Film-forming composition, silicon-containing film, and resist pattern-forming method

US2020354575A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2020354575-A1
Application numberUS-202016942938-A
CountryUS
Kind codeA1
Filing dateJul 30, 2020
Priority dateFeb 5, 2018
Publication dateNov 12, 2020
Grant date

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A film-forming composition includes a compound including a Si—H bond and an orthoester. The compound preferably includes a structural unit that is a structural unit represented by formula (1-1), a structural unit represented by formula (1-2), or a combination thereof. In the formula (1-1) and the formula (1-2), R 1 and R 2 each represent a hydroxy group, a halogen atom, or a monovalent organic group having 1 to 20 carbon atoms; and R 3 represents a substituted or unsubstituted divalent hydrocarbon group having 1 to 20 carbon atoms that bonds to two Si atoms.

First claim

Opening claim text (preview).

What is claimed is: 1 . A film-forming composition, comprising: a compound comprising a Si—H bond; and an orthoester. 2 . The film-forming composition according to claim 1 , wherein the compound comprises a structural unit that is a structural unit represented by formula (1-1), a structural unit represented by formula (1-2), or a combination thereof, wherein, in the formula (1-1), a is an integer of 1 to 3; R 1 represents a hydroxy group, a halogen atom, or a monovalent organic group having 1 to 20 carbon atoms; and b is an integer of 0 to 2, wherein in a case in which b is 2, two R 1 s are identical or different, and wherein a sum of a and b is no greater than 3, and in the formula (1-2), c is an integer of 1 to 3; R 2 represents a hydroxy group, a halogen atom, or a monovalent organic group having 1 to 20 carbon atoms; d is an integer of 0 to 2, wherein in a case in which d is 2, two R 2 s are identical or different; R 3 represents a substituted or unsubstituted divalent hydrocarbon group having 1 to 20 carbon atoms that bonds to two Si atoms; and p is an integer of 1 to 3, wherein in a case in which p is no less than 2, a plurality of R 3 s are identical or different, and wherein a sum of c, d, and p is no greater than 4. 3 . The film-forming composition according to claim 2 , wherein the compound further comprises a structural unit that is a structural unit represented by formula (2-1), a structural unit represented by formula (2-2), or a combination thereof, wherein, in the formula (2-2), R 4 represents a substituted or unsubstituted divalent hydrocarbon group having 1 to 20 carbon atoms that bonds to two Si atoms; and q is an integer of 1 to 4, wherein in a case in which q is no less than 2, a plurality of R 4 s are identical or different. 4 . The film-forming composition according to claim 2 , wherein the compound further comprises a structural unit that is a structural unit represented by formula (3-1), a structural unit represented by formula (3-2), or a combination thereof, wherein, in the formula (3-1), R 5 represents a hydroxy group, a halogen atom, or a monovalent organic group having 1 to 20 carbon atoms; and e is an integer of 1 to 3, wherein in a case in which e is no less than 2, a plurality of R 5 s are identical or different, and in the formula (3-2), R 6 represents a hydroxy group, a halogen atom, or a monovalent organic group having 1 to 20 carbon atoms; f is 1 or 2, wherein in a case in which f is 2, two R 6 s are identical or different; R 7 represents a substituted or unsubstituted divalent hydrocarbon group having 1 to 20 carbon atoms that bonds to two Si atoms; and r is an integer of 1 to 3, wherein in a case in which r is no less than 2, a plurality of R 7 s are identical or different, and wherein a sum of f and r is no greater than 4. 5 . The film-forming composition according to claim 3 , wherein the compound further comprises a structural unit that is a structural unit represented by formula (3-1), a structural unit represented by formula (3-2), or a combination thereof, wherein, in the formula (3-1), R 5 represents a hydroxy group, a halogen atom, or a monovalent organic group having 1 to 20 carbon atoms; and e is an integer of 1 to 3, wherein in a case in which e is no less than 2, a plurality of R 5 s are identical or different, and in the formula (3-2), R 6 represents a hydroxy group, a halogen atom, or a monovalent organic group having 1 to 20 carbon atoms; f is 1 or 2, wherein in a case in which f is 2, two R 6 s are identical or different; R 7 represents a substituted or unsubstituted divalent hydrocarbon group having 1 to 20 carbon atoms that bonds to two Si atoms; and r is an integer of 1 to 3, wherein in a case in which r is no less than 2, a plurality of R 7 s are identical or different, and wherein a sum of f and r is no greater than 4. 