Methods and Systems for Coherent Imaging and Feedback Control for Modification of Materials
US-2015375336-A9 · Dec 31, 2015 · US
US2021146617A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2021146617-A1 |
| Application number | US-201916689316-A |
| Country | US |
| Kind code | A1 |
| Filing date | Nov 20, 2019 |
| Priority date | Nov 20, 2019 |
| Publication date | May 20, 2021 |
| Grant date | — |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Methods of determining at least one parameter of an irradiation device of an apparatus for additively manufacturing three-dimensional objects may include generating an energy beam and guiding the energy beam across a structured test surface, generating a signal by detecting radiation that is emitted from the test surface, and determining the at least one parameter based on a frequency spectrum of the signal.
Opening claim text (preview).
What is claimed is: 1 . A method of determining at least one parameter, in particular an irradiation parameter, of an irradiation device of an apparatus for additively manufacturing three-dimensional objects by means of successive layerwise selective irradiation and consolidation of layers of a build material which can be consolidated by means of an energy beam, the method comprising: generating an energy beam and guiding the energy beam across a structured test surface; generating a signal by detecting radiation that is emitted, in particular reflected, from the test surface; and determining the at least one parameter based on a frequency spectrum of the signal, in particular based on a Fourier transformation of the signal. 2 . The method of claim 1 , wherein the parameter is or relates to a focus position of the energy beam, in particular a z-position of the energy beam, and/or a caustic of the energy beam for at least one position relative to a build plane. 3 . The method of claim 1 , wherein the focus position is determined based on a frequency spectrum of a time trace of the signal and/or the beam width is determined based on a frequency spectrum of a two-dimensional distribution of the signal, in particular a raster scan of the energy beam. 4 . The method of claim 1 , wherein for determining a minimum beam width the focus position is changed until a maximum bandwidth of the transformed signal is found. 5 . The method of claim 1 , wherein the determination is performed for at least two positions relative to a build plane, in particular two different positions in a build plane. 6 . The method of claim 5 , wherein the determination is performed in at least one part of a build plane in which at least one part of an object, in particular a critical part, is to be built in an additive manufacturing process. 7 . The method of claim 1 , wherein the determination is performed during an additive manufacturing process, wherein a surface of the object and/or a surface of build material is used as test surface. 8 . The method of claim 1 , wherein the test surface is periodically or aperiodically structured, in particular resembling a periodic structure or a random structure, particularly white noise. 9 . The method of claim 1 , wherein a length scale of changes of the structure of the test surface, in particular a change in reflectivity, of the test surface is below a beam width of the energy beam. 10 . The method of claim 1 , wherein a length scale of a beam guiding unit is calibrated based on a spectral distance of two peaks of the frequency spectrum of the signal. 11 . The method of claim 1 , wherein the test surface is sand blasted and/or micro structured, in particular structured via the or an energy beam. 12 . The method of claim 1 , wherein the test surface is a glass surface and/or a metal surface and/or a powder surface. 13 . The method of claim 1 , wherein the energy beam is scanned along a path, in particular a circle or a random path, for generating the signal. 14 . A determination device for determining at least one parameter, in particular an irradiation parameter, of an irradiation device of an apparatus for additively manufacturing three-dimensional objects by means of successive layerwise selective irradiation and consolidation of layers of a build material which can be consolidated by means of an energy beam, wherein the determination device is adapted to: generate an energy beam and guide the energy beam across a structured test surface; generate a signal by detecting radiation that is emitted, in particular reflected or scattered, from the test surface; and determine the at least one parameter based on the frequency spectrum of the signal, in particular based on a Fourier transformation of the signal. 15 . The determination device of claim 14 , wherein the parameter is or relates to a focus position of the energy beam, in particular a z-position of the energy beam, and/or a caustic of the energy beam for at least one position relative to a build plane. 16 . The determination device of claim 14 , wherein the determination device is configured to determine the focus position based on a frequency spectrum of a time trace of the signal; and/or wherein the determination device is configured to determine the beam width based on a frequency spectrum of a two-dimensional distribution of the signal, in particular a raster scan of the energy beam. 17 . The determination device of claim 14 , wherein for determining a minimum beam width, the determination device is configured to change the focus position until a maximum bandwidth of the transformed signal is found. 18 . The determination device of claim 14 , wherein the determination device is configured to perform the determination for at least two positions relative to a build plane, in particular two different positions in a build plane. 19 . The determination device of claim 18 , wherein the determination device is configured to perform the determination in at least one part of a build plane in which at least one part of an object, in particular a critical part, is to be built in an additive manufacturing process. 20 . An apparatus for additively manufacturing three-dimensional objects by means of successive layerwise selective irradiation and consolidation of layers of a build material which can be consolidated by means of an energy beam, the apparatus comprising the determination device according to claim 14 .
Observing, e.g. monitoring, the workpiece · CPC title
Processes of additive manufacturing · CPC title
Means for process control, e.g. cameras or sensors · CPC title
Data acquisition or data processing · CPC title
Scanning parameters, e.g. hatch distance or scanning strategy · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.