US2020371237A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2020371237-A1 |
| Application number | US-201816636148-A |
| Country | US |
| Kind code | A1 |
| Filing date | Aug 28, 2018 |
| Priority date | Aug 28, 2017 |
| Publication date | Nov 26, 2020 |
| Grant date | — |
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A detector for determining a position of at least one object is provided. The detector includes an evaluation device adapted to select at least one reflection feature of a reflection image, wherein the evaluation device is configured for determining at least one longitudinal region of the selected reflection feature of the reflection image by evaluating a combined signal Q from the sensor signals, wherein the evaluation device is adapted to determine at least one displacement region in at least one reference image corresponding to the longitudinal region, wherein the evaluation device is adapted to match the selected reflection feature with at least one reference feature within the displacement region.
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1 - 26 . (canceled) 27 . A detector for determining a position of at least one object, the detector comprising at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein each optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object to the detector, wherein the sensor element is adapted to determine at least one reflection image; and at least one evaluation device, wherein the evaluation device is adapted to select at least one reflection feature of the reflection image, wherein the evaluation device is configured for determining at least one longitudinal region of the selected reflection feature of the reflection image by evaluating a combined signal Q from the sensor signals, wherein the evaluation device is adapted to determine at least one displacement region in at least one reference image corresponding to the longitudinal region, wherein the evaluation device is adapted to match the selected reflection feature with at least one reference feature within the displacement region. 28 . The detector according to claim 27 , wherein the evaluation device is adapted to determine a displacement of the matched reference feature and the selected reflection feature, wherein the evaluation device is adapted to determine a longitudinal information of the matched feature using a predetermined relationship between a longitudinal coordinate and the displacement. 29 . The detector according to claim 27 , wherein the evaluation device is configured for deriving the combined signal Q by one or more of dividing the sensor signals, dividing multiples of the sensor signals, dividing linear combinations of the sensor signals. 30 . The detector according to claim 27 , wherein the evaluation device is configured for using at least one predetermined relationship between the combined signal Q and the longitudinal region for determining the longitudinal region. 31 . The detector according to claim 27 , wherein the evaluation device is adapted to determine at least one longitudinal coordinate z of the selected reflection feature by evaluating the combined signal Q, wherein the longitudinal region ( 130 ) is given by the longitudinal coordinate z and an error interval ±ε. 32 . The detector according to claim 27 , wherein the reference image and the reflection image are images of the object determined at different spatial positions having a fixed distance, wherein the evaluation device is adapted to determine an epipolar line in the reference image. 33 . The detector according claim 31 , wherein the displacement region extends along the epipolar line, wherein the evaluation device is adapted to determine the reference feature along the epipolar line corresponding to the longitudinal coordinate z and to determine an extent of the displacement region along the epipolar line corresponding to the error interval ±ε. 34 . The detector according to claim 33 , wherein the evaluation device is configured to perform the following steps: determining the displacement region for the image position of each reflection feature; assigning an epipolar line to the displacement region of each reflection feature such as by assigning the epipolar line closest to a displacement region and/or within a displacement region and/or closest to a displacement region along a direction orthogonal to the epipolar line; assigning and/or determining at least one reference feature to each reflection feature such as by assigning the reference feature closest to the assigned displacement region and/or within the assigned displacement region and/or closest to the assigned displacement region along the assigned epipolar line and/or within the assigned displacement region along the assigned epipolar line. 35 . The detector according to claim 27 , wherein the evaluation device is adapted to match the selected feature of the reflection image with the reference feature within the displacement region by using at least one evaluation algorithm considering the determined longitudinal coordinate z, wherein the evaluation algorithm is a linear scaling algorithm. 36 . The detector according to claim 27 , wherein the evaluation device is configured for deriving the combined signal Q by Q ( z O ) = ∫ ∫ A 1 E ( x , y ; z O ) dxdy ∫ ∫ A 2 E ( x , y ; z O ) dxdy wherein x and y are transversal coordinates, A1 and A2 are different areas of at least one beam profile of the reflection light beam at the sensor position, and E(x,y,zo) denotes the beam profile given at the object distance z 0 , wherein each of the sensor signals comprises at least one information of at least one area of the beam profile of the reflection light beam. 37 . The detector according to claim 36 , wherein the light-sensitive areas are arranged such that a first sensor signal comprises information of a first area of the beam profiles and a second sensor signal comprises information of a second area of the beam profile, wherein the first area of the beam profile and the second area of the beam profile are one or both of adjacent or overlapping regions. 38 . The detector according to claim 37 , wherein the evaluation device is configured to determine the first area of the beam profile and the second area of the beam profile, wherein the first area of the beam profile comprises essentially edge information of the beam profile and the second area of the beam profile comprises essentially center information of the beam profile, wherein the edge information comprises information relating to a num
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