Sunshine recorder and sunshine measurement method
US-2024319005-A1 · Sep 26, 2024 · US
US2021127076A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2021127076-A1 |
| Application number | US-202016740294-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jan 10, 2020 |
| Priority date | Feb 1, 2019 |
| Publication date | Apr 29, 2021 |
| Grant date | — |
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Disclosed herein is an illumination state monitoring apparatus, the illumination state monitoring apparatus, including a dual band pass filter having a first pass band in the visible wavelength area and having a second pass band in the infrared wavelength area, an optical sensor detecting light having passed through the dual band pass filter through a three primary color pixel and an infrared pixel, and a processor deducting an intensity value of a signal detected by the infrared pixel from an intensity value of a signal detected by the three primary color pixel, calculating an illuminance parameter, and determining an illumination state on the basis of the illuminance parameter, wherein sensitivity of the three primary color pixel toward light having passed through the second pass band and sensitivity of the infrared pixel toward light having passed through the second pass band are within a predetermined range.
Opening claim text (preview).
What is claimed is: 1 . An illumination state monitoring apparatus, comprising: a dual band pass filter having a first pass band in the visible wavelength area and having a second pass band in the infrared wavelength area; an optical sensor detecting light having passed through the dual band pass filter through a three primary color pixel and an infrared pixel; and a processor deducting an intensity value of a signal detected by the infrared pixel from an intensity value of a signal detected by the three primary color pixel, calculating an illuminance parameter, and determining an illumination state on the basis of the illuminance parameter, and wherein sensitivity of the three primary color pixel toward light having passed through the second pass band and sensitivity of the infrared pixel toward light having passed through the second pass band are within a predetermined range. 2 . The illumination state monitoring apparatus of claim 1 , wherein the first pass band is formed within a range of 380 nm to 700 nm, and the second pass band is formed within a range of 850 nm to 1100 nm. 3 . The illumination state monitoring apparatus of claim 1 , wherein sensitivity of the infrared pixel toward light having passed through the first pass band is less than predetermined sensitivity. 4 . The illumination state monitoring apparatus of claim 1 , wherein the optical sensor includes a plurality of unit pixels including the three primary color pixel and the infrared pixel. 5 . The illumination state monitoring apparatus of claim 4 , wherein the three primary color pixel includes an R pixel, a G pixel, and a B pixel respectively detecting three primary colors of light. 6 . The illumination state monitoring apparatus of claim 1 , wherein the processor calculates a brightness value on the basis of an average value of signals detected by the three primary color pixel, deducts an intensity value of a signal detected by the infrared pixel from the calculate brightness value, and calculates the illuminance parameter. 7 . The illumination state monitoring apparatus of claim 6 , wherein the processor calculates a brightness value on the basis of an average value of signals detected respectively by an R pixel, a G pixel, and a B pixel included in the three primary color pixel. 8 . The illumination state monitoring apparatus of claim 7 , wherein the processor deducts an average value of signals detected by the infrared pixel from the calculated brightness value, and calculates the illuminance parameter. 9 . The illumination state monitoring apparatus of claim 1 , wherein the processor deducts an average value of signals detected by the infrared pixel from an average value of signals detected by the three primary color pixel, and calculates the illuminance parameter. 10 . The illumination state monitoring apparatus of claim 1 , wherein, when the illuminance parameter is greater than a reference value, the processor determines the illumination state is a day state, and wherein, when the illuminance parameter is less than the reference value, the processor determines the illumination state is a night state. 11 . The illumination state monitoring apparatus of claim 1 , wherein the processor generates at least one of a visible image and an infrared image using light detected by the optical sensor, and the processor further includes a display module that outputs at least one of the visible image and the infrared image. 12 . The illumination state monitoring apparatus of claim 11 , wherein, when determining the illumination state is a day state, the processor generates the visible image, and, when determining the illumination state is a night state, the processor generates the infrared image. 13 . The illumination state monitoring apparatus of claim 1 , wherein the illumination state monitoring apparatus further includes IR lighting that outputs infrared light, and the optical sensor detects infrared light output by the IR lighting and reflected from an obstacle. 14 . The illumination state monitoring apparatus of claim 13 , wherein the processor controls an output from the IR lighting according to the illumination state.
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