System and method for reading x-ray-fluorescence marking

Patent metadata

Field	Value
Publication number	US-2020116656-A1
Application number	US-201916709804-A
Country	US
Kind code	A1
Filing date	Dec 10, 2019
Priority date	Apr 2, 2015
Publication date	Apr 16, 2020
Grant date	—

Abstract

In a method and a system for authenticating an object marked with XRF marking, a wavelength spectral profile is provided of a detected portion of an X-Ray signal arriving from an object in response to X-Ray or Gamma-Ray radiation applied to the object and the wavelength spectral profile is filtered to suppress trend and periodic components from the wavelength spectral profile to obtain a filtered profile with improved signal to noise or signal to clutter ratio. The object can be authenticated by processing the filtered profile and identifying one or more peaks therein, which satisfy a predetermined condition, whereby the wavelengths of the identified peaks are indicative of the signatures of materials included in the object.

First claim

1 . An X-Ray Fluorescence (XRF) device comprising:
a radiation detector for detecting X-Ray signals arriving from an object in response to irradiation of the object by X-Ray or Gamma-Ray radiation, and providing data indicative of the detected X-Ray signals; and a signal reading processor in communication with said detector, the processor being adapted for receiving and processing the detected X-Ray signals to identify signatures of materials included in said object; wherein said processor comprises: a spectral data provider configured for determining data indicative of a wavelength spectral profile of at least a portion of the detected X-Ray signals; and a filtration module adapted for filtering said data indicative of the wavelength spectral profile and obtaining a filtered profile, said filtering comprising applying to said wavelength spectral profile at least stationarity filtration for suppressing at least trend components associated with at least one of noise and clutter in the X-Ray signal portion detected by said radiation detector; said filtered profile thereby having improved signal to noise and/or signal to clutter ratio from which spectral peaks associated with signatures of materials included in said object can be identified with improved accuracy and reliability.

Assignees

• Soreq Nuclear Res Ct
• Security Matters Ltd

Inventors

• Grof Yair

Classifications

• G01N2223/652

  impurities, foreign matter, trace amounts · CPC title

• G01N23/223 Primary

  by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence · CPC title

• G01N33/42

  Road-making materials (G01N33/38 takes precedence) · CPC title

• G01N2223/076

  X-ray fluorescence · CPC title

• G01N23/2202

  Preparing specimens therefor · CPC title