Measurement system and measurement method

Patent metadata

Field	Value
Publication number	US-2020042847-A1
Application number	US-201916529791-A
Country	US
Kind code	A1
Filing date	Aug 2, 2019
Priority date	Aug 2, 2018
Publication date	Feb 6, 2020
Grant date	—

Abstract

A measurement system includes a first search part and a second search part. The first search part searches a set of codes for a corresponding region that indicates the same sequence as a model code string composed of a predetermined number of codes included in a unit region set in a projection pattern. The second search part searches the set of codes for a code that matches each code included in a model code string that fails in the search for the corresponding region among the model code strings included in the projection pattern, and then determines recognition of the model code string when the number of the codes that fail to be searched in this search is equal to or smaller than a predetermined number.

First claim

What is claimed is:

1 . A measurement system, comprising an acquisition part acquiring an input image that is an image acquired by imaging an object while irradiating the object with a projection pattern determined in advance, wherein the projection pattern comprises a plurality of types of reference patterns, each of which is assigned with a unique code, arranged according to a predetermined rule, the measurement system comprising:
a detection part acquiring a position to which each reference pattern is irradiated and a set of codes indicated by the irradiated reference pattern by searching each reference pattern included in the irradiated projection pattern in the input image; a first search part searching the set of codes for a corresponding region that indicates the same sequence as a model code string composed of a predetermined number of codes included in a unit region set in the projection pattern; a second search part searching the set of codes for a code that matches each code included in a model code string, which fails in the search for the corresponding region among the model code strings included in the projection pattern, and then determining a recognition of the model code string when a number of the codes that fail to be searched in the search is equal to or smaller than a predetermined number; and a distance calculation part calculating a distance from an irradiation reference plane of the projection pattern to each part of the object based on a corresponding relationship between the model code string and the corresponding region searched by the first search part and the second search part.

2 . The measurement system according to claim 1 , wherein the first search part and the second search part search along an epipolar line of the input image.

3 . The measurement system according to claim 1 , wherein the second search part repeats a search process for all model code strings that fail in the search for the corresponding region.

4 . The measurement system according to claim 1 , wherein the second search part repeats searching for a code that matches each code included in the model code string that fails in the search for the corresponding region by varying the predetermined number.

5 . The measurement system according to claim 2 , wherein the second search part repeats a search process for all model code strings that fail in the search for the corresponding region.

6 . The measurement system according to claim 2 , wherein the second search part repeats searching for a code that matches each code included in the model code string that fails in the search for the corresponding region by varying the predetermined number.

7 . The measurement system according to claim 3 , wherein the second search part repeats searching for a code that matches each code included in the model code string that fails in the search for the corresponding region by varying the predetermined number.

8 . The measurement system according to claim 5 , wherein the second search part repeats searching for a code that matches each code included in the model code string that fails in the search for the corresponding region by varying the predetermined number.

9 . A measurement method, comprising acquiring an input image that is an image acquired by imaging an object while irradiating the object with a projection pattern determined in advance, wherein the projection pattern comprises a plurality of types of reference patterns, each of which is assigned with a unique code, arranged according to a predetermined rule, the measurement method comprising:
acquiring a position to which each reference pattern is irradiated and a set of codes indicated by the irradiated reference pattern by searching each reference pattern included in the irradiated projection pattern in the input image; searching the set of codes for a corresponding region that indicates the same sequence as a model code string composed of a predetermined number of codes included in a unit region set in the projection pattern; searching the set of codes for a code that matches each code included in a model code string, which fails in the search for the corresponding region among the model code strings included in the projection pattern, and then determining a recognition of the model code string when a number of the codes that fail to be searched in the search is equal to or smaller than a predetermined number; and calculating a distance from an irradiation reference plane of the projection pattern to each part of the object based on a corresponding relationship between the model code string and the corresponding region that are searched.

10 . The measurement method according to claim 9 , wherein the reference pattern is searched along an epipolar line of the input image.

11 . The measurement method according to claim 9 , wherein a search process is repeated for all model code strings that fail in the search for the corresponding region.

12 . The measurement method according to claim 9 , further comprising repeating searching for a code that matches each code included in the model code string that fails in the search for the corresponding region by varying the predetermined number.

13 . The measurement method according to claim 10 , wherein a search process is repeated for all model code strings that fail in the search for the corresponding region.

14 . The measurement method according to claim 10 , further comprising repeating searching for a code that matches each code included in the model code string that fails in the search for the corresponding region by varying the predetermined number.

15 . The measurement method according to claim 11 , further comprising repeating searching for a code that matches each code included in the model code string that fails in the search for the corresponding region by varying the predetermined number.

16 . The measurement method according to claim 13 , further comprising repeating searching for a code that matches each code included in the model code string that fails in the search for the corresponding region by varying the predetermined number.

Assignees

• Omron Tateisi Electronics Co

Inventors

• Kato Yutaka
• Iida Toyoo
• Nakatsuka Hitoshi

Classifications

• G06K19/06037 Primary

  multi-dimensional coding · CPC title

• G06F16/532

  Query formulation, e.g. graphical querying · CPC title

• G06F16/5854

  using shape and object relationship · CPC title

• G06T7/521 Primary

  from laser ranging, e.g. using interferometry; from the projection of structured light · CPC title

• G06T7/73

  using feature-based methods · CPC title