Mitigation of charging on optical windows

Patent metadata

Field	Value
Publication number	US-2021013021-A1
Application number	US-202016909669-A
Country	US
Kind code	A1
Filing date	Jun 23, 2020
Priority date	Jul 8, 2019
Publication date	Jan 14, 2021
Grant date	—

Abstract

Aspects of the present disclosure describe techniques for mitigating charging on optical windows. For example, a device for mitigating charges inside a chamber of a trapped ion system is described that includes an array of parallel wires formed from a single, conductive plate by cutting elongated gaps through an entire thickness of the conductive plate that separate the wires, an outer portion of the conductive plate to which the wires are attached is configured to position the wires to run parallel to one or more trapped ions in the chamber and to position the wires between a dielectric component of the chamber and the one or more trapped ions. A chamber with such an array of parallel wires and a method of using such an array of parallel wires are also described.

First claim

What is claimed is:

1 . A device for mitigating charges inside a chamber of a trapped ion system, comprising:
an array of parallel wires formed from a single, conductive plate by cutting elongated gaps through an entire thickness of the conductive plate that separate the wires, an outer portion of the conductive plate to which the wires are attached is configured to position the wires to run parallel to one or more trapped ions in the chamber and to position the wires between a dielectric component of the chamber and the one or more trapped ions.

2 . The device of claim 1 , wherein a width of each of the wires is the same and a width of each of the elongated gaps between the wires is the same.

3 . The device of claim 1 , wherein the conductive plate is a square plate.

4 . The device of claim 1 , wherein the conductive plate is a metal plate.

5 . The device of claim 1 , wherein the conductive plate is approximately 20 millimeters by 20 millimeters.

6 . The device of claim 1 , wherein a width of each of the wires is approximately 50 microns.

7 . The device of claim 1 , wherein a width of each of the elongated gaps is approximately 460 microns.

8 . The device of claim 1 , wherein a number of the wires is approximately 20 wires.

9 . The device of claim 1 , wherein both ends of each elongated gap is a rounded end.

10 . The device of claim 1 , wherein the outer portion of the conductive plate includes one or more fastening structures with which to attach the device inside the chamber to properly position the wires.

11 . A chamber of a trapped ion system, comprising:
a dielectric component; a trap; and an array of parallel wires formed from a single, conductive plate by cutting elongated gaps through an entire thickness of the conductive plate that separate the wires, an outer portion of the conductive plate to which the wires are attached is configured to position the wires to run parallel to one or more trapped ions in the trap and to position the wires between the dielectric component and the trap.

12 . The chamber of claim 11 , wherein the dielectric component is an optical port configured for imaging operations of the one or more ions in the trap.

13 . The chamber of claim 11 , wherein the dielectric component is an optical port configured for transmission of one or more laser beams to control operations of the one or more ions in the trap.

14 . The chamber of claim 11 , wherein a width of each of the wires is the same and a width of each of the elongated gaps between the wires is the same.

15 . The chamber of claim 11 , wherein the conductive plate is a metal plate.

16 . The chamber of claim 11 , wherein the conductive plate is approximately 20 millimeters by 20 millimeters.

17 . The chamber of claim 11 , wherein a width of each of the wires is approximately 50 microns.

18 . The chamber of claim 11 , wherein a width of each of the elongated gaps is approximately 460 microns.

19 . The chamber of claim 11 , wherein the trapped ion system is a quantum information processing system.

20 . A method for mitigating charges inside a chamber of a trapped ion system, comprising:
providing inside the chamber, between a dielectric component of the chamber and a trap, an array of parallel wires formed from a single, conductive plate by cutting elongated gaps through an entire thickness of the conductive plate that separate the wires, an outer portion of the conductive plate to which the wires are attached is configured to position the wires to run parallel to one or more trapped ions in the trap and to position the wires between the dielectric component and the trap; and performing one or more quantum operations in the trapped ion system with the array of parallel wires between the dielectric component and the one or more trapped ions in the trap.

21 . The method of claim 20 , wherein the dielectric component is an optical port.

Assignees

• Ionq Inc

Inventors

• Mizrahi Jonathan Albert
• Wright Kenneth
• Amini Jason Madjdi

Classifications

• H01J49/422 Primary

  Two-dimensional RF ion traps (ion guides without mass selection H01J49/062) · CPC title

• G06N10/00

  Quantum computing, i.e. information processing based on quantum-mechanical phenomena · CPC title