Measurement system and measurement method

Patent metadata

Field	Value
Publication number	US-2019392193-A1
Application number	US-201916413619-A
Country	US
Kind code	A1
Filing date	May 16, 2019
Priority date	Jun 20, 2018
Publication date	Dec 26, 2019
Grant date	—

Abstract

A measurement system includes a first distance calculation unit that searches for a corresponding region, indicating a same array as an array of codes indicated by a predetermined number of reference patterns included in a unit region set in the projection pattern, from a set of the codes, and calculates a distance from an irradiation reference surface of the projection pattern to each portion of the object on the basis of a search result of the corresponding region, and a second distance calculation unit that attempts to estimate a distance for the defective portion for which the first distance calculation unit is not able to calculate the distance by reconstructing an incomplete code corresponding to the defective portion using peripheral information in the input image.

First claim

What is claimed is:

1 . A measurement system comprising:
an acquisition unit that acquires an input image which is an image obtained by imaging an object in a state where the object is irradiated with a projection pattern determined in advance, the projection pattern being configured with a plurality of types of reference patterns to which specific codes are assigned in accordance with a predetermined rule; a first distance calculation unit that searches for each reference pattern included in the radiated projection pattern within the input image to acquire a position at which each reference pattern is radiated and a set of codes indicated by the radiated reference pattern, searches for a corresponding region, indicating a same array as an array of codes indicated by a predetermined number of reference patterns included in a unit region set in the projection pattern, from a set of the codes, and calculates a distance from an irradiation reference surface of the projection pattern to each portion of the object on the basis of a search result of the corresponding region; and a second distance calculation unit that attempts to estimate a distance for a defective portion for which the first distance calculation unit is not able to calculate the distance by reconstructing an incomplete code corresponding to the defective portion using peripheral information in the input image.

2 . The measurement system according to claim 1 , further comprising a background information generation unit that generates a virtual background image to be captured in a case where the projection pattern is radiated from the irradiation reference surface to a plane surface located at an arbitrary distance or a virtual background image code corresponding to the virtual background image,
wherein the second distance calculation unit attempts to estimate the distance for the defective portion using information of the input image corresponding to the defective portion and the virtual background image or the virtual background image code.

3 . The measurement system according to claim 2 , further comprising a synthetic pattern generation unit that synthesizes a corresponding partial pattern of the virtual background image with a portion corresponding to the defective portion of the input image or a vicinity of the corresponding portion,
wherein the second distance calculation unit attempts to search for the corresponding region while sequentially changing at least one of the partial pattern of the virtual background image synthesized with the input image and a distance for a plane surface when the virtual background image is generated.

4 . The measurement system according to claim 2 ,
wherein the second distance calculation unit repeats a process of searching for a same array as an array of codes indicated by a predetermined number of reference patterns included in a unit region set in the projection pattern with respect to one or a plurality of code strings generated by a combination of at least a portion of a code searched for in a portion corresponding to the defective portion of the input image and a code to which the virtual background image code corresponds.

5 . The measurement system according to claim 2 ,
wherein the background information generation unit generates a plurality of the virtual background images or the virtual background image codes with respect to plane surfaces located at a plurality of different distances from the irradiation reference surface.

6 . The measurement system according to claim 2 ,
wherein the second distance calculation unit changes a positional relationship between the information of the input image corresponding to the defective portion and the virtual background image or the virtual background image code along an epipolar line.

7 . The measurement system according to claim 2 ,
wherein the second distance calculation unit determines that estimation of the distance for the defective portion is successful in a case where the estimated distance for the defective portion is different from a distance when the virtual background image or the virtual background image code used in the estimation is generated.

8 . A measurement method, comprising steps of:
acquiring an input image which is an image obtained by imaging an object in a state where the object is irradiated with a projection pattern determined in advance, the projection pattern being configured with a plurality of types of reference patterns to which specific codes are assigned in accordance with a predetermined rule; searching for each reference pattern included in the radiated projection pattern within the input image to acquire a position at which each reference pattern is radiated and a set of codes indicated by the radiated reference pattern, searching for a corresponding region, indicating a same array as an array of codes indicated by a predetermined number of reference patterns included in a unit region set in the projection pattern, from a set of the codes, and calculating a distance from an irradiation reference surface of the projection pattern to each portion of the object on the basis of a search result of the corresponding region; and attempting to estimate a distance for a defective portion for which the distance is not able to be calculated by reconstructing an incomplete code corresponding to the defective portion using peripheral information in the input image.

9 . The measurement system according to claim 3 ,
wherein the background information generation unit generates a plurality of the virtual background images or the virtual background image codes with respect to plane surfaces located at a plurality of different distances from the irradiation reference surface.

10 . The measurement system according to claim 4 ,
wherein the background information generation unit generates a plurality of the virtual background images or the virtual background image codes with respect to plane surfaces located at a plurality of different distances from the irradiation reference surface.

11 . The measurement system according to claim 3 ,
wherein the second distance calculation unit changes a positional relationship between the information of the input image corresponding to the defective portion and the virtual background image or the virtual background image code along an epipolar line.

12 . The measurement system according to claim 4 ,
wherein the second distance calculation unit changes a positional relationship between the information of the input image corresponding to the defective portion and the virtual background image or the virtual background image code along an epipolar line.

13 . The measurement system according to claim 3 ,
wherein the second distance calculation unit changes a positional relationship between the information of the input image corresponding to the defective portion and the virtual background image or the virtual background image code along an epipolar line.

14 . The measurement system according to claim 4 ,
wherein the second distance calculation unit determines that estimation of the distance for the defective portion is successful in a case where the estimated distance for the defective portion is different from a distance when the virtual background image or the virtual background image code used in the estimation is generated.

15 . The measurement system according to claim 5 ,
wherein the second distance calculation unit determines that estimation of the distance for the defective portion is successful in a case where the estimated distance for the defective portion is differe

Assignees

• Omron Tateisi Electronics Co

Inventors

• Nakatsuka Hitoshi
• Iida Toyoo

Classifications

• G06T2207/30184

  Infrastructure · CPC title

• G01B11/2513

  with several lines being projected in more than one direction, e.g. grids, patterns · CPC title

• G01C3/08

  Use of electric radiation detectors · CPC title

• G06T7/521 Primary

  from laser ranging, e.g. using interferometry; from the projection of structured light · CPC title

• G06K9/00201 Primary

  Physics · mapped topic