Thermal compensation for a holographic beam forming antenna

Patent metadata

Field	Value
Publication number	US-2020251802-A1
Application number	US-201916730690-A
Country	US
Kind code	A1
Filing date	Dec 30, 2019
Priority date	Feb 5, 2019
Publication date	Aug 6, 2020
Grant date	—

Abstract

The invention compensates for abnormal operating temperatures and/or abnormal behaviors of a holographic metasurface antenna (HMA) that is generating a beam based on a holographic function. The HMA is characterized with different holographic functions for a plurality of operating temperatures and a plurality of behaviors during the manufacturing process. The characterization of the HMA identifies different hologram functions that cause the HMA to generate more or less heat or exhibit more or less abnormal behavior while generating equivalent beams. Further, or more characterizations of a hologram function may be performed remotely after the HMA is installed in a real world environment. An operating temperature and/or a temperature gradient may be detected by temperature sensors physically located on a circuit board for the HMA.

First claim

What is claimed as new and desired to be protected by Letters Patent of the United States is:

1 . A method for compensating for temperature for a holographic metasurface antenna (HMA), wherein a network computer executes instructions to perform actions, comprising:
providing a first holographic function to the HMA that is used to energize one or more portions of a plurality of electronic components to produce a first object wave that radiates a first beam; monitoring one or more operating temperatures of the HMA with one or more temperature sensors; monitoring one or more behaviors of the HMA, wherein the monitored behaviors are compared to a characterized range of normal behaviors for the first holographic function; and in response to one or more of a current operating temperature of the HMA is identified as outside a range of normal operating temperatures, or a current behavior of the HMA is identified as abnormal behavior, performing further actions, including:
providing a second hologram function to energize at least one or more other portions of the plurality of electronic components to produce a second object wave to radiate a second beam that is equivalent to the first beam and de-energize those portions of the electronic components of the HMA that are unused to produce the second object wave, wherein heat generated by consumption of energy by the HMA is changed by at least the de-energization of those electronic components that are unused for production of the second object wave and energization of other electronic components that are used for production of the second object wave.

2 . The method of claim 1 , wherein providing the second hologram function that is used by the HMA to produce the second object wave, further comprises causing the current operating temperature to change to another operating temperature that is within the range of normal operating temperatures for the HMA.

3 . The method of claim 1 , further comprising:
energizing all electronic components of the HMA while operating the HMA at each of a range of characterization temperatures having a minimum temperature that is less than a predicted range of normal operating temperatures and a maximum temperature that is greater than the predicted range of normal operating temperatures; identifying operation of the HMA at each characterization temperature as normal behavior or abnormal behavior; and generating the range of normal operating temperatures based on each characterization temperature that is associated with normal behavior.

4 . The method of claim 1 , further comprising:
providing a plurality of hologram functions that are used to energize the one or more portions of the plurality of electronic components to produce corresponding object waves that radiate associated beams; for each of the plurality of hologram functions, performing actions, including:
energizing those portions of the electronic components that produce a corresponding object wave to radiate an associated beam while operating the HMA at each of a range of characterization temperatures having a minimum temperature that is less than a predicted range of normal operating temperatures and a maximum temperature that is greater than the predicted range of normal operating temperatures;
identifying operation of the HMA at each characterization temperature as normal behavior or abnormal behavior; and
characterizing a particular range of normal operating temperatures based on each characterization temperature that is associated with normal behavior in the operation of the HMA to radiate the associate beam.

5 . The method of claim 1 , further comprising:
in response to the current operating temperature of the HMA being identified below the range of normal operating temperatures, performing further actions, including:
identifying one of the plurality of hologram functions that causes an increase of heat generated by the HMA and also results in radiating another beam that is equivalent to a currently radiated beam; and
providing the one identified hologram function to the HMA.

6 . The method of claim 1 , further comprising:
in response to the current operating temperature of the HMA being identified above the range of normal operating temperatures, performing further actions, including:
identifying one of the plurality of hologram functions that causes a decrease in heat generated by the HMA and also results in radiating another beam that is equivalent to a currently radiated beam; and
providing the one identified hologram function to the HMA.

7 . The method of claim 1 , wherein abnormal behavior further comprises one or more of:
an anomaly in a radiated beam that is associated with deformation of one or more scattering elements of the HMA; a hysteresis value of the HMA that is outside a range of normal hysteresis values for the HMA; or an output voltage of an electronic component of the HMA that is less than or more than a normal range of output voltages.

8 . A holographic metasurface antenna (HMA) that compensates for temperature, comprising:
an array of scattering elements that are dynamically adjustable in response to one or more waves provided by the one or more wave sources; a computer, including:
a memory for storing instructions;
one or more processors that execute the instructions to perform actions, comprising: providing a first holographic function to the HMA that is used to energize one or more portions of a plurality of electronic components to produce a first object wave that radiates a first beam;
monitoring one or more operating temperatures of the HMA with one or more temperature sensors;
monitoring one or more behaviors of the HMA, wherein the monitored behaviors are compared to a characterized range of normal behaviors for the first holographic function; and
in response to one or more of a current operating temperature of the HMA is identified as outside a range of normal operating temperatures, or a current behavior of the HMA is identified as abnormal behavior, performing further actions, including:
providing a second hologram function to energize at least one or more other portions of the plurality of electronic components to produce a second object wave to radiate a second beam that is equivalent to the first beam and de-energize those portions of the electronic components of the HMA that are unused to produce the second object wave, wherein heat generated by consumption of energy by the HMA is changed by at least the de-energization of those electronic components that are unused for production of the second object wave and energization of other electronic components that are used for production of the second object wave.

9 . The HMA of claim 8 , wherein providing the second hologram function that is used by the HMA to produce the second object wave, further comprises causing the current operating temperature to change to another operating temperature that is within the range of normal operating temperatures for the HMA.

10 . The HMA of claim 8 , further comprising:
energizing all electronic components of the HMA while operating the HMA at each of a range of characterization temperatures having a minimum temperature that is less than a predicted range of normal operating temperatures and a maximum temperature that is greater than the predicted range of normal operating temperatures; identifying operation of the HMA at each characterization temperature as normal behavior or abnormal behavior; and generating the range of normal operating temperatures based on each characterization temperature that is associated with normal behavior.

11 . The HMA of claim 8 , further comprising

Assignees

• Pivotal Commware Inc

Inventors

• Katko Alexander Remley
• Machado Melroy
• Black Eric James
• Mccandless Jay Howard
• Deutsch Brian Mark

Classifications

• H01Q19/067

  using a hologram · CPC title

• H01Q21/0037

  linear waveguide fed arrays · CPC title

• H01Q1/364

  using a particular conducting material, e.g. superconductor · CPC title

• H01Q1/02 Primary

  Arrangements for de-icing; Arrangements for drying-out {; Arrangements for cooling; Arrangements for preventing corrosion} · CPC title

• H01Q3/40 Primary

  with phasing matrix · CPC title