6 . The film-forming composition according to claim 1 , wherein the orthoester is represented by formula (4), R 8 —C(OR 9 ) 3   (4) wherein, in the formula (4), R 8 represents a hydrogen atom or a substituted or unsubstituted monovalent hydrocarbon group having 1 to 20 carbon atoms; and each R 9 independently represents a substituted or unsubstituted monovalent hydrocarbon group having 1 to 20 carbon atoms. 7 . The film-forming composition according to claim 2 , wherein the orthoester is represented by formula (4), R 8 —C(OR 9 ) 3   (4) wherein, in the formula (4), R 8 represents a hydrogen atom or a substituted or unsubstituted monovalent hydrocarbon group having 1 to 20 carbon atoms; and each R 9 independently represents a substituted or unsubstituted monovalent hydrocarbon group having 1 to 20 carbon atoms. 8 . The film-forming composition according to claim 3 , wherein the orthoester is represented by formula (4), R 8 —C(OR 9 ) 3   (4) wherein, in the formula (4), R 8 represents a hydrogen atom or a substituted or unsubstituted monovalent hydrocarbon group having 1 to 20 carbon atoms; and each R 9 independently represents a substituted or unsubstituted monovalent hydrocarbon group having 1 to 20 carbon atoms. 9 . The film-forming composition according to claim 4 , wherein the orthoester is represented by formula (4), R 8 —C(OR 9 ) 3   (4) wherein, in the formula (4), R 8 represents a hydrogen atom or a substituted or unsubstituted monovalent hydrocarbon group having 1 to 20 carbon atoms; and each R 9 independently represents a substituted or unsubstituted monovalent hydrocarbon group having 1 to 20 carbon atoms. 10 . The film-forming composition according to claim 5 , wherein the orthoester is represented by formula (4), R 8 —C(OR 9 ) 3   (4) wherein, in the formula (4), R 8 represents a hydrogen atom or a substituted or unsubstituted monovalent hydrocarbon group having 1 to 20 carbon atoms; and each R 9 independently represents a substituted or unsubstituted monovalent hydrocarbon group having 1 to 20 carbon atoms. 11 . A silicon-containing film formed from the film-forming composition according to claim 1 . 12 . A resist pattern-forming method comprising: applying a film-forming composition directly or indirectly on an upper face of a substrate to form a silicon-containing film; applying a resist composition on an upper face of the silicon-containing film to form a resist film; exposing the resist film; and developing the resist film exposed, wherein the film-forming composition comprises: a compound comprising a Si—H bond; and an orthoester. 13 . The resist pattern-forming method according to claim 12 , wherein an exposure light used in the exposing is an extreme ultraviolet ray or an electron beam. 14 . The resist pattern-forming method according to claim 12 , further comprising carrying out etching after the developing. 15 . The resist pattern-forming method according to claim 12 , further comprising, before the applying of the film-forming composition, forming an organic underlayer film directly or indirectly on the upper face of the substrate. 16 . The resist pattern-forming method according to claim 12 , wherein the com

Assignees

Inventors

Classifications

  • in which at least two but not all the silicon atoms are connected by linkages other than oxygen atoms (C09D183/10 takes precedence) · CPC title

  • containing aromatic rings · CPC title

  • by carbon linkages · CPC title

  • G03F7/0752Primary

    in non photosensitive layers or as additives, e.g. for dry lithography · CPC title

  • Processing photosensitive materials; Apparatus therefor (G03F7/12 - G03F7/24 take precedence) · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US2020354575A1 cover?
A film-forming composition includes a compound including a Si—H bond and an orthoester. The compound preferably includes a structural unit that is a structural unit represented by formula (1-1), a structural unit represented by formula (1-2), or a combination thereof. In the formula (1-1) and the formula (1-2), R 1 and R 2 each represent a hydroxy group, a halogen atom, or a monovalent organi…
Who is the assignee on this patent?
Jsr Corp
What technology area does this patent fall under?
Primary CPC classification G03F7/0752. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Nov 12 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).