Fe-Pt Based Magnetic Material Sintered Compact

US2020357433A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2020357433-A1
Application numberUS-202016933071-A
CountryUS
Kind codeA1
Filing dateJul 20, 2020
Priority dateSep 21, 2012
Publication dateNov 12, 2020
Grant date

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Abstract

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Provided is an Fe—Pt based magnetic material sintered compact, comprising BN and SiO 2 as non-magnetic materials, wherein Si and O are present in a region where B or N is present at a cut surface of the sintered compact. A high density sputtering target is provided which enables production of a magnetic thin film for heat-assisted magnetic recording media, and also reduces the amount of particles generated during sputtering.

First claim

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I claim: 1 . A Fe—Pt based magnetic material sintered compact, consisting of iron, platinum and 0.5 mol % or more and 10.0 mol % or less of one or more elements selected from the group consisting of B, Ru, Ag, Au and Cu forming a sintered alloy and particles of hexagonal BN and SiO 2 dispersed in the sintered alloy, wherein, in an element mapping image obtained by a Field Emission Electron Probe Micro Analyzer (FE-EPMA) of a cross-sectional surface of the sintered compact, elements of Si and O are detected in the same area as that where elements of B and N are detected, and wherein, in X-ray diffraction analysis of a cross-sectional surface of the sintered compact which is parallel to a pressurized face of the sintered compact, an X-ray diffraction peak from (002) plane of hexagonal BN is present, and an X-ray diffraction peak from (101) plane of cristobalite as an intensity ratio of 1.40 or less to a back-ground intensity of the (101) X-ray diffraction peak. 2 . The Fe—Pt based magnetic material sintered compact according to claim 1 , wherein the X-ray diffraction peak from (002) plane of hexagonal BN has an intensity ratio of 1.50 or more to a back-ground intensity of the (002) X-ray diffraction peak. 3 . The Fe—Pt based magnetic material sintered compact according to claim 2 , wherein the content of SiO 2 has a ratio of 1% or more relative to the content of hexagonal BN. 4 . The Fe—Pt based magnetic material sintered compact according to claim 3 , wherein the sintered compact has a content of Pt in an amount of 5 mol % or more and 60 mol % or less, a content of BN in an amount of 1 mol % or more and 50 mol % or less, and a content of SiO 2 in an amount of 0.5 mol % or more and 20 mol % or less. 5 . The Fe—Pt based magnetic material sintered compact according to claim 1 , wherein a content of SiO 2 in the sintered compact has a ratio of 1% or more relative to a content of hexagonal BN. 6 . The Fe—Pt based magnetic material sintered compact according to claim 1 , wherein the sintered compact has a content of Pt in an amount of 5 mol % or more and 60 mol % or less, a content of BN in an amount of 1 mol % or more and 50 mol % or less, a content of SiO 2 in an amount of 0.5 mol % or more and 20 mol % or less. 7 . A Fe—Pt based magnetic material sintered compact, consisting of iron and platinum forming a sintered Fe—Pt alloy, particles of hexagonal BN and SiO 2 dispersed in the sintered Fe—Pt alloy, and at least one inorganic material selected from the group consisting of oxides other than SiO 2 , nitrides other than BN, carbides and carbon nitrides as an additive, wherein, in an element mapping image obtained by a Field Emission Electron Probe Micro Analyzer (FE-EPMA) of a cross-sectional surface of the sintered compact, elements of Si and O are detected in the same area as that where elements of B and N are detected, and wherein, in X-ray diffraction analysis of a cross-sectional surface of the sintered compact which is parallel to a pressurized face of the sintered compact, an X-ray diffraction peak from (002) plane of hexagonal BN is present, and an X-ray diffraction peak from (101) plane of cristobalite as an intensity ratio of 1.40 or less to a back-ground intensity of the (101) X-ray diffraction peak. 8 . The Fe—Pt based magnetic material sintered compact according to claim 7 , wherein the X-ray diffraction peak from (002) plane of hexagonal BN has an intensity ratio of 1.50 or more to a back-ground intensity of the (002) X-ray diffraction peak. 9 . The Fe—Pt based magnetic material sintered compact according to claim 8 , wherein