A device and method for scatter correction in an x-ray image

Patent metadata

Field	Value
Publication number	US-2020229785-A1
Application number	US-201816342696-A
Country	US
Kind code	A1
Filing date	Jul 9, 2018
Priority date	Jul 13, 2017
Publication date	Jul 23, 2020
Grant date	—

Abstract

The present invention relates to a device for scatter correction in an X-ray image, the X-ray image (30, 40) having a superimposed structured pattern, the device (1) comprising: an X-ray image receiving element (10); a pattern remover (11); and a first subtraction module (12); wherein the X-ray image receiving element (10) is configured to receive an X-ray image (30, 40) comprising a superimposed structured pattern (31); wherein the pattern remover (11) is configured to remove the structured pattern (31) from the X-ray image (30, 40) resulting in a pattern corrected X-ray image (43); wherein the first subtraction module (12) is configured to subtract the pattern corrected X-ray image (33, 43) from the X-ray image (40) resulting in a structured pattern image (32, 42); and wherein a contrast measurement unit (13) is configured to apply a local structure contrast measurement function to the structured pattern image (32, 42) resulting in a structure contrast image (34, 44). The invention improves the scatter correction of an X-ray image.

First claim

1 . A device for scatter correction in an X-ray image, the device comprising:
an X-ray image receiver configured to receive the X-ray image comprising a superimposed structured pattern; a pattern remover configured to remove the structured pattern from the X-ray image resulting in a pattern corrected X-ray image; a first image subtractor configured to subtract the pattern corrected X-ray image from the X-ray image resulting in a structured pattern image; and a contrast measurement unit configured to apply a local structure contrast measurement function to the structured pattern image resulting in a structure contrast image.

2 . The device according to claim 1 , further comprising a filter for processing the structure contrast image to provide a filtered structure contrast image.

3 . The device according to claim 2 , further comprising an estimator configured to estimate a primary fraction of the X-ray image based on the filtered structure contrast image.

4 . The device according to claim 3 , further comprising:
a determination module configured to provide a filtered scatter signal based on a scatter fraction being determined from the primary fraction or a value derived from the scatter fraction; and a second image subtractor configured to subtract at least a fraction of the filtered scatter signal from the pattern corrected X-ray image resulting in a scatter corrected X-ray image.

5 . The device according to claim 4 , wherein the determination module is configured to the filter on the scatter fraction or the value derived from the scatter fraction.

6 . A system for scatter correction in an X-ray image, the system comprising:
an X-ray image acquisition device comprising a structure pattern element configured to provide the X-ray image with a superimposed structured pattern; and a device comprising:
an X-ray image receiver configured to receive the X-ray image comprising the superimposed structured pattern;
a pattern remover configured to remove the structured pattern from the X-ray image resulting in a pattern corrected X-ray image;
a first image subtractor configured to subtract the pattern corrected X-ray image from the X-ray image resulting in a structured pattern image; and
a contrast measurement unit configured to apply a local structure contrast measurement function to the structured pattern image resulting in a structure contrast image.

7 . A method for scatter correction in an X-ray image, the method comprising:
receiving the X-ray image having a superimposed structured pattern; removing the structured pattern from the X-ray image resulting in a pattern corrected X-ray image; subtracting the pattern corrected X-ray image from the X-ray image resulting in a structured pattern image; and applying a local contrast measurement function to the structured pattern image resulting in a structure contrast image.

8 . The method according to claim 7 , further comprising
estimating a primary fraction of the X-ray image based on the structure contrast pattern image.

9 . The method according to claim 8 , further comprising:
determining a filtered scatter signal from the primary fraction or a value derived from the primary fraction; and subtracting at least a fraction of the filtered scatter signal from the pattern corrected X-ray image resulting in a scatter corrected X-ray image.

10 . The method according to claim 9 , further comprising applying a filter on a scatter fraction or a value derived from the scatter fraction for providing the filtered scatter signal.

11 . (canceled)

12 . A non-transitory computer readable medium having one or more executable instructions stored thereon, which, when executed by a processor, cause the processor to perform a method for correcting scatter in an X-ray image, the method comprising:
receiving the X-ray image having a superimposed structured pattern; removing the structured pattern from the X-ray image resulting in a pattern corrected X-ray image; subtracting the pattern corrected X-ray image from the X-ray image resulting in a structured pattern image; and applying a local contrast measurement function to the structured pattern image resulting in a structure contrast image.

Assignees

• Koninklijke Philips Nv

Inventors

• Maack Hanns-Ingo

Classifications

• A61B6/5282 Primary

  due to scatter · CPC title

• G06T2207/10116

  X-ray image · CPC title

• G06T5/50

  using two or more images, e.g. averaging or subtraction · CPC title

• A61B6/4035

  the source being combined with a filter or grating · CPC title

• A61B6/4291

  the detector being combined with a grid or grating · CPC title