: a printed circuit board (PCB) component, a ceramic component, a glass component, a low temperature co-fired ceramic (LTCC) component, a high temperature co-fired ceramic (HTCC) component, and a thick film substrate component. 4 . The RF transistor package according to claim 1 wherein the RF transistor package comprises a plurality of transistors. 5 . The RF transistor package according to claim 4 wherein the plurality of transistors are configured in a Doherty configuration. 6 . The RF transistor package according to claim 1 wherein the surface mount device carrier comprises a plurality of surface mount devices mounted to the top surface of said surface mount device carrier. 7 . The RF transistor package according to claim 1 wherein the insulating substrate comprises at least one of the following: a via configured to make an electrical connection between the surface mount device and the metal submount or edge plating configured to make an electrical connection between the surface mount device and the metal submount. 8 . The RF transistor package according to claim 1 wherein the at least one wire bond is configured to electrically couple the surface mount device to the transistor die. 9 . The RF transistor package according to claim 1 wherein the at least one wire bond is configured to electrically couple the surface mount device to an integrated passive device. 10 . A device, comprising: a surface mount device carrier configured to be mounted to a metal submount of a transistor package, said surface mount device carrier comprising an insulating substrate comprising a top surface and a bottom surface and a first pad and a second pad arranged on a top surface of said surface mount device carrier; at least one surface mount device comprising a first terminal and a second terminal, said first terminal of said surface mount device mounted to said first pad and said second terminal mounted to said second pad; and at least one of the first terminal and the second terminal being configured to be isolated from the metal submount by said insulating substrate, wherein at least one of the first pad and the second pad are configured as wire bond pads. 11 . The device according to claim 10 wherein the surface mount device comprises a ceramic capacitor. 12 . The device according to claim 10 wherein: the surface mount device carrier is configured to be implemented in an RF transistor package that comprises one of the following: an LDMOS transistor die and a GaN based HEMI; and the insulating substrate comprises one of the following: a printed circuit board (PCB) component, a ceramic component, a glass component, a low temperature co-fired ceramic (LTCC) component, a high temperature co-fired ceramic (HTCC) component, and a thick film substrate component. 13 . The device according to claim 10 wherein the surface mount device carrier is configured to be implemented in an RF transistor package that comprises a plurality of transistors. 14 . The device according to claim 13 wherein the plurality of transistors are configured in a Doherty configuration. 15 . The device according to claim 10 wherein the surface mount device carrier comprises a plurality of surface mount devices mounted to the top surface of said surface mount device carrier. 16 . The device according to claim 10 wherein the insulating substrate comprises at least one of the following: a via configured to make an electrical connection between the surface mount device and the metal submount or edge plating configured to make an electrical connection between the surface mount device and the metal submount. 17 . The device according to claim 10 wherein at least one wire bond is configured to electrically couple the surface mount device to a die implemented in an RF transistor package. 18 . The device according to claim 10 wherein at least one wire bond is configured to electrically couple the surface mount device to an integrated passive device. 19 . A process for implementing an RF transistor package, comprising, providing a metal submount; mounting a transistor die to said metal submount; mounting a surface mount device carrier to said metal submount, said surface mount device carrier comprising an insulating substrate comprising a top surface and a bottom surface and a first pad and a second pad arranged on a top surface of said surface mount device carrier; providing a first terminal and a second terminal on a surface mount device; mounting said first terminal of said surface mount device to said first pad and said second terminal of said surface mount device to said second pad; configuring at least one of the first terminal and the second terminal to be isolated from the metal submount by said insulating substrate; and bonding at least one wire bond to the at least one of the first pad and the second pad. 20 . The process for implementing an RF transistor package according to claim 19 wherein the surface mount device comprises a ceramic capacitor. 21 . The process for implementing an RF transistor package according to claim 19 further comprising configuring the insulating substrate as one of the following: a printed circuit board (PCB) component, a ceramic component, a glass component, a low temperature co-fired ceramic (LTCC) component, a high temperature co-fired ceramic (HTCC) component, and a thick film substrate component, wherein the transistor die comprises one of the following: an LDMOS transistor die and a GaN based HEMT. 22 . The process for implementing an RF transistor package according to claim 19 further comprising implementing a plurality of transistors. 23 . The process for implementing an RF transistor package according to claim 22 further comprising implementing the plurality of transistors in a Doherty configuration. 24 . The process for implementing an RF transistor package according to claim 19 further comprising: implementing the surface mount device carrier with a plurality of surface mount devices; and mounting the plurality of surface mount devices to the top surface of said surface mount device carrier. 25 . The process for implementing an RF transistor package according to claim 19
for HF amplifiers · CPC title
Wires · CPC title
at high-frequency [HF] or radio frequency [RF] · CPC title
comprising gold [Au] · CPC title
Die-attach connectors and bond wires · CPC title
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