Process for producing and using a w-ni sputtering target

US2021246544A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2021246544-A1
Application numberUS-202117235003-A
CountryUS
Kind codeA1
Filing dateApr 20, 2021
Priority dateDec 20, 2013
Publication dateAug 12, 2021
Grant date

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Abstract

Official abstract text for this publication.

A process for producing a W—Ni sputtering target includes providing the sputtering target with 45 to 75 wt % W and a remainder of Ni and common impurities. The sputtering target contains a Ni(W) phase, a W phase and no or less than 10% by area on average of intermetallic phases measured at a target material cross section.

First claim

Opening claim text (preview).

1 . A process of using a sputtering target, the process comprising the following steps: using a sputtering target having from 45 to 75% by weight of W, a balance of Ni and normal impurities, a Ni(W) phase, a W phase and no or less than 10% by area on average of intermetallic phases measured at a target material cross section, for deposition of an electrochromic layer. 2 . The process for producing a W—Ni sputtering target according to claim 1 , which further comprises producing the sputtering target by at least compacting a powder mixture of W powder and Ni powder by application of pressure, heat or pressure and heat to provide a resulting blank, and cooling the resulting blank at a cooling rate of greater than 30 K/min at least in a temperature range of from 900 to 750° C. 3 . A process of using of a sputtering target, the process comprising the following steps: using a sputtering target having from 45 to 75% by weight of W, a balance of Ni and normal impurities, a Ni(W) phase, a W phase and no or less than 10% by area on average of intermetallic phases measured at a target material cross section, for deposition of solar absorber layers, protective layers against high-temperature oxidation or diffusion barrier layers. 4 . The process for producing a W—Ni sputtering target according to claim 3 , which further comprises producing the sputtering target by at least compacting a powder mixture of W powder and Ni powder by application of pressure, heat or pressure and heat to provide a resulting blank, and cooling the resulting blank at a cooling rate of greater than 30 K/min at least in a temperature range of from 900 to 750° C. 5 . A process for producing a W—Ni sputtering target using a powder-metallurgical route, the method comprising the following steps: carrying out a compacting step in which a powder mixture of W powder and Ni powder is compacted by application of pressure, heat or pressure and heat to give a resulting blank; and carrying out a cooling step in which the resulting blank is cooled at a cooling rate of greater than 30 K/min at least in a temperature range of from 900 to 750° C. 6 . The process for producing a W—Ni sputtering target according to claim 5 , which further comprises effecting the compacting step by sintering at temperatures of from 1100 to 1450° C. 7 . The process for producing a W—Ni sputtering target according to claim 5 , which further comprises performing a thermomechanical or thermal treatment of the blank between the compacting step and the cooling step. 8 . The process for producing a W—Ni sputtering target according to claim 7 , which further comprises performing the thermomechanical or thermal treatment at temperatures in a range of from 970 to 1450° C. 9 . The process for producing a W—Ni sputtering target according to claim 7 , wherein the thermomechanical or thermal treatment includes at least one forging step.

Assignees

Inventors

Classifications

  • Plural materials · CPC title

  • Processes characterised by the sequence of their steps · CPC title

  • Controlled cooling · CPC title

  • Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy · CPC title

  • based on nickel · CPC title

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What does patent US2021246544A1 cover?
A process for producing a W—Ni sputtering target includes providing the sputtering target with 45 to 75 wt % W and a remainder of Ni and common impurities. The sputtering target contains a Ni(W) phase, a W phase and no or less than 10% by area on average of intermetallic phases measured at a target material cross section.
Who is the assignee on this patent?
Plansee Se
What technology area does this patent fall under?
Primary CPC classification C23C14/3414. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu Aug 12 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).