Collection device control method, collection device, and spatial system
US-2024369377-A1 · Nov 7, 2024 · US
US2020398317A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2020398317-A1 |
| Application number | US-201916444346-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jun 18, 2019 |
| Priority date | Jun 18, 2019 |
| Publication date | Dec 24, 2020 |
| Grant date | — |
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In examples, systems and methods for using skewed waveforms to eject debris using electromagnetic propulsion are disclosed. The systems and methods include a first electronic device having a surface. The systems and methods also include a signal generator configured to generate a skewed signal configured to cause a movement of particles on the surface of the first electronic device. Additionally, the systems and methods include an antenna coupled to the signal generator, where the antenna is configured to receive the skewed signal from the signal generator and radiate the skewed signal as electromagnetic energy proximate to the surface of the first electronic device.
Opening claim text (preview).
1 .- 8 . (canceled) 9 . A method for clearing particles from a surface of an electronic device, the method comprising: generating a skewed signal configured to cause a movement in the particles, wherein the skewed signal is generated by a superposition of sinusoids; feeding the skewed signal to an antenna; and radiating, from the antenna, the skewed signal in a direction of the surface such that the skewed signal moves the particles from the surface. 10 . The method of claim 9 , wherein said generating the skewed signal is based on a size of the particles. 11 . The method of claim 9 , wherein said radiating is based on a radiation pattern of the antenna that minimizes energy radiated into the surface. 12 . The method of claim 9 , further comprising using a laser to loosen the particles on the surface. 13 . The method of claim 9 , further comprising using a laser to ionize the particles on the surface. 14 . The method of claim 9 , further comprising selectively operating a laser in one of two modes, wherein a first mode comprises loosening the particles on the surface and a second mode comprises ionizing the particles on the surface. 15 . The method of claim 9 , further comprising using a collection unit to electrostatically trap the particles. 16 . The method of claim 9 , wherein said radiating is performed in the direction of the surface that is approximately parallel to a plane of the surface. 17 . A method for clearing particles from a surface of an electronic device, the method comprising: determining a size of the particles; generating a skewed signal configured to cause a movement in the particles based, at least in part, on the determined size; feeding the skewed signal to an antenna; and radiating, from the antenna, the skewed signal in a direction of the surface. 18 . The method of claim 17 , further comprising selectively operating a laser in one of two modes, wherein a first mode comprises loosening the particles on the surface and a second mode comprises ionizing the particles on the surface. 19 . The method of claim 17 , further comprising using a collection unit to electrostatically trap the particles. 20 . The method of claim 17 , wherein said radiating is performed in the direction of the surface that is approximately parallel to a plane of the surface. 21 . The method of claim 17 , further comprising using a laser to loosen the particles on the surface. 22 . The method of claim 17 , further comprising using a laser to ionize the particles on the surface. 23 . A method for clearing particles from a surface of an electronic device, the method comprising: using a laser to loosen the particles on the surface; generating a skewed signal configured to cause a movement in the particles; feeding the skewed signal to an antenna; and radiating, from the antenna, the skewed signal in a direction of the surface. 24 . The method of claim 23 , further comprising using the laser to ionize the particles on the surface. 25 . The method of claim 23 , further comprising selectively operating the laser in one of two modes, wherein a first mode comprises loosening the particles on the surface and a second mode comprises ionizing the particles on the surface. 26 . The method of claim 23 , further comprising using a collection unit to electrostatically trap the particles. 27 . The method of claim 23 , wherein said radiating is performed in the direction of the surface that is approximately parallel to a plane of the surface. 28 . The method of claim 23 , wherein the electronic device comprises a sensor or a solar panel, and wherein said radiating comprises radiating the skewed signal in the direction of the sensor or the solar panel.
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