System and method for test and/or calibration of multi-channel rf communication devices

US2021136867A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2021136867-A1
Application numberUS-202117145768-A
CountryUS
Kind codeA1
Filing dateJan 11, 2021
Priority dateOct 20, 2014
Publication dateMay 6, 2021
Grant date

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Abstract

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A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

First claim

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1 . A test system, comprising: a test signal generator, comprising: a single channel signal source configured to output a single channel signal, and a phase shift network configured to receive the single channel signal and in response thereto to output a plurality of RF test signals in parallel with each other, wherein the phase shift network is further configured to shift a phase of one or more of the RF test signals so as to make at least a selected one of the RF test signals orthogonal to the other RF test signals; a combiner network having a plurality of inputs each configured to receive one of a plurality of receive signals, each receive signal being produced from a corresponding one of a plurality of RF receivers of a device under test (DUT) in response to the RF test signals, wherein the combiner is configured to combine the plurality of receive signals and to output a combined output signal; and a single channel measurement instrument configured to receive the combined output signal and to measure therefrom at least one characteristic of each of the RF receivers. 2 . The test system of claim 1 , further comprising an optical-to-electrical converter connected between outputs of each of the plurality of RF receivers of the DUT and the inputs of the combiner network. 3 . The test system of claim 1 , wherein the phase shift network is an active phase shift network. 4 . The test system of claim 3 , wherein the single-channel signal source and the phase shift network are configured to output the plurality of RF test signals in parallel with each other. 5 . The test system of claim 4 , at least one of the RF test signals is orthogonal to the other RF test signals at a given time. 6 . The test system of claim 3 , wherein the active phase shift network comprises an active device adapted to shift the phase for all the RF test signals independently to create at least some orthogonality among RF test signals 425 . 7 . The test system of claim 1 , wherein the single channel signal is an RF signal which carries baseband data. 8 . The test system of claim 7 , wherein characteristics of the baseband data match those required for reception by the plurality of RF receivers. 9 . The test system of claim 1 , wherein the phase shift network is further configured to shift the phase of one or more of the RF test signals to make all of the RF test signals orthogonal to each other. 10 . A test system, comprising: a test signal generator, comprising: a single channel signal source, comprising a processor and a memory, which stores instructions, which when executed by the processor cause the processor to: generate a plurality of RF test signals in parallel with each other, wherein at least one of the RF test signals is orthogonal to the other RF test signals at a given time; apply each of the plurality of RF test signals to a corresponding one of the plurality of RF receivers of the DUT; combine a plurality of receive signals each produced from one of the plurality of RF receivers of the DUT in response to the corresponding one of the plurality of RF test signals, to output a combined output signal; provide the combined output signal to a test instrument; and employ the test instrument to independently measure at least one characteristic of each of the RF receivers from the combined output signal. 11 . The test system of claim 10 , wherein a transmitter of the DUT generates the plurality of RF test signals in parallel with each other. 12 . The test system of claim 11 , wherein the transmitter outputs the plurality of RF test signals which are orthogonal to each other. 13 . The test system of claim 11 , wherein the instructions, which when executed by the processor to generate the plurality of RF test signals in parallel with each other further, further causes the processor to: output a single channel signal from a single channel source; and output from the phase shift network the plurality of RF test signals in parallel with each other in response to the single channel signal. 14 . The test system of claim 13 , wherein the instructions, which when executed by the processor, further cause the phase shift network to shift a phase of one or more of the RF test signals so as to make at least one of the RF test signals orthogonal to the other RF test signals. 15 . The test system of claim 14 , wherein the instructions, which when executed by the processor, further cause the phase shift network to sequentially shift the phase of each of the RF test signals so as to sequentially make each of the RF test signals orthogonal to the other RF test signals. 16 . A method of testing a device under test (DUT) including a plurality of RF receivers, the method comprising: generating a plurality of RF test signals in parallel with each other, wherein at least one of the RF test signals is orthogonal to the other RF test signals at a given time; applying each of the plurality of RF test signals to a corresponding one of the plurality of RF receivers of the DUT; combining a plurality of receive signals each produced from one of the plurality of RF receivers of the DUT in response to the corresponding one of the plurality of RF test signals, to output a combined output signal; and providing the combined output signal to a test instrument; and employing the test instrument to independently measure at least one characteristic of each of the RF receivers from the combined output signal. 17 . The method of claim 16 , wherein a transmitter of the DUT generates the plurality of RF test signals in parallel with each other. 18 . The method of claim 17 , wherein the transmitter outputs the plurality of RF test signals which are orthogonal to each other. 19 . The method of claim 17 , wherein generating the plurality of RF test signals in parallel with each other further comprises: a single channel signal source outputting a single channel signal; and a phase shift network outputting the plurality of RF test signals in parallel with each other in response to the single channel signal, including shifting a phase of one or more of the RF test signals so as to make at least one of the RF test signals orthogonal to the other RF test signals. 20 . The method of claim 19 , further comprising sequentially shifting the phase of each of the RF test signals so as to sequentially make each of the RF test signals orthogonal to the other RF test signals.

Assignees

Inventors

Classifications

  • using simultaneous multiple data streams, e.g. cooperative multipoint [CoMP], carrier aggregation [CA] or multiple input multiple output [MIMO] (allocation of physical resources in CoMP or in CA H04L5/0035) · CPC title

  • H04W24/06Primary

    Testing, {supervising or monitoring} using simulated traffic · CPC title

  • Setup of multiple wireless link connections · CPC title

  • Terminal devices · CPC title

  • H04W88/06Primary

    adapted for operation in multiple networks {or having at least two operational modes}, e.g. multi-mode terminals · CPC title

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What does patent US2021136867A1 cover?
A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF si…
Who is the assignee on this patent?
Keysight Technologies Inc
What technology area does this patent fall under?
Primary CPC classification H04W24/06. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu May 06 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).