the content of SiO 2 has a ratio of 1% or more relative to the content of hexagonal BN. 10 . The Fe—Pt based magnetic material sintered compact according to claim 9 , wherein the sintered compact has a content of Pt in an amount of 5 mol % or more and 60 mol % or less, a content of BN in an amount of 1 mol % or more and 50 mol % or less, and a content of SiO 2 in an amount of 0.5 mol % or more and 20 mol % or less. 11 . The Fe—Pt based magnetic material sintered compact according to claim 7 , wherein a content of SiO 2 in the sintered compact has a ratio of 1% or more relative to a content of hexagonal BN. 12 . The Fe—Pt based magnetic material sintered compact according to claim 7 , wherein the sintered compact has a content of Pt in an amount of 5 mol % or more and 60 mol % or less, a content of BN in an amount of 1 mol % or more and 50 mol % or less, a content of SiO 2 in an amount of 0.5 mol % or more and 20 mol % or less. 13 . A Fe—Pt based magnetic material sintered compact, consisting of iron, platinum and 0.5 mol % or more and 10.0 mol % or less of one or more elements selected from the group consisting of B, Ru, Ag, Au and Cu forming a sintered alloy and particles of hexagonal BN and SiO 2 dispersed in the sintered alloy and at least one inorganic material selected from the group consisting of oxides other than SiO 2 , nitrides other than BN, carbides and carbon nitrides as an additive, wherein, in an element mapping image obtained by a Field Emission Electron Probe Micro Analyzer (FE-EPMA) of a cross-sectional surface of the sintered compact, elements of Si and O are detected in the same area as that where elements of B and N are detected, and wherein, in X-ray diffraction analysis of a cross-sectional surface of the sintered compact which is parallel to a pressurized face of the sintered compact, an X-ray diffraction peak from (002) plane of hexagonal BN is present, and an X-ray diffraction peak from (101) plane of cristobalite as an intensity ratio of 1.40 or less to a back-ground intensity of the (101) X-ray diffraction peak. 14 . The Fe—Pt based magnetic material sintered compact according to claim 13 , wherein the X-ray diffraction peak from (002) plane of hexagonal BN has an intensity ratio of 1.50 or more to a back-ground intensity of the (002) X-ray diffraction peak. 15 . The Fe—Pt based magnetic material sintered compact according to claim 14 , wherein the content of SiO 2 has a ratio of 1% or more relative to the content of hexagonal BN. 16 . The Fe—Pt based magnetic material sintered compact according to claim 15 , wherein the sintered compact has a content of Pt in an amount of 5 mol % or more and 60 mol % or less, a content of BN in an amount of 1 mol % or more and 50 mol % or less, and a content of SiO 2 in an amount of 0.5 mol % or more and 20 mol % or less. 17 . The Fe—Pt based magnetic material sintered compact according to claim 13 , wherein a content of SiO 2 in the sintered compact has a ratio of 1% or more relative to a content of hexagonal BN. 18 . The Fe—Pt based magnetic material sintered compact according to claim 13 , wherein the sintered compact has a content of Pt in an amount of 5 mol % or more and 60 mol % or less, a content of BN in an amount of 1 mol % or more and 50 mol % or less, a content of SiO 2 in an amount of 0.5 mol % or more and 20 mol % or less.

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Classifications

  • Coating a support with a magnetic layer by sputtering · CPC title

  • Nitrides · CPC title

  • Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy · CPC title

  • with more than 5% preformed carbides, nitrides or borides · CPC title

  • Alloys based on a platinum group metal · CPC title

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What does patent US2020357433A1 cover?
Provided is an Fe—Pt based magnetic material sintered compact, comprising BN and SiO 2 as non-magnetic materials, wherein Si and O are present in a region where B or N is present at a cut surface of the sintered compact. A high density sputtering target is provided which enables production of a magnetic thin film for heat-assisted magnetic recording media, and also reduces the amount of partic…
Who is the assignee on this patent?
Jx Nippon Mining & Metals Corp
What technology area does this patent fall under?
Primary CPC classification G11B5/653. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Nov 12 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).