Method for Producing Tungsten Hexafluoride

US2021253442A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2021253442-A1
Application numberUS-201917268848-A
CountryUS
Kind codeA1
Filing dateJul 12, 2019
Priority dateAug 17, 2018
Publication dateAug 19, 2021
Grant date

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Abstract

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A production method of tungsten hexafluoride according to one embodiment of the present invention includes: a first step of bringing tungsten having an oxide film into contact with a fluorine gas or inert gas containing 50 vol ppm to 50 vol % of hydrogen fluoride in a reactor, thereby removing the oxide film from the tungsten; and a second step of bringing the tungsten from which the oxide film has been removed by the first step into contact with a fluorine-containing gas to form tungsten hexafluoride.

First claim

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1 .- 6 . (canceled) 7 . A production method of tungsten hexafluoride, comprising: a first step of bringing tungsten having an oxide film into contact with a hydrogen fluoride-containing gasin a reactor, thereby removing the oxide film from the tungsten, wherein the hydrogen fluoride-containing gas is either a fluorine gas containing 50 vol ppm to 50 vol % of hydrogen fluoride or an inert gas containing 50 vol ppm to 50 vol % of hydrogen fluoride; and a second step of bringing the tungsten from which the oxide film has been removed by the first step into contact with a fluorine-containing gas to form tungsten hexafluoride. 8 . The production method of tungsten hexafluoride according to claim 7 , wherein, in the first step, the tungsten having the oxide film is brought into contact with the hydrogen fluoride-containing gas at a temperature ranging from 25° C. to 200° C. 9 . The production method of tungsten hexafluoride according to claim 7 , wherein the fluorine-containing gas used in the second step is a fluorine gas, a nitrogen trifluoride gas or a mixed gas thereof. 10 . The production method of tungsten hexafluoride according to claim 7 , wherein, in the second step, the tungsten from which the oxide film has been removed is brought into contact with the fluorine-containing gas at a temperature ranging from 25° C. to 200° C. 11 . An oxide film removing method for tungsten, comprising bringing tungsten having an oxide film into contact with a hydrogen fluoride-containing gas, wherein the hydrogen fluoride-containing gas is either a fluorine gas containing 50 vol ppm to 50 vol % of hydrogen fluoride or an inert gas containing 50 vol ppm to 50 vol % of hydrogen fluoride. 12 . The oxide film removing method for tungsten according to claim 11 , wherein the tungsten having the oxide film is brought into contact with the hydrogen fluoride-containing gas at a temperature ranging from 25° C. to 200° C. 13 . The production method of tungsten hexafluoride according to claim 8 , wherein, in the first step, the tungsten having the oxide film is brought into contact with the hydrogen fluoride-containing gas at a temperature ranging from 40° C. to 150° C. 14 . The production method of tungsten hexafluoride according to claim 7 , wherein the concentration of the hydrogen fluoride in the hydrogen fluoride-containing gas is 100 vol ppm to 1 vol %. 15 . The production method of tungsten hexafluoride according to claim 10 , wherein, in the second step, the tungsten from which the oxide film has been removed is brought into contact with the fluorine-containing gas at a temperature ranging from 40° C. to 150° C. 16 . The oxide film removing method for tungsten according to claim 12 , wherein the tungsten having the oxide film is brought into contact with the hydrogen fluoride-containing gas at a temperature ranging from 40° C. to 150° C. 17 . The oxide film removing method for tungsten according to claim 11 , wherein the concentration of the hydrogen fluoride in the hydrogen fluoride-containing gas is 100 vol ppm to 1 vol %.

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What does patent US2021253442A1 cover?
A production method of tungsten hexafluoride according to one embodiment of the present invention includes: a first step of bringing tungsten having an oxide film into contact with a fluorine gas or inert gas containing 50 vol ppm to 50 vol % of hydrogen fluoride in a reactor, thereby removing the oxide film from the tungsten; and a second step of bringing the tungsten from which the oxide film…
Who is the assignee on this patent?
Central Glass Co Ltd
What technology area does this patent fall under?
Primary CPC classification C01G41/04. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu Aug 19 